TIDUF13 November   2022 ADS117L11 , ADS127L11

 

  1.   Description
  2.   Resources
  3.   Features
  4.   Applications
  5.   5
  6. 1System Description
    1. 1.1 Key System Specification
  7. 2System Overview
    1. 2.1 Block Diagram
    2. 2.2 Design Considerations
      1. 2.2.1 Signal-Chain Voltage Levels
        1.       12
      2. 2.2.2 ADC Configuration
      3. 2.2.3 ADC Clocking and Synchronization
      4. 2.2.4 Differential Low-Pass Filter
      5. 2.2.5 Current Source
      6. 2.2.6 Gain Stage and High-Pass Filter
    3. 2.3 Highlighted Products
      1. 2.3.1 ADS127L11
      2. 2.3.2 THS4551
  8. 3System Design Theory
    1. 3.1 IEPE Sensor
      1. 3.1.1 IEPE Sensor Parameters
        1. 3.1.1.1 Sensitivity and Measurement Range
        2. 3.1.1.2 Excitation, Output Bias Voltage, and Output Impedance
        3. 3.1.1.3 Linearity and Temperature Variance
        4. 3.1.1.4 Frequency Response
        5. 3.1.1.5 Noise and Dynamic Range
  9. 4Hardware, Software, Testing, and Test Results
    1. 4.1 Hardware Description
      1. 4.1.1 Board Interface
      2. 4.1.2 Power Configuration
        1. 4.1.2.1 Power Sequence
        2. 4.1.2.2 Analog Supply
        3. 4.1.2.3 Digital Supply
        4. 4.1.2.4 Excitation Current Supply
        5. 4.1.2.5 SPI Connectivity Modes and Their Assembly Variants
          1. 4.1.2.5.1 Daisy-Chain Mode
          2. 4.1.2.5.2 Parallel SDO Mode
          3. 4.1.2.5.3 Parallel SDI Mode and Parallel SDO Mode
          4. 4.1.2.5.4 Clocking Modes
    2. 4.2 Software Requirements
    3. 4.3 Test Setup and Procedure
      1. 4.3.1 Noise Floor and SNR
      2. 4.3.2 Gain and Input Range
      3. 4.3.3 Crosstalk
      4. 4.3.4 Total Harmonic Distortion
      5. 4.3.5 Clock Image Rejection
      6. 4.3.6 Synchronization of the ADCs
      7. 4.3.7 Fault Detection Circuit
    4. 4.4 Test Results
      1. 4.4.1 Noise Floor and Dynamic Range
      2. 4.4.2 Gain and Input Range
      3. 4.4.3 Crosstalk
      4. 4.4.4 Total Harmonic Distortion
      5. 4.4.5 Clock Image Rejection
      6. 4.4.6 Synchronization of the ADCs
      7. 4.4.7 Fault Detection Circuit
      8. 4.4.8 Test With Actual IEPE Sensor
      9. 4.4.9 Measurement Results Summary
  10. 5Design and Documentation Support
    1. 5.1 Design Files
      1. 5.1.1 Schematics
      2. 5.1.2 BOM
    2. 5.2 Software
    3. 5.3 Documentation Support
    4. 5.4 Support Resources
    5. 5.5 Trademarks
  11. 6About the Author

4.3.7 Fault Detection Circuit

The reference design software shows the output of the fault detection circuit as open and short states. However, detection is not continuous in time, but rather is sampled every predefined period. The sampling period can be configured in the software.

Use the following steps to check the levels of the fault detection:

  • Connect the input to a DC source
  • Sweep the DC source between 0 V and 24 V with arbitrary number of steps
  • For each step, make sure to acquire the fault shift register output
  • Mark the levels at which open and short faults are triggered
  • A reverse sweep can be applied to check hysteresis

Use the following steps to check the delay of the fault detection circuit.

  • Input to the fault detection comparators is low-pass filtered which results in some delay between the actual input change and the comparator output change
  • Use an input square waveform that crosses one of the detection levels found in the previous step. Probe the input signal and use as a trigger.
  • Probe the comparator output of the excited channel
  • Measure the delay between the threshold crossing of the input and the output mid-level crossing