SPRUI33H November 2015 – June 2024 TMS320F280040-Q1 , TMS320F280040C-Q1 , TMS320F280041 , TMS320F280041-Q1 , TMS320F280041C , TMS320F280041C-Q1 , TMS320F280045 , TMS320F280048-Q1 , TMS320F280048C-Q1 , TMS320F280049 , TMS320F280049-Q1 , TMS320F280049C , TMS320F280049C-Q1
For system diagnostic or functional safety purposes, the user application can perform a loopback test of the ADC module to verify that the ADC is converting correctly. Using the output of the DAC in the first CMPSS module, the device can be configured to supply a series of known voltages to the input of the converter, and the conversion result verified against expected results. Loopback test mode is enabled by setting the bit corresponding to the ADC module under test in the ADCLOOPBACK register in the analog subsystem module to 1. Figure 13-21 shows the connection between the CMPSS DAC output and the ADC.
In ADC loopback test mode, the following special considerations apply:
For more information on the CMPSS module and how to configure the CMPSS DAC, see the Comparator Subsystem (CMPSS) chapter.