TIDUF68 February 2024
The LMG2100 100V GaN half-bridge power stage provides an integrated power stage design using enhancement-mode Gallium Nitride (GaN) FETs. The device consists of two GaN FETs driven by one high-frequency GaN FET driver in a half-bridge configuration, as shown in Figure 2-2. Key features for this design are summarized in Table 2-1.
FEATURE | BENEFIT |
---|---|
Integrated high-side and low-side GaN driver and 80V GaN FETs, 4.4mΩ devices for 35A DC operation. | Enables up to 60VDC, three-phase inverter with 16ARMS phase current at 80kHz high-switching frequency for low inductance and high-speed drives. |
Integrated 80V, 4.4mΩ, GaN FETs and GaN driver with completely bond-wire-free package. | Minimized package parasitic elements enable ultra-fast switching for reduced switching losses to reduce or eliminate heat sink. |
GaN FETs have zero reverse recovery (3rd quadrant operation) and very small input capacitance CISS. | Reduces or eliminates ringing in hard switching, like in inverters reduce EMI. Very low overshoot and undershoot allows higher nominal DC-link voltage than Si-FET for same maximum rated voltage. |
Excellent propagation delay matching (2ns FETs). | Enables ultra-low dead band per half-bridge for major reduction of switching losses in three-phase inverter applications and elimination of dead-time distortions in the phase voltage. |
Independent high-side and low-side transistor-transistor logic (TTL) inputs. | Direct PWM interface to 3.3V MCU. |
Single 5V gate driver supply with bootstrap voltage clamping and undervoltage lockout. | Ease power management. UVLO provides simultaneous shutdown of high-side and low-side GaN FET in case of gate driver undervoltage |
LMG2100 optimized pinout. | Easy PCB layout with minimum inductance for reduced switching losses. |
Two exposed GaN dies on top (SW and PGND). Big PGND pad on bottom. | Realize lower top thermal resistance. Accepts both sides cooling. |