SPRAD06B March   2022  – November 2024 AM620-Q1 , AM623 , AM625 , AM625-Q1

 

  1.   1
  2.   Abstract
  3.   Trademarks
  4. 1Overview
    1. 1.1 Board Designs Supported
    2. 1.2 General Board Layout Guidelines
    3. 1.3 PCB Stack-Up
    4. 1.4 Bypass Capacitors
      1. 1.4.1 Bulk Bypass Capacitors
      2. 1.4.2 High-Speed Bypass Capacitors
      3. 1.4.3 Return Current Bypass Capacitors
    5. 1.5 Velocity Compensation
  5. 2DDR4 Board Design and Layout Guidance
    1. 2.1  DDR4 Introduction
    2. 2.2  DDR4 Device Implementations Supported
    3. 2.3  DDR4 Interface Schematics
      1. 2.3.1 DDR4 Implementation Using 16-Bit SDRAM Devices
      2. 2.3.2 DDR4 Implementation Using 8-Bit SDRAM Devices
    4. 2.4  Compatible JEDEC DDR4 Devices
    5. 2.5  Placement
    6. 2.6  DDR4 Keepout Region
    7. 2.7  DBI
    8. 2.8  VPP
    9. 2.9  Net Classes
    10. 2.10 DDR4 Signal Termination
    11. 2.11 VREF Routing
    12. 2.12 VTT
    13. 2.13 POD Interconnect
    14. 2.14 CK and ADDR_CTRL Topologies and Routing Guidance
    15. 2.15 Data Group Topologies and Routing Guidance
    16. 2.16 CK and ADDR_CTRL Routing Specification
      1. 2.16.1 CACLM - Clock Address Control Longest Manhattan Distance
      2. 2.16.2 CK and ADDR_CTRL Routing Limits
    17. 2.17 Data Group Routing Specification
      1. 2.17.1 DQLM - DQ Longest Manhattan Distance
      2. 2.17.2 Data Group Routing Limits
    18. 2.18 Bit Swapping
      1. 2.18.1 Data Bit Swapping
      2. 2.18.2 Address and Control Bit Swapping
  6. 3LPDDR4 Board Design and Layout Guidance
    1. 3.1  LPDDR4 Introduction
    2. 3.2  LPDDR4 Device Implementations Supported
    3. 3.3  LPDDR4 Interface Schematics
    4. 3.4  Compatible JEDEC LPDDR4 Devices
    5. 3.5  Placement
    6. 3.6  LPDDR4 Keepout Region
    7. 3.7  LPDDR4 DBI
    8. 3.8  Net Classes
    9. 3.9  LPDDR4 Signal Termination
    10. 3.10 LPDDR4 VREF Routing
    11. 3.11 LPDDR4 VTT
    12. 3.12 CK0 and ADDR_CTRL Topologies
    13. 3.13 Data Group Topologies
    14. 3.14 CK0 and ADDR_CTRL Routing Specification
    15. 3.15 Data Group Routing Specification
    16. 3.16 Byte and Bit Swapping
  7. 4LPDDR4 Board Design Simulations
    1. 4.1 Board Model Extraction
    2. 4.2 Board-Model Validation
    3. 4.3 S-Parameter Inspection
    4. 4.4 Time Domain Reflectometry (TDR) Analysis
    5. 4.5 System Level Simulation
      1. 4.5.1 Simulation Setup
      2. 4.5.2 Simulation Parameters
      3. 4.5.3 Simulation Targets
        1. 4.5.3.1 Eye Quality
        2. 4.5.3.2 Delay Report
        3. 4.5.3.3 Mask Report
    6. 4.6 Design Example
      1. 4.6.1 Stack-Up
      2. 4.6.2 Routing
      3. 4.6.3 Model Verification
      4. 4.6.4 Simulation Results
  8. 5Appendix: AM62x ALW and AMC Package Delays
  9. 6Revision History

Time Domain Reflectometry (TDR) Analysis

As a lot of the design fixes are targeted towards maintaining uniform trace impedance, an important analysis method used in assessing the quality of the design is the Time Domain Reflectometry (TDR) analysis. This plots the impedance of a trace as a function of its length, as shown in Figure 4-1.

 TDR Plot Example With Impedance MismatchFigure 4-1 TDR Plot Example With Impedance Mismatch

As shown in Figure 4-1, the TDR plot highlights impedance discontinuities in the trace from one end to the other. This method depends on a reflected waveform from the far-end of the trace. The delay in the plot corresponding to a particular point in the trace actually corresponds to 2 times the distance of that point from the source, owing to the round trip time. This needs to be factored in for assessing the source of impedance discontinuities.

The TDR plot can be generated by reading in the S-parameter models generated by the extraction tool and assessing them in “Time-Domain” mode. A standard EDA simulator such as HyperLynx can perform this function. It is recommended to optimize the design to within a ± 5% deviation from the nominal trace impedance.

The TDR plots are not pass/fail tests, but rather is more of a guide to check if the design has a reasonable chance of performing a the required level.