SPRUJ28E November 2021 – September 2024 AM68 , AM68A , TDA4AL-Q1 , TDA4VE-Q1 , TDA4VL-Q1
This procedure describes how to use the high speed data BIST generation and checking functions to test the high speed data receiver functions. The process used in this test is to enable test MUXes for the low power and high speed data receiver functions, then write registers to setup, run and check the results of the BIST functions.