SPRT759A October   2023  – June 2024 TMS320F280021 , TMS320F280021-Q1 , TMS320F280023 , TMS320F280023-Q1 , TMS320F280023C , TMS320F280025 , TMS320F280025-Q1 , TMS320F280025C , TMS320F280025C-Q1 , TMS320F280033 , TMS320F280034 , TMS320F280034-Q1 , TMS320F280036-Q1 , TMS320F280036C-Q1 , TMS320F280037 , TMS320F280037-Q1 , TMS320F280037C , TMS320F280037C-Q1 , TMS320F280038-Q1 , TMS320F280038C-Q1 , TMS320F280039 , TMS320F280039-Q1 , TMS320F280039C , TMS320F280039C-Q1 , TMS320F280040-Q1 , TMS320F280040C-Q1 , TMS320F280041 , TMS320F280041-Q1 , TMS320F280041C , TMS320F280041C-Q1 , TMS320F280045 , TMS320F280048-Q1 , TMS320F280048C-Q1 , TMS320F280049 , TMS320F280049-Q1 , TMS320F280049C , TMS320F280049C-Q1 , TMS320F28075 , TMS320F28075-Q1 , TMS320F28076 , TMS320F28374D , TMS320F28374S , TMS320F28375D , TMS320F28375S , TMS320F28375S-Q1 , TMS320F28376D , TMS320F28376S , TMS320F28377D , TMS320F28377D-EP , TMS320F28377D-Q1 , TMS320F28377S , TMS320F28377S-Q1 , TMS320F28378D , TMS320F28378S , TMS320F28379D , TMS320F28379D-Q1 , TMS320F28379S , TMS320F28384D , TMS320F28384D-Q1 , TMS320F28384S , TMS320F28384S-Q1 , TMS320F28386D , TMS320F28386D-Q1 , TMS320F28386S , TMS320F28386S-Q1 , TMS320F28388D , TMS320F28388S , TMS320F28P650DH , TMS320F28P650DK , TMS320F28P650SH , TMS320F28P650SK , TMS320F28P659DH-Q1 , TMS320F28P659DK-Q1 , TMS320F28P659SH-Q1

 

  1.   1
  2.   Abstract
  3.   Trademarks
  4.   Introduction
  5.   Overview of IEC 60730 and UL 1998 Classifications
    1.     C2000 Capability by Device Family
  6.   C2000 Safety Collateral
    1.     Getting Started
    2.     Functional Safety Manuals
    3.     Software Collateral
  7.   Implementing Acceptable Measures on C2000 Real-Time MCUs
    1.     Implementation Steps
    2.     Example Mapping
    3.     Additional Best Practices
  8.   Mapping Acceptable Control Measures to C2000 Unique Identifiers
    1.     Unique Identifier Reference
    2.     CPU Related Faults
    3.     Interrupt Related Faults
    4.     Clock Related Faults
    5.     Memory Related Faults
    6.     Internal Data Path Faults
    7.     Input/Output Related Faults
    8.     Communication, Monitoring Devices, and Custom Chip Faults
  9.   Glossary
  10.   References

Interrupt Related Faults

Table 10 Interrupt Faults to Unique ID Mapping
Component Class B/1 (1) Class C/2 (1) Acceptable Measure (2) C2000 Unique IDs (3)
Definition Description F2837x
F2807x		 F2838x F28004x F28002x F28003x F280013x F280015x
2. Interrupts rq H.2.16.5
A5.5 		Functional test PIE1 PIE1 PIE1 PIE1 PIE1

-

-
PIE2 PIE2 PIE2 PIE2 PIE2 PIE2 PIE2
PIE3 PIE3 PIE3 PIE3 PIE3 PIE3 PIE3
PIE6 PIE6 PIE6 PIE6 PIE6 - -
H.2.18.10.4
A7.1.13		 Time slot monitoring PIE8 PIE8 PIE8 PIE8 PIE8 PIE8 PIE8
rq H.2.18.15
A7.1.19		 Reciprocal comparison CPU1 CPU1 CPU1 - CPU1 - -
CLA1 CLA1 CLA1 - CLA1 - -
H.2.18.3
A7.1.6		 Independent hardware comparator - - - - - - CPU21
H.2.18.10.3
A7.1.14		 Independent time-slot and logical monitoring PIE8 PIE8 PIE8 PIE8 PIE8 PIE8 PIE8
(1) rq: coverage of the failure mode (refer to Table 2) is required by the standards for the indicated class. More than one acceptable measure may be available to choose from.
(2) For a complete list of acceptable measures and their definitions, see the IEC / UL specifications.
(3) For a description and implementation suggestions for each ID, see the device-specific Functional Safety Manual.