This report covers the radiation characterization results of the TMUX582F-SEP multiplexer. The study was done to determine Total Ionizing Dose (TID) effects under high dose rate (HDR) and low dose rate (LDR) up to 30krad(Si) as a one-time characterization. The results show that all samples passed within the specified limits up to 30krad(Si). Radiation Lot Acceptance Testing (RLAT) will be performed using 5 units at a dose level of 30krad(Si) for future wafer lots. Furthermore, the TMUX582F-SEP is in a plastic package for low outgassing characteristics and is Single Event Latch-Up (SEL) immune up to 43MeV-cm2/mg, which makes the device an option for low earth orbit space applications. The device is a fault protected CMOS multiplexer flexible enough to handle a diversity of applications, from system monitoring, to power-up sequencing protection, to high precision front end data acquisition.