TIDUEY6 April   2021

 

  1.   Description
  2.   Resources
  3.   Features
  4.   Applications
  5.   5
  6. 1System Description
  7. 2System Overview
    1. 2.1 Block Diagram
    2. 2.2 Design Considerations
    3. 2.3 Highlighted Products
      1. 2.3.1 C2000 MCU F2838x
      2. 2.3.2 UCC5870-Q1 Gate Driver
  8. 3Hardware, Software, Testing Requirements, and Test Results
    1. 3.1 Hardware Requirements
      1. 3.1.1 Hardware Overview
        1. 3.1.1.1 Control Module
          1. 3.1.1.1.1 Control Mother Board
            1. 3.1.1.1.1.1 Inverter Safing - UCC5870 ASC and Fault Control
            2. 3.1.1.1.1.2 DC-DC Safing
            3. 3.1.1.1.1.3 DC-DC Converter Secondary PWM Selection
            4. 3.1.1.1.1.4 Blower Fan Control
            5. 3.1.1.1.1.5 Voltage Monitor
            6. 3.1.1.1.1.6 Resolver Interface Control
            7. 3.1.1.1.1.7 Test Points on Control Module
            8. 3.1.1.1.1.8 General Purpose Ports
            9. 3.1.1.1.1.9 Connectors and Headers on Control Mother Board
          2. 3.1.1.1.2 Power Supplies
            1. 3.1.1.1.2.1 Power Supply 5V /5A
            2. 3.1.1.1.2.2 Power Supply 12-V/1-A
            3. 3.1.1.1.2.3 Power Supply 15-V/0.5-A
          3. 3.1.1.1.3 TCAN4550 module
          4. 3.1.1.1.4 Dual TCAN Module
          5. 3.1.1.1.5 Analog Back End Module
          6. 3.1.1.1.6 Resolver Analog Front End Module
        2. 3.1.1.2 Inverter Module
          1. 3.1.1.2.1 Inverter Mother Board
            1. 3.1.1.2.1.1 Connectors and Headers on Inverter Mother Board
            2. 3.1.1.2.1.2 Jumper and Test Points on Inverter Module
          2. 3.1.1.2.2 Inverter Gate Driver Module
            1. 3.1.1.2.2.1 Inverter Gate Drive Power Supply Module
          3. 3.1.1.2.3 Inverter Current Sense Module
          4. 3.1.1.2.4 Inverter Voltage Sense Module
        3. 3.1.1.3 DC-DC Bidirectional Converter Module
          1. 3.1.1.3.1 DC-DC Converter Mother Board
          2. 3.1.1.3.2 DC-DC Gate Driver Module
    2. 3.2 Resource Mapping
    3. 3.3 Test Setup
    4. 3.4 Test Results
  9. 4General Texas Instruments High Voltage Evaluation (TI HV EVM) User Safety Guidelines
  10. 5Design and Documentation Support
    1. 5.1 Design Files
      1. 5.1.1 Schematics
      2. 5.1.2 BOM
    2. 5.2 Software
    3. 5.3 Documentation Support
    4. 5.4 Support Resources
    5. 5.5 Trademarks
  11. 6About the Author
3.1.1.1.1.8 General Purpose Ports

The EVM is designed for custom function addressing core functions. In order to provide a certain level of flexibility to the kit to perform or facilitate certain functions, certain test ports are provided on the control mother board. They are shown in Figure 3-10.

GUID-20201210-CA0I-VSTH-VKVB-PCGN7V8FDH8H-low.jpg Figure 3-10 General Purpose Ports

J18 and J25 are the test ports. They provide limited flexibility as given below
  • J18 - It can be connected to a potentiometer to provide a variable voltage to an ADC input of C2000. This can be used to control the blower fan speed as the silk screen indicates. Alternately, this analog input can also be used as a means of feeding in variable input for any regulation purposes during development.
  • J25 - It can provide two different functions
    • QEP port - interface to a QEP for bench testing with a different motor for evaluating certain algorithms
    • SPI port - interface to any external SPI connectable devices