SPRZ506D October   2022  – December 2024 TMS320F2800132 , TMS320F2800133 , TMS320F2800135 , TMS320F2800137

 

  1.   1
  2.   TMS320F28003x Real-Time MCUs Silicon ErrataSilicon Revision 0
  3. 1Usage Notes and Advisories Matrices
    1. 1.1 Usage Notes Matrix
    2. 1.2 Advisories Matrix
  4. 2Nomenclature, Package Symbolization, and Revision Identification
    1. 2.1 Device and Development-Support Tool Nomenclature
    2. 2.2 Devices Supported
    3. 2.3 Package Symbolization and Revision Identification
  5. 3Silicon Revision C Usage Notes and Advisories
    1. 3.1 Silicon Revision C Usage Notes
      1. 3.1.1 PIE: Spurious Nested Interrupt After Back-to-Back PIEACK Write and Manual CPU Interrupt Mask Clear
      2. 3.1.2 Caution While Using Nested Interrupts
      3. 3.1.3 Security: The primary layer of defense is securing the boundary of the chip, which begins with enabling JTAGLOCK and Zero-pin Boot to Flash feature
    2. 3.2 Silicon Revision C Advisories
      1.      Advisory
      2.      Advisory
      3.      Advisory
      4.      Advisory
      5.      Advisory
      6.      Advisory
      7.      Advisory
      8. 3.2.1 Advisory
      9.      Advisory
      10. 3.2.2 Advisory
      11. 3.2.3 Advisory
      12.      Advisory
      13.      Advisory
      14.      Advisory
      15.      Advisory
      16. 3.2.4 Advisory
      17.      Advisory
      18. 3.2.5 Advisory
      19.      Advisory
  6. 4Silicon Revision B Usage Notes and Advisories
    1. 4.1 Silicon Revision B Usage Notes
    2. 4.2 Silicon Revision B Advisories
  7. 5Silicon Revision A Usage Notes and Advisories
    1. 5.1 Silicon Revision A Usage Notes
    2. 5.2 Silicon Revision A Advisories
  8. 6Silicon Revision 0 Usage Notes and Advisories
    1. 6.1 Silicon Revision 0 Usage Notes
    2. 6.2 Silicon Revision 0 Advisories
  9. 7Documentation Support
  10. 8Trademarks
  11. 9Revision History

3.2.1 Advisory

ePWM: Trip Events Will Not be Filtered by the Blanking Window for the First 3 Cycles After the Start of a Blanking Window

Revisions Affected

0, A, B, C

Details

The Blanking Window will not blank trip events for the first 3 cycles after the start of a Blanking Window. DCEVTFILT may continue to reflect changes in the DCxEVTy signals. If DCEVTFILT is enabled, this may impact subsequent subsystems that are configured (for example, the Trip Zone submodule, TZ interrupts, ADC SOC, or the PWM output).

Workaround

Start the Blanking Window 3 cycles before blanking is required. If a Blanking Window is needed at a period boundary, start the Blanking Window 3 cycles before the beginning of the next period. This works because Blanking Windows persist across period boundaries.