SWRZ162 May   2024 IWR2944

 

  1.   1
  2. 1Introduction
  3. 2Device Nomenclature
  4. 3Device Markings
  5. 4Advisory to Silicon Variant / Revision Map
  6. 5Known Design Exceptions to Functional Specifications
    1.     MSS#25
    2.     MSS#27
    3.     MSS#28
    4.     MSS#29
    5.     MSS#30
    6.     MSS#33
    7.     MSS#40
    8. 5.1  MSS#46
    9. 5.2  MSS#48
    10. 5.3  MSS#49
    11. 5.4  MSS#52
    12. 5.5  MSS#53
    13. 5.6  MSS#54
    14. 5.7  MSS#55
    15. 5.8  MSS#56
    16. 5.9  MSS#57
    17. 5.10 MSS#58
    18. 5.11 MSS#59
    19. 5.12 MSS#60
    20. 5.13 MSS#61
    21. 5.14 MSS#62
    22. 5.15 ANA#12A
    23.     ANA#32A
    24.     ANA#33A
    25.     ANA#34A
    26.     ANA#35A
    27.     ANA#36
    28.     ANA#37A
    29.     ANA#38A
    30.     ANA#39
    31.     ANA#43
    32.     ANA#44
    33.     ANA#45
    34.     ANA#46
    35.     ANA#47
  7.   Trademarks
  8. 6Revision History

ANA#45

Spurs Caused due to Digital Activity

Revision(s) Affected:

IWR2944 ES1.0, ES2.0

Description:

Digital filtering activity can potentially couple to analog circuits leading to spurs in the LO, which may also be seen in the Rx data. Such a spur in the Rx data would be seen at the spur frequency offset around a strong object.

Following are the different spurs that can potentially be observed:

  1. Spurs at (2Fs-40) MHz IF frequency for sampling rate +/-0.5Msps around 20 Msps.
  2. Spurs at (2Fs-60) MHz IF frequency for sampling rate +/-0.5Msps around 30 Msps.
  3. Spurs at (4Fs-140) MHz IF frequency for sampling rate +/-0.3Msps around 35 Msps.
  4. Spurs at (4Fs-100) MHz IF frequency for sampling rates in the range 22 to 23.5 Msps and 26.5 to 28 Msps

[Fs=Profile Sampling Rate]

Workaround(s):

The user should avoid sampling rates in the range mentioned above or use exactly the center of the sampling rate range (so that spur is at 0 Hz).