SPRACL7 March 2019 AM5746 , AM5748 , AM5749
The tables shown in the following sections contain power consumption and junction temperature measured running OS Idle and Dhrystone single-core use-cases at different controlled ambient temperatures with and without an attached heatsink. This silicon process type is nominal. Dhrystone tests are repeated with MPU at each supported OPP.
Junction temperature and power reported in the following sections are sampled at the same time, and are presented in separate tables to aid comprehension.