This document contains information for - the UCC28C50, UCC28C51, UCC28C52, UCC28C53, UCC28C54, UCC28C55, UCC28C56H, UCC28C56L, UCC28C57H, UCC28C57L, UCC28C58, and UCC28C59, UCC38C50, UCC38C51, UCC38C52, UCC38C53, UCC38C54, UCC38C55 SOIC (8) and VSSOP (8) packages to aid in a functional safety system design. Information provided are:
Functional Safety Failure In Time (FIT) rates of the semiconductor component estimated by the application of
industry reliability standards
Figure 1-1shows the device functional block diagram for reference.
Toggle flip-flop used only in UCCx8C51, UCCx8C54, and UCCx8C55, UCC28C57H, UCC28C57L, and UCC28C59
UCCx8C5x was developed using a quality-managed development process, but was not developed in accordance with the IEC 61508 or ISO 26262 standards.
UVLO | MAXIMUM DUTY CYCLE | TEMPERATURE (TA) | ||
---|---|---|---|---|
TURN ON AT 14.5 V TURN OFF AT 9 V SUITABLE FOR OFF-LINE APPLICATIONS |
TURN ON AT 8.4 V TURN OFF AT 7.6 V SUITABLE FOR DC/DC APPLICATIONS |
TURN ON AT 7 V TURN OFF AT 6.6 V SUITABLE FOR BATTERY APPLICATIONS |
||
UCC28C52 | UCC28C53 | UCC28C50 | 100% | –40°C to 125°C |
UCC28C54 | UCC28C55 | UCC28C51 | 50% | |
UCC38C52 | UCC38C53 | UCC38C50 | 100% | 0°C to 85°C |
UCC38C54 | UCC38C55 | UCC38C51 | 50% |
UVLO | MAXIMUM DUTY CYCLE | TEMPERATURE (TA) | ||
---|---|---|---|---|
TURN ON AT 18.8 V TURN OFF AT 15.5V Suitable for HV applications using GEN-I SiC MOSFET | TURN ON AT 18.8 V TURN OFF AT 14.5V | TURN ON AT 16 V TURN OFF AT 12.5V | ||
UCC28C56H | UCC28C56L | UCC28C58 | 100% | –40°C to 125°C |
UCC28C57H | UCC28C57L | UCC28C59 | 50% |
This section provides Functional Safety Failure In Time (FIT) rates for SOIC (8) package of UCCx8C5x based on two different industry-wide used reliability standards:
FIT IEC TR 62380 / ISO 26262 | FIT (Failures Per 109 Hours) |
---|---|
Total Component FIT Rate (71.6 mW, 150 mW, 300 mW) | 10, 11, 15 |
Die FIT Rate (71.6 mW, 150 mW, 300 mW) | 3, 4, 7 |
Package FIT Rate (71.6 mW, 150 mW, 300 mW) | 7, 7, 8 |
The failure rate and mission profile information in Table 2-1 comes from the Reliability data handbook IEC TR 62380 / ISO 26262 part 11:
Table | Category | Reference FIT Rate | Reference Virtual TJ |
---|---|---|---|
5 | CMOS,
BICMOS Digital, analog / mixed | 25 FIT | 55°C |
The Reference FIT Rate and Reference Virtual TJ (junction temperature) in Table 2-2 come from the Siemens Norm SN 29500-2 tables 1 through 5. Failure rates under operating conditions are calculated from the reference failure rate and virtual junction temperature using conversion information in SN 29500-2 section 4.