SPRUII0F May 2019 – June 2024 TMS320F28384D , TMS320F28384D-Q1 , TMS320F28384S , TMS320F28384S-Q1 , TMS320F28386D , TMS320F28386D-Q1 , TMS320F28386S , TMS320F28386S-Q1 , TMS320F28388D , TMS320F28388S
Since error detection and correction logic are part of safety critical logic, safety applications may need to ensure that the logic is always working fine (during run time also). To enable this, a test mode is provided. Using test mode, the user can inject the ECC/parity error by modifying data bits (controller does not update the ECC/parity bits) or the ECC/parity bits directly. Since the memory map for ECC/parity bits and data bits are the same, a different test mode is provided for accessing data and ECC/parity bits. The user programs different test modes based on the usage.
Table 41-8 and Table 41-9 show the bit mapping for the ECC/Parity bits when they are read in RAMTEST mode, using their respective addresses.
Data Bits Location in Read Data | Content (ECC Memory) |
---|---|
6:0 | ECC Code for lower 16 bits of data |
7 | Not Used |
14:8 | ECC Code for upper 16 bits of data |
15 | Not Used |
22:16 | ECC Code for address |
31:23 | Not Used |
Data Bits Location in Read Data | Content (Parity Memory) |
---|---|
0 | Parity for lower 16 bits of data |
7:1 | Not Used |
8 | Parity for upper 16 bits of data |
15:9 | Not Used |
16 | Parity for address |
31:17 | Not Used |