SPRACQ1 May   2020 TMS320F28374D , TMS320F28374S , TMS320F28375D , TMS320F28375S , TMS320F28376D , TMS320F28376S , TMS320F28377D , TMS320F28377S , TMS320F28379D , TMS320F28379S , TMS320F28384D , TMS320F28384D-Q1 , TMS320F28384S , TMS320F28384S-Q1 , TMS320F28386D , TMS320F28386D-Q1 , TMS320F28386S , TMS320F28386S-Q1 , TMS320F28388D , TMS320F28388S

 

  1.   Migration Between TMS320F2837x and TMS320F2838x
    1.     Trademarks
    2. 1 Feature Differences Between F2837x and F2838x
      1. 1.1 F2837x and F2838x Feature Comparison
    3. 2 PCB Hardware Changes
      1. 2.1 VDD Pin
      2. 2.2 VREGENZ Pin
      3. 2.3 Analog Pin Assignment
      4. 2.4 GPIO Pin Assignment
      5. 2.5 controlCARD
    4. 3 Feature Differences for System Consideration
      1. 3.1 New Features in F2838x Device
        1. 3.1.1  Fast Integer Division (FINTDIV)
        2. 3.1.2  VCRC Unit
        3. 3.1.3  EtherCAT Slave Controller (ESC)
        4. 3.1.4  Background CRC (BGCRC)
        5. 3.1.5  Diagnostic Features (PBIST/HWBIST)
        6. 3.1.6  Power Management Bus Module (PMBus)
        7. 3.1.7  Fast Serial Interface (FSI)
        8. 3.1.8  Embedded Real-time Analysis and Diagnostic (ERAD)
        9. 3.1.9  Dual-Clock Comparator (DCC)
        10. 3.1.10 Connectivity Manager (CM)
      2. 3.2 Features Differences/Enhancements in F2838x
        1. 3.2.1 System
          1. 3.2.1.1 Reset
          2. 3.2.1.2 Clocking
            1. 3.2.1.2.1 PLL
            2. 3.2.1.2.2 X1CNT
            3. 3.2.1.2.3 XCLKOUT
          3. 3.2.1.3 Pie Channel Mapping and Interrupt
            1. 3.2.1.3.1 SYS_ERR Interrupt
          4. 3.2.1.4 ERRORSTS Pin
        2. 3.2.2 Watchdog and NMI Watchdog
        3. 3.2.3 Memory
          1. 3.2.3.1 Internal SRAM/ROM
          2. 3.2.3.2 Flash
        4. 3.2.4 Dual Code Security Module (DCSM)
        5. 3.2.5 ROM Code and Peripheral Booting
        6. 3.2.6 External Memory Interface (EMIF)
        7. 3.2.7 Communication Modules
        8. 3.2.8 Control Modules
          1. 3.2.8.1 Enhanced Pulse Width Modulator (ePWM) and ePWM Sync Scheme
          2. 3.2.8.2 Enhanced Capture (eCAP)
          3. 3.2.8.3 Enhanced Quadrature Encoder Pulse (eQEP)
          4. 3.2.8.4 Sigma Delta Filter Module (SDFM)
        9. 3.2.9 Analog Modules
      3. 3.3 Other Device Changes
        1. 3.3.1 Bus Architecture
          1. 3.3.1.1 CLA and DMA Access
        2. 3.3.2 Control Law Accelerator (CLA)
        3. 3.3.3 Direct Memory Access (DMA)
      4. 3.4 Power Management
        1. 3.4.1 LDO/VREG
        2. 3.4.2 POR/BOR
      5. 3.5 Power Consumption
      6. 3.6 GPIO
        1. 3.6.1 GPIO Multiplexing Diagram
    5. 4 Application Code Migration From F2837x to F2838x
      1. 4.1 C2000Ware Driverlib Files
      2. 4.2 C2000Ware Header Files
      3. 4.3 Linker command Files
      4. 4.4 Minimum Compiler Version Requirement
      5. 4.5 EABI Support
        1. 4.5.1 Flash API
        2. 4.5.2 NoINIT Struct Fix (linker command)
        3. 4.5.3 Pre-Compiled Libraries
    6. 5 References

3.1.8 Embedded Real-time Analysis and Diagnostic (ERAD)

The Embedded Real-time Analysis and Diagnostic (ERAD) is a new module for F2838x devices that enhance the debug and system-analysis capabilities of the device. The ERAD module consists of the Enhanced Bus Comparator units and the System Event Counter units. The Enhanced Bus Comparator units are used to generate hardware breakpoints, hardware watch points, and other output events. The System Event Counter units are used to analyze and profile the system.

The key features provided by the ERAD module are listed below:

  • Provides eight additional hardware break points, hence total 10 hardware breakpoints are available during debug.
  • Monitor data read address buses, data write address buses, data write data bus, and generate RTOSINT
  • Generate an event output which can be used by other modules. This is done through monitoring any of the program address buses, Virtual Program Counter (VPC), or the Program Counter of the CPU.
  • System Event Counter (SEC) units can count duration between specified memory reads and writes.
  • System Event Counter (SEC) units can count system events (such as interrupts) as well as duration between such events.
  • System Event Counter (SEC) units can measure maximum amount of time spent in between a pair of events, measured over multiple iterations.
  • It has cyclic redundancy check (CRC) units that monitor CPU buses and compute CRC when the self-test code is executed.
  • The ERAD module is accessible by the debugger and by the application software. This significantly increases the debug capabilities of many real-time systems.

For more details on the ERAD, see the TMS320F2838x Microcontrollers Technical Reference Manual.