SWRU622A August 2024 – September 2024 AWRL1432 , AWRL6432 , IWRL1432 , IWRL6432 , IWRL6432AOP
Programmable built-in self test (PBIST) is a feature that is used for self-test the memory regions in the SoC without any external test equipment. In an embedded system, these tests are typically used during boot time or shutdown of the system to check the health of an SoC.
Logic built-in self test controller (LSTC) IP addresses the logic self-test requirements for functional safety applications as per ISO-26262 ASIL compliance. The LBIST is triggered through the RBL during power-up and/or during a warm reset if enabled, and if a functional safety rated device is being used.
For more details, see the Safety Modules section of the AWRL6432, IWRL6432, AWRL1432, IWRL1432 Technical Reference Manual.