SPRACV2 November 2020 AWR1843 , AWR2243
Even after the process variations in TX phase shift errors are mitigated using the methods described earlier in the document, there can be temperature drift induced residual TX phase shift errors. The following presents one typical strategy to reduce this residual error, derived from evaluation of a few devices (AWR1843 and AWR2243, nominal process) across temperature in TI labs.
Follow these steps:
These are explained in the following sections.