SNAS805
June 2020
LMK61E08
PRODUCTION DATA.
1
Features
2
Applications
3
Description
Pinout and Simplified Block Diagram
Device Images
4
Revision History
5
Pin Configuration and Functions
Pin Functions
6
Specifications
6.1
Absolute Maximum Ratings
6.2
ESD Ratings
6.3
Recommended Operating Conditions
6.4
Thermal Information
6.5
Electrical Characteristics - Power Supply
6.6
LVPECL Output Characteristics
6.7
LVDS Output Characteristics
6.8
HCSL Output Characteristics
6.9
Frequency Tolerance Characteristics
6.10
Frequency Margining Characteristics
6.11
Power-On Reset Characteristics (VDD)
6.12
I2C-Compatible Interface Characteristics (SDA, SCL)
6.13
PSRR Characteristics
6.14
Other Characteristics
6.15
PLL Clock Output Jitter Characteristics
6.16
Typical 156.25-MHz Output Phase Noise Characteristics
6.17
Typical 161.1328125 MHz Output Phase Noise Characteristics
6.18
Additional Reliability and Qualification
6.19
Typical Characteristics
7
Parameter Measurement Information
7.1
Device Output Configurations
8
Detailed Description
8.1
Overview
8.2
Functional Block Diagram
8.3
Feature Description
8.3.1
Device Block-Level Description
8.3.2
Device Configuration Control
8.3.3
Register File Reference Convention
8.3.4
Configuring the PLL
8.3.5
Integrated Oscillator
8.3.6
Reference Divider and Doubler
8.3.7
Phase Frequency Detector
8.3.8
Feedback Divider (N)
8.3.9
Fractional Engine
8.3.10
Charge Pump
8.3.11
Loop Filter
8.3.12
VCO Calibration
8.3.13
High-Speed Output Divider
8.3.14
High-Speed Clock Output
8.3.15
Device Status
8.3.15.1
Loss of Lock
8.4
Device Functional Modes
8.4.1
Interface and Control
8.4.2
DCXO Mode and Frequency Margining
8.4.2.1
DCXO Mode
8.4.2.2
Fine Frequency Margining
8.4.2.3
Coarse Frequency Margining
8.5
Programming
8.5.1
I2C Serial Interface
8.5.2
Block Register Write
8.5.3
Block Register Read
8.5.4
Write SRAM
8.5.5
Write EEPROM
8.5.6
Read SRAM
8.5.7
Read EEPROM
8.6
Register Maps
8.6.1
Register Descriptions
8.6.1.1
VNDRID_BY1 Register; R0
8.6.1.2
VNDRID_BY0 Register; R1
8.6.1.3
PRODID Register; R2
8.6.1.4
REVID Register; R3
8.6.1.5
SLAVEADR Register; R8
8.6.1.6
EEREV Register; R9
8.6.1.7
DEV_CTL Register; R10
8.6.1.8
XO_CAPCTRL_BY1 Register; R16
8.6.1.9
XO_CAPCTRL_BY0 Register; R17
8.6.1.10
DIFFCTL Register; R21
8.6.1.11
OUTDIV_BY1 Register; R22
8.6.1.12
OUTDIV_BY0 Register; R23
8.6.1.13
RDIVCMOSCTL Register; R24
8.6.1.14
PLL_NDIV_BY1 Register; R25
8.6.1.15
PLL_NDIV_BY0 Register; R26
8.6.1.16
PLL_FRACNUM_BY2 Register; R27
8.6.1.17
PLL_FRACNUM_BY1 Register; R28
8.6.1.18
PLL_FRACNUM_BY0 Register; R29
8.6.1.19
PLL_FRACDEN_BY2 Register; R30
8.6.1.20
PLL_FRACDEN_BY1 Register; R31
8.6.1.21
PLL_FRACDEN_BY0 Register; R32
8.6.1.22
PLL_MASHCTRL Register; R33
8.6.1.23
PLL_CTRL0 Register; R34
8.6.1.24
PLL_CTRL1 Register; R35
8.6.1.25
PLL_LF_R2 Register; R36
8.6.1.26
PLL_LF_C1 Register; R37
8.6.1.27
PLL_LF_R3 Register; R38
8.6.1.28
PLL_LF_C3 Register; R39
8.6.1.29
PLL_CALCTRL Register; R42
8.6.1.30
NVMSCRC Register; R47
8.6.1.31
NVMCNT Register; R48
8.6.1.32
NVMCTL Register; R49
8.6.1.33
NVMLCRC Register; R50
8.6.1.34
MEMADR Register; R51
8.6.1.35
NVMDAT Register; R52
8.6.1.36
RAMDAT Register; R53
8.6.1.37
NVMUNLK Register; R56
8.6.1.38
INT_LIVE Register; R66
8.6.1.39
SWRST Register; R72
9
Application and Implementation
9.1
Application Information
9.2
Typical Application
9.2.1
Design Requirements
9.2.2
Detailed Design Procedure
9.2.2.1
PLL Loop Filter Design
9.2.2.2
Spur Mitigation Techniques
9.2.2.2.1
Phase Detection Spur
9.2.2.2.2
Integer Boundary Fractional Spur
9.2.2.2.3
Primary Fractional Spur
9.2.2.2.4
Sub-Fractional Spur
9.2.2.3
Device Programming
9.2.3
Application Curves
10
Power Supply Recommendations
11
Layout
11.1
Layout Guidelines
11.1.1
Ensured Thermal Reliability
11.1.2
Best Practices for Signal Integrity
11.1.3
Recommended Solder Reflow Profile
11.2
Layout Example
12
Device and Documentation Support
12.1
Documentation Support
12.1.1
Related Documentation
12.2
Receiving Notification of Documentation Updates
12.3
Support Resources
12.4
Trademarks
12.5
Electrostatic Discharge Caution
12.6
Glossary
13
Mechanical, Packaging, and Orderable Information
13.1
Package Option Addendum
13.1.1
Packaging Information
13.1.2
Tape and Reel Information
Package Options
Mechanical Data (Package|Pins)
SIA|6
MPSI064B
Thermal pad, mechanical data (Package|Pins)
Orderable Information
snas805_oa
snas805_pm
1
Features
Ultra-Low Noise, High Performance
Jitter: 90-fs RMS Typical f
OUT
> 100 MHz on
LMK61E08
PSRR: –70 dBc, Robust Supply Noise Immunity on
LMK61E08
Flexible Output Format on
LMK61E08
LVPECL up to 1 GHz
LVDS up to 900 MHz
HCSL up to 400 MHz
Total Frequency Tolerance of ±25 ppm
System Level Features
Glitch-Less Frequency Margining: Up to ±1000 ppm From Nominal
Internal EEPROM: User Configurable Start-Up Settings
Other Features
Device Control: Fast Mode I
2
C up to 1000 kHz
3.3-V Operating Voltage
Industrial Temperature Range (–40ºC to +85ºC)
7-mm × 5-mm 6-Pin Package
Default Frequency:
70.656 MHz