TIDUF13 November   2022 ADS117L11 , ADS127L11

 

  1.   Description
  2.   Resources
  3.   Features
  4.   Applications
  5.   5
  6. 1System Description
    1. 1.1 Key System Specification
  7. 2System Overview
    1. 2.1 Block Diagram
    2. 2.2 Design Considerations
      1. 2.2.1 Signal-Chain Voltage Levels
        1.       12
      2. 2.2.2 ADC Configuration
      3. 2.2.3 ADC Clocking and Synchronization
      4. 2.2.4 Differential Low-Pass Filter
      5. 2.2.5 Current Source
      6. 2.2.6 Gain Stage and High-Pass Filter
    3. 2.3 Highlighted Products
      1. 2.3.1 ADS127L11
      2. 2.3.2 THS4551
  8. 3System Design Theory
    1. 3.1 IEPE Sensor
      1. 3.1.1 IEPE Sensor Parameters
        1. 3.1.1.1 Sensitivity and Measurement Range
        2. 3.1.1.2 Excitation, Output Bias Voltage, and Output Impedance
        3. 3.1.1.3 Linearity and Temperature Variance
        4. 3.1.1.4 Frequency Response
        5. 3.1.1.5 Noise and Dynamic Range
  9. 4Hardware, Software, Testing, and Test Results
    1. 4.1 Hardware Description
      1. 4.1.1 Board Interface
      2. 4.1.2 Power Configuration
        1. 4.1.2.1 Power Sequence
        2. 4.1.2.2 Analog Supply
        3. 4.1.2.3 Digital Supply
        4. 4.1.2.4 Excitation Current Supply
        5. 4.1.2.5 SPI Connectivity Modes and Their Assembly Variants
          1. 4.1.2.5.1 Daisy-Chain Mode
          2. 4.1.2.5.2 Parallel SDO Mode
          3. 4.1.2.5.3 Parallel SDI Mode and Parallel SDO Mode
          4. 4.1.2.5.4 Clocking Modes
    2. 4.2 Software Requirements
    3. 4.3 Test Setup and Procedure
      1. 4.3.1 Noise Floor and SNR
      2. 4.3.2 Gain and Input Range
      3. 4.3.3 Crosstalk
      4. 4.3.4 Total Harmonic Distortion
      5. 4.3.5 Clock Image Rejection
      6. 4.3.6 Synchronization of the ADCs
      7. 4.3.7 Fault Detection Circuit
    4. 4.4 Test Results
      1. 4.4.1 Noise Floor and Dynamic Range
      2. 4.4.2 Gain and Input Range
      3. 4.4.3 Crosstalk
      4. 4.4.4 Total Harmonic Distortion
      5. 4.4.5 Clock Image Rejection
      6. 4.4.6 Synchronization of the ADCs
      7. 4.4.7 Fault Detection Circuit
      8. 4.4.8 Test With Actual IEPE Sensor
      9. 4.4.9 Measurement Results Summary
  10. 5Design and Documentation Support
    1. 5.1 Design Files
      1. 5.1.1 Schematics
      2. 5.1.2 BOM
    2. 5.2 Software
    3. 5.3 Documentation Support
    4. 5.4 Support Resources
    5. 5.5 Trademarks
  11. 6About the Author

4.3 Test Setup and Procedure

Use the basic setup in Figure 4-8 to evaluate the design PCB. The board is connected through a PHI board to a PC running the TIDA-010249 software.

The following components are required to run all tests:

  • Reference design PCB (with the parallel or daisy-chain assembly configuration)
  • 5.2-V power supply, set to a 300-mA limit
  • PHI board
  • PC running the reference design software
  • Shunts, and various loads (100 Ω to 300 Ω, 0.25 W)
  • Waveform generator (±10-V output, up to 100 Hz to 15 kHz), for THD measurement the generator must have very low distortion (< –100 dB), 16 MHz needs to be supported for clock rejection
  • The PSI EVM is a good and affordable choice to generate a clean 2-kHz signal
  • 4-channel analog scope (for the synchronicity test)
  • For current source measurement: current source with current sink capability, and output up to 23 V
  • For testing with a sensor, a standard IEPE sensor is required, with a shielded cable connected with PCB BNC input. Four sensors can be used for the 4-channel testing.
  • For controlled testing with a sensor, use a sensor emulator which can be fed with a known signal to generate deterministic output
Figure 4-8 Basic Test Setup