TIDUEM8B March   2019  – February 2021

 

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3.2.2.1 SVS and eFuse Functionality Testing Results

Table 3-3 SVS Test Results
CONDITIONMEASURED VOLTAGE (V)DATA SHEET TYPICAL VOLTAGE VALUE (V)
Negative voltage threshold, VIT-2.00 V2.00 ±1% V
Positive voltage threshold, VIT+ = VIT- + VHYS2.11 V2.10 V
Hysteresis voltage, VHYS = VIT+ – VIT-2.11 – 2.00 = 0.11 V2.1 – 2.0 = 0.10 V

The measured values of VIT- and VHYS, match closely with the expected values from the data sheet.

Table 3-4 eFuse Test Results
CONDITIONMEASURED VOLTAGE (V)EXPECTED VOLTAGE VALUE (V)
Power failure detection threshold (VIN Falling)4.05 V4.26 – 0.224 = 4.04 V (Based on data sheet typical value for internal UVLO threshold, rising and hysteresis)
Release UVLO (VIN Rising)4.28 V4.26 V (Based on data sheet typical value for internal UVLO threshold, rising)
Release overvoltage condition (VIN Falling)5.62 V5.57 V (Taken from TPS25921 calculation sheet and selected resistor values)
Overvoltage cutoff threshold (VIN Rising)5.81 V5.78 V (Taken from TPS25921 calculation sheet and selected resistor values)

The measured values for the power failure detection threshold and overvoltage cutoff threshold match closely with the expected values. In addition, the overcurrent threshold value that was measured to cause a thermal shutdown was 1.62 A.