SPRUIZ1B July 2023 – August 2024 TMS320F28P650DH , TMS320F28P650DK , TMS320F28P650SH , TMS320F28P650SK , TMS320F28P659DH-Q1 , TMS320F28P659DK-Q1 , TMS320F28P659SH-Q1
Table 3-593 lists the memory-mapped registers for the TEST_ERROR_REGS registers. All register offset addresses not listed in Table 3-593 should be considered as reserved locations and the register contents should not be modified.
Offset | Acronym | Register Name | Write Protection | Section |
---|---|---|---|---|
0h | CPU_RAM_TEST_ERROR_STS | Ram Test: Error Status Register | Go | |
2h | CPU_RAM_TEST_ERROR_STS_CLR | Ram Test: Error Status Clear Register | Go | |
4h | CPU_RAM_TEST_ERROR_ADDR | Ram Test: Error address register | Go |
Complex bit access types are encoded to fit into small table cells. Table 3-594 shows the codes that are used for access types in this section.
Access Type | Code | Description |
---|---|---|
Read Type | ||
R | R | Read |
R-0 | R -0 | Read Returns 0s |
Write Type | ||
W1S | W 1S | Write 1 to set |
Reset or Default Value | ||
-n | Value after reset or the default value | |
Register Array Variables | ||
i,j,k,l,m,n | When these variables are used in a register name, an offset, or an address, they refer to the value of a register array where the register is part of a group of repeating registers. The register groups form a hierarchical structure and the array is represented with a formula. | |
y | When this variable is used in a register name, an offset, or an address it refers to the value of a register array. |
CPU_RAM_TEST_ERROR_STS is shown in Figure 3-559 and described in Table 3-595.
Return to the Summary Table.
Ram Test: Error Status Register
31 | 30 | 29 | 28 | 27 | 26 | 25 | 24 |
RESERVED | |||||||
R-0h | |||||||
23 | 22 | 21 | 20 | 19 | 18 | 17 | 16 |
RESERVED | |||||||
R-0h | |||||||
15 | 14 | 13 | 12 | 11 | 10 | 9 | 8 |
RESERVED | |||||||
R-0h | |||||||
7 | 6 | 5 | 4 | 3 | 2 | 1 | 0 |
RESERVED | UNC_ERROR | COR_ERROR | |||||
R-0h | R-0h | R-0h | |||||
Bit | Field | Type | Reset | Description |
---|---|---|---|---|
31-2 | RESERVED | R | 0h | Reserved |
1 | UNC_ERROR | R | 0h | 0: Indicates that there were no 'un-correctable errors' generated in the RAM/ROM test mode. 1: Indicates that 'un-correctable errors' wer generated in the RAM/ROM test mode. Reset type: SYSRSn |
0 | COR_ERROR | R | 0h | 0: Indicates that there were no 'correctable errors' generated in the RAM/ROM test mode. 1: Indicates that 'correctable errors' wer generated in the RAM/ROM test mode. Reset type: SYSRSn |
CPU_RAM_TEST_ERROR_STS_CLR is shown in Figure 3-560 and described in Table 3-596.
Return to the Summary Table.
Ram Test: Error Status Clear Register
31 | 30 | 29 | 28 | 27 | 26 | 25 | 24 |
RESERVED | |||||||
R-0h | |||||||
23 | 22 | 21 | 20 | 19 | 18 | 17 | 16 |
RESERVED | |||||||
R-0h | |||||||
15 | 14 | 13 | 12 | 11 | 10 | 9 | 8 |
RESERVED | |||||||
R-0h | |||||||
7 | 6 | 5 | 4 | 3 | 2 | 1 | 0 |
RESERVED | UNC_ERROR | COR_ERROR | |||||
R-0h | R-0/W1S-0h | R-0/W1S-0h | |||||
Bit | Field | Type | Reset | Description |
---|---|---|---|---|
31-2 | RESERVED | R | 0h | Reserved |
1 | UNC_ERROR | R-0/W1S | 0h | 0: No effect. 1: Clears the corresponding bit in CPU_RAM_TEST_ERROR_STS register. Reset type: SYSRSn |
0 | COR_ERROR | R-0/W1S | 0h | 0: No effect. 1: Clears the corresponding bit in CPU_RAM_TEST_ERROR_STS register. Reset type: SYSRSn |
CPU_RAM_TEST_ERROR_ADDR is shown in Figure 3-561 and described in Table 3-597.
Return to the Summary Table.
Ram Test: Error address register
31 | 30 | 29 | 28 | 27 | 26 | 25 | 24 | 23 | 22 | 21 | 20 | 19 | 18 | 17 | 16 | 15 | 14 | 13 | 12 | 11 | 10 | 9 | 8 | 7 | 6 | 5 | 4 | 3 | 2 | 1 | 0 |
ADDR | |||||||||||||||||||||||||||||||
R-0h | |||||||||||||||||||||||||||||||
Bit | Field | Type | Reset | Description |
---|---|---|---|---|
31-0 | ADDR | R | 0h | Address of the location where error was detected in RAM/ROM test modes. Reset type: SYSRSn |