TIDUF13 November   2022 ADS117L11 , ADS127L11

 

  1.   Description
  2.   Resources
  3.   Features
  4.   Applications
  5.   5
  6. 1System Description
    1. 1.1 Key System Specification
  7. 2System Overview
    1. 2.1 Block Diagram
    2. 2.2 Design Considerations
      1. 2.2.1 Signal-Chain Voltage Levels
        1.       12
      2. 2.2.2 ADC Configuration
      3. 2.2.3 ADC Clocking and Synchronization
      4. 2.2.4 Differential Low-Pass Filter
      5. 2.2.5 Current Source
      6. 2.2.6 Gain Stage and High-Pass Filter
    3. 2.3 Highlighted Products
      1. 2.3.1 ADS127L11
      2. 2.3.2 THS4551
  8. 3System Design Theory
    1. 3.1 IEPE Sensor
      1. 3.1.1 IEPE Sensor Parameters
        1. 3.1.1.1 Sensitivity and Measurement Range
        2. 3.1.1.2 Excitation, Output Bias Voltage, and Output Impedance
        3. 3.1.1.3 Linearity and Temperature Variance
        4. 3.1.1.4 Frequency Response
        5. 3.1.1.5 Noise and Dynamic Range
  9. 4Hardware, Software, Testing, and Test Results
    1. 4.1 Hardware Description
      1. 4.1.1 Board Interface
      2. 4.1.2 Power Configuration
        1. 4.1.2.1 Power Sequence
        2. 4.1.2.2 Analog Supply
        3. 4.1.2.3 Digital Supply
        4. 4.1.2.4 Excitation Current Supply
        5. 4.1.2.5 SPI Connectivity Modes and Their Assembly Variants
          1. 4.1.2.5.1 Daisy-Chain Mode
          2. 4.1.2.5.2 Parallel SDO Mode
          3. 4.1.2.5.3 Parallel SDI Mode and Parallel SDO Mode
          4. 4.1.2.5.4 Clocking Modes
    2. 4.2 Software Requirements
    3. 4.3 Test Setup and Procedure
      1. 4.3.1 Noise Floor and SNR
      2. 4.3.2 Gain and Input Range
      3. 4.3.3 Crosstalk
      4. 4.3.4 Total Harmonic Distortion
      5. 4.3.5 Clock Image Rejection
      6. 4.3.6 Synchronization of the ADCs
      7. 4.3.7 Fault Detection Circuit
    4. 4.4 Test Results
      1. 4.4.1 Noise Floor and Dynamic Range
      2. 4.4.2 Gain and Input Range
      3. 4.4.3 Crosstalk
      4. 4.4.4 Total Harmonic Distortion
      5. 4.4.5 Clock Image Rejection
      6. 4.4.6 Synchronization of the ADCs
      7. 4.4.7 Fault Detection Circuit
      8. 4.4.8 Test With Actual IEPE Sensor
      9. 4.4.9 Measurement Results Summary
  10. 5Design and Documentation Support
    1. 5.1 Design Files
      1. 5.1.1 Schematics
      2. 5.1.2 BOM
    2. 5.2 Software
    3. 5.3 Documentation Support
    4. 5.4 Support Resources
    5. 5.5 Trademarks
  11. 6About the Author

4.3.1 Noise Floor and SNR

For evaluation of signal-chain without excitation current or actual sensors, use the following setup:

  • Make sure that the board is in the specific SPI mode (for example, daisy chain) matching that of the software settings
  • Channel input is set to AC couple (J10A = open), according to the need and input is shorted to ground (J8A, 2-3 = short)
  • Analog supply connector J1 is connected to a 5.2-V supply (booster is off)
  • J6 is shorted to use the PHI DVDD (by default, boards are set to 2.5-V digital supply)
  • Turn the analog supply on, then connect the PHI board to USB
  • Configure the software settings according to the required configuration (Vref = 4.096, OSR = 64, 16384 or 32768 sample)
  • Capture the frame (it captures all channels)
  • In the histogram or time view, record the peak-to-peak, standard deviation (sigma), and mean values, as well as the effective resolution
  • Calculate the channel offset from mean, channel noise from std. deviation in μV (also check peak-to-peak value) and calculate the Dynamic Range of each channel (FS = 4V/RMS Vnoise).
  • The previous steps can be repeated for different data rates (OSR) and multiple sample set.
  • In the frequency domain view, spectrum is checked for any abnormal noise spikes or interference tones. A histogram view presents a random Gaussian distribution.
  • Repeat the measurement with the booster device on, and excitation current loaded with passive load but not connected to the input