The LP2996-N and LP2996A linear regulators are designed to meet the JEDEC SSTL-2 specifications for termination of DDR-SDRAM. The device also supports DDR2, while LP2996A supports DDR3 and DDR3L VTT bus termination with VDDQ minimum of 1.35 V. The device contains a high-speed operational amplifier to provide excellent response to load transients. The output stage prevents shoot through while delivering 1.5-A continuous current and transient peaks up to 3 A in the application as required for DDR-SDRAM termination. The LP2996-N and LP2996A also incorporate a VSENSE pin to provide superior load regulation and a VREF output as a reference for the chipset and DIMMs.
An additional feature found on the LP2996-N and LP2996A is an active-low shutdown (SD) pin that provides Suspend To RAM (STR) functionality. When SD is pulled low the VTT output will tri-state providing a high impedance output, but VREF remains active. A power savings advantage can be obtained in this mode through lower quiescent current.
TI recommends the LP2998 and LP2998-Q1 devices for automotive applications and DDR applications that require operating at temperatures below zero.
WEBENCH® design tools can be used by application designers to generate, optimize, and simlulate applications using the LP2998 and LP2998-Q1.
PART NUMBER | PACKAGE | BODY SIZE (NOM) |
---|---|---|
LP2996-N | SOIC (8) | 4.90 mm x 3.90 mm |
LP2996-N, LP2996A | WSON (8) | 4.90 mm x 3.90 mm |
LP2996-N | WQFN (16) | 4.00 mm x 4.00 mm |
Changes from J Revision (March 2013) to K Revision
Changes from I Revision (March 2013) to J Revision
PIN | I/O | DESCRIPTION | |||
---|---|---|---|---|---|
NAME | SO PowerPAD | SOIC | WQFN | ||
AVIN | 6 | 6 | 10 | I | Analog input pin. AVIN is used to supply all the internal control circuitry. This pin has the capability to work from a supply separate from PVIN depending on the application. For SSTL-2 applications, a good compromise would be to connect the AVIN and PVIN directly together at 2.5 V. This eliminates the requirement for bypassing the two supply pins separately. The only limitation on input voltage selection is that PVIN must be equal to or lower than AVIN. |
GND | 1 | 1 | 2 | — | Ground |
PVIN | 7 | 7 | 11, 12 | I | Power input pin. PVIN is used exclusively to provide the rail voltage for the output stage used to create VTT. This pin has the capability to work from a supply separate from PVIN depending on the application. Higher voltages on PVIN increases the maximum continuous output current because of output RDS(ON) limitations at voltages close to VTT. The disadvantage of high values of PVIN is that the internal power loss also increases, thermally limiting the design. For SSTL-2 applications, a good compromise would be to connect the AVIN and PVIN directly together at 2.5 V. This eliminates the requirement for bypassing the two supply pins separately. The only limitation on input voltage selection is that PVIN must be equal to or lower than AVIN. TI recommends connecting PVIN to voltage rails equal to or less than 3.3 V to prevent the thermal limit from tripping because of excessive internal power dissipation. If the junction temperature exceeds the thermal shutdown then the part enters a shutdown state identical to the manual shutdown where VTT is tri-stated and VREF remains active. |
SD | 2 | 2 | 4 | I | Shutdown. The LP2996-N and LP2996A contain an active low shutdown pin that can be used to tri-state VTT. During shutdown VTT must not be exposed to voltages that exceed AVIN. With the shutdown pin asserted low the quiescent current of the LP2996-N and LP2996A drops, however, VDDQ always maintains its constant impedance of 100 kΩ for generating the internal reference. Therefore, to calculate the total power loss in shutdown, both currents must be considered. See Thermal Considerations for more information. The shutdown pin also has an internal pullup current, therefore to turn the part on, the shutdown pin can either be connected to AVIN or left open. |
VDDQ | 5 | 5 | 8 | I | Input for internal reference equal to VDDQ / 2. VDDQ is the input used to create the internal reference voltage for regulating VTT. The reference voltage is generated from a resistor divider of two internal 50-kΩ resistors. This ensures that VTT tracks VDDQ / 2 precisely. The optimal implementation of VDDQ is as a remote sense. This can be achieved by connecting VDDQ directly to the 2.5-V rail at the DIMM instead of AVIN and PVIN. This ensures that the reference voltage tracks the DDR memory rails precisely without a large voltage drop from the power lines. For SSTL-2 applications VDDQ is a 2.5-V signal, which creates a 1.25-V termination voltage at VTT. See Electrical Characteristics for exact values of VTT over temperature. |
VREF | 4 | 4 | 7 | O | Buffered internal reference voltage of VDDQ / 2. VREF provides the buffered output of the internal reference voltage VDDQ / 2. This output must be used to provide the reference voltage for the Northbridge chipset and memory. Because these inputs are typically an extremely high impedance, there must be little current drawn from VREF. For improved performance, an output bypass capacitor can be placed close to the pin to help reduce noise. TI recommends a ceramic capacitor from 0.1 µF to 0.01 µF. This output remains active during the shutdown state and thermal shutdown events for the suspend to RAM functionality. |
VSENSE | 3 | 3 | 5 | I | Feedback pin for regulating VTT. The purpose of the sense pin is to provide improved remote load regulation. In most motherboard applications the termination resistors connect to VTT in a long plane. If the output voltage was regulated only at the output of the device then the long trace causes a significant IR drop resulting in a termination voltage lower at one end of the bus than the other. The VSENSE pin can be used to improve this performance by connecting it to the middle of the bus. This provides a better distribution across the entire termination bus. If remote load regulation is not used then the VSENSE pin must still be connected to VTT. Take care when a long VSENSE trace is implemented in close proximity to the memory. Noise pickup in the VSENSE trace can cause problems with precise regulation of VTT. A small 0.1-µF ceramic capacitor placed next to the VSENSE pin can help filter any high frequency signals and preventing errors. |
VTT | 8 | 8 | 14, 15 | O | Output voltage for connection to termination resistors. VTT is the regulated output that is used to terminate the bus resistors. It is capable of sinking and sourcing current while regulating the output precisely to VDDQ / 2. The LP2996-N and LP2996A are designed to handle peak transient currents of up to ±3 A with a fast transient response. The maximum continuous current is a function of VDD and can be seen in Typical Characteristics. If a transient above the maximum continuous current rating is expected to last for a significant amount of time then the output capacitor must be large enough to prevent an excessive voltage drop. Despite the fact that the device is designed to handle large transient output currents it is not capable of handling these for long durations under all conditions. The reason for this is the standard packages are not able to thermally dissipate the heat as a result of the internal power loss. If large currents are required for longer durations, then ensure that the maximum junction temperature is not exceeded. Proper thermal derating must always be used (see Thermal Considerations). If the junction temperature exceeds the thermal shutdown point then VTT tri-states until the part returns below the hysteretic trip-point. |
NC | — | — | 1, 3, 6, 9, 13, 16 | — | No internal connection |
Thermal Pad | PowerPAD | — | Thermal Pad | — | Exposed pad thermal connection. Connect to Ground. |
MIN | MAX | UNIT | ||
---|---|---|---|---|
AVIN to GND | −0.3 | 6 | V | |
PVIN to GND | –0.3 | AVIN | V | |
Input voltage (VDDQ)(3) | −0.3 | 6 | V | |
Junction temperature, TJ | 150 | °C | ||
Storage temperature, Tstg | –65 | 150 | °C |
VALUE | UNIT | |||
---|---|---|---|---|
V(ESD) | Electrostatic discharge | Human-body model (HBM), per ANSI/ESDA/JEDEC JS-001(1) | ±1000 | V |
MIN | MAX | UNIT | ||
---|---|---|---|---|
AVIN to GND | 2.2 | 5.5 | V | |
PVIN supply voltage | 0 | AVIN | V | |
SD input voltage | 0 | AVIN | V | |
TJ | Junction temperature(1) | 0 | 125 | °C |
THERMAL METRIC | LP2996-N, LP2996A | UNIT | |||
---|---|---|---|---|---|
D (SOIC) | DDA (SO) | NHP (WQFN) | |||
8 PINS | 8 PINS | 16 PINS | |||
RθJA | Junction-to-ambient thermal resistance | 119.5 | 56.5 | 52.7 | °C/W |
RθJC(top) | Junction-to-case (top) thermal resistance | 65.3 | 65.1 | 50.1 | °C/W |
RθJB | Junction-to-board thermal resistance | 59.8 | 36.5 | 30.1 | °C/W |
ψJT | Junction-to-top characterization parameter | 16.7 | 15.9 | 0.7 | °C/W |
ψJB | Junction-to-board characterization parameter | 59.3 | 36.5 | 30.2 | °C/W |
RθJC(bot) | Junction-to-case (bottom) thermal resistance | — | 8.4 | 9.8 | °C/W |
PARAMETER | TEST CONDITIONS | MIN | TYP | MAX | UNIT | ||
---|---|---|---|---|---|---|---|
VREF | VREF voltage (DDR I) | VDD = VDDQ = 2.3 V | 1.135 | 1.158 | 1.185 | V | |
VDD = VDDQ = 2.5 V | 1.235 | 1.258 | 1.285 | ||||
VDD = VDDQ = 2.7 V | 1.335 | 1.358 | 1.385 | ||||
VREF voltage (DDR II) | PVIN = VDDQ = 1.7 V | 0.837 | 0.86 | 0.887 | V | ||
PVIN = VDDQ = 1.8 V | 0.887 | 0.91 | 0.937 | ||||
PVIN = VDDQ = 1.9 V | 0.936 | 0.959 | 0.986 | ||||
VREF voltage (DDR III) | PVIN = VDDQ = 1.35 V | 0.669 | 0.684 | 0.699 | V | ||
PVIN = VDDQ = 1.5 V | 0.743 | 0.758 | 0.773 | ||||
PVIN = VDDQ = 1.6 V | 0.793 | 0.808 | 0.823 | ||||
ZVREF | VREF output impedance | IREF = –30 to 30 µA | 2.5 | kΩ | |||
VTT | VTT output voltage (DDR I)(2) | IOUT = 0 A | VDD = VDDQ = 2.3 V | 1.12 | 1.159 | 1.19 | V |
VDD = VDDQ = 2.5 V | 1.21 | 1.259 | 1.29 | ||||
VDD = VDDQ = 2.7 V | 1.32 | 1.359 | 1.39 | ||||
IOUT = ±1.5 A | VDD = VDDQ = 2.3 V | 1.125 | 1.159 | 1.19 | |||
VDD = VDDQ = 2.5 V | 1.225 | 1.259 | 1.29 | ||||
VDD = VDDQ = 2.7 V | 1.325 | 1.359 | 1.39 | ||||
VTT output voltage (DDR II)(2) | IOUT = 0 A, AVIN = 2.5 V | PVIN = VDDQ = 1.7 V | 0.822 | 0.856 | 0.887 | V | |
PVIN = VDDQ = 1.8 V | 0.874 | 0.908 | 0.939 | ||||
PVIN = VDDQ = 1.9 V | 0.923 | 0.957 | 0.988 | ||||
IOUT = ±0.5 A, AVIN = 2.5 V | PVIN = VDDQ = 1.7 V | 0.82 | 0.856 | 0.89 | |||
PVIN = VDDQ = 1.8 V | 0.87 | 0.908 | 0.94 | ||||
PVIN = VDDQ = 1.9 V | 0.92 | 0.957 | 0.99 | ||||
VTT output voltage (DDR III)(2) | IOUT = 0 A, AVIN = 2.5 V | PVIN = VDDQ = 1.35 V | 0.656 | 0.677 | 0.698 | V | |
PVIN = VDDQ = 1.5 V | 0.731 | 0.752 | 0.773 | ||||
PVIN = VDDQ = 1.6 V | 0.781 | 0.802 | 0.823 | ||||
IOUT = 0.2 A, AVIN = 2.5 V, PVIN = VDDQ = 1.35 V | 0.667 | 0.688 | 0.71 | ||||
IOUT = –0.2 A, AVIN = 2.5 V, PVIN = VDDQ = 1.35 V | 0.641 | 0.673 | 0.694 | ||||
IOUT = 0.4 A, AVIN = 2.5 V, PVIN = VDDQ = 1.5 V | 0.74 | 0.763 | 0.786 | ||||
IOUT = –0.4 A, AVIN = 2.5 V, PVIN = VDDQ = 1.5 V | 0.731 | 0.752 | 0.773 | ||||
IOUT = 0.5 A, AVIN = 2.5 V, PVIN = VDDQ = 1.6 V | 0.79 | 0.813 | 0.836 | ||||
IOUT = –0.5 A, AVIN = 2.5 V, PVIN = VDDQ = 1.6 V | 0.781 | 0.802 | 0.823 | ||||
VOSVtt | VTT output voltage offset (VREF – VTT) for DDR I(2) |
IOUT = 0 A | –30 | 0 | 30 | mV | |
IOUT = –1.5 A | –30 | 0 | 30 | ||||
IOUT = 1.5 A | –30 | 0 | 30 | ||||
VTT output voltage offset (VREF – VTT) for DDR II(2) |
IOUT = 0 A | –30 | 0 | 30 | mV | ||
IOUT = –0.5 A | –30 | 0 | 30 | ||||
IOUT = 0.5 A | –30 | 0 | 30 | ||||
VTT output voltage offset (VREF – VTT) for DDR III(2) |
IOUT = 0 A | –30 | 0 | 30 | mV | ||
IOUT = ±0.2 A | –30 | 0 | 30 | ||||
IOUT = ±0.4 A | –30 | 0 | 30 | ||||
IOUT = ±0.5 A | –30 | 0 | 30 | ||||
IQ | Quiescent current(3) | IOUT = 0 A | 320 | 500 | µA | ||
ZVDDQ | VDDQ input impedance | 100 | kΩ | ||||
ISD | Quiescent current in shutdown(3) | SD is low | 115 | 150 | µA | ||
IQ_SD | Shutdown leakage current | SD is low | 2 | 5 | µA | ||
VIH | Minimum shutdown, high level | 1.9 | V | ||||
VIL | Maximum shutdown, low level | 0.8 | V | ||||
IV | VTT leakage current in shutdown | SD is low, VTT = 1.25 V | 1 | 10 | µA | ||
ISENSE | VSENSE input current | 13 | nA | ||||
TSD | Thermal shutdown | 165 | °C | ||||
TSD_HYS | Thermal shutdown hysteresis | 10 | °C |
VDDQ = 2.5 V | PVIN = 2.5 V |
VDDQ = 2.5 V |
VDDQ = 1.8 V |
VDDQ = 2.5 V | PVIN = 1.8 V |
VDDQ = 2.5 V | PVIN = 3.3 V |
VDDQ = 1.8 V | PVIN = 1.8 V |
VDDQ = 1.8 V | PVIN = 3.3 V |
The LP2996-N and LP2996A devices can be used to provide a termination voltage for additional logic schemes such as SSTL-3 or HSTL.
Series Stub Termination Logic (SSTL) was created to improve signal integrity of the data transmission across the memory bus. This termination scheme is essential to prevent data error from signal reflections while transmitting at high frequencies encountered with DDR-SDRAM. The most common form of termination is Class II single parallel termination. This involves one RS series resistor from the chipset to the memory and one RT termination resistor. Typical values for RS and RT are 25 Ω, although these can be changed to scale the current requirements from the LP2996-N or LP2996A. This implementation is shown in Figure 17.
The LP2996-N and LP2996A are linear bus termination regulators designed to meet the JEDEC requirements of SSTL-2. The output (VTT) is capable of sinking and sourcing current while regulating the output voltage equal to VDDQ / 2. The output stage is designed to maintain excellent load regulation while preventing shoot through. The LP2996-N and LP2996A also incorporate two distinct power rails that separates the analog circuitry from the power output stage. This allows a split rail approach to be used to decrease internal power dissipation. It also permits the LP2996-N to provide a termination solution for DDR2-SDRAM, while the LP2996A supports DDR3-SDRAM and DDR3L-SDRAM memory. TI recommends the LP2998 and LP2998-Q1 for all DDR applications that require operation at below-zero temperatures.
During start up when VDDQ is enabled, the error amplifier senses the output voltage is low and drives the pass element hard causing a large inrush current. If this inrush current is too large, the device shuts down and restarts due to the internal current limit. Two solutions to prevent large inrush current during start up:
See Limiting DDR Termination Regulators’ Inrush Current (SNVA758) for more information relating to the inrush current during start up.
The device contains a high-speed operational amplifier to provide excellent response to load transients. The output stage prevents shoot through while delivering 1.5-A continuous current and transient peaks up to 3 A in the application as required for DDR-SDRAM termination. The LP2996-N and LP2996A also incorporate a VSENSE pin to provide superior load regulation and a VREF output as a reference for the chipset and DIMMs. See Electrical Characteristics and Application Information.
The LP2996-N and LP2996A feature an active-low shutdown (SD) pin that provides Suspend To RAM (STR) functionality. When SD is pulled low, the VTT output tri-states providing a high impedance output, but VREF remains active. A power savings advantage can be obtained in this mode through lower quiescent current. During shutdown, VTT must not be exposed to voltages that exceed AVIN. With the shutdown pin asserted low the quiescent current of the LP2996-N and LP2996A drops, however, VDDQ always maintains its constant impedance of 100 kΩ for generating the internal reference. Therefore, to calculate the total power loss in shutdown, both currents must be considered. The shutdown pin also has an internal pullup current, therefore to turn the part on, the shutdown pin can either be connected to AVIN or left open.
NOTE
Information in the following applications sections is not part of the TI component specification, and TI does not warrant its accuracy or completeness. TI’s customers are responsible for determining suitability of components for their purposes. Customers should validate and test their design implementation to confirm system functionality.
The LP2996 has split rails to allow flexibility in powering the device. It has a control circuitry rail (AVIN) and an output power stage rail (PVIN), both separate from the reference voltage input (VDDQ). This allows for different setups which cater to specific requirements such as high current capabilities, lower thermal dissipation, or minimum component count. Because the output is always VDDQ / 2 due to two internal 50-kΩ resistors, the only necessary external components are bypass capacitors.
This circuit permits termination in a minimum amount of board space and component count. Capacitor selection can be varied depending on the number of lines terminated and the maximum load transient. However, with motherboards and other applications where VTT is distributed across a long plane, it is advisable to use multiple bulk capacitors and addition to high frequency decoupling.
For this design example, use the parameters listed in Table 1 as the input parameters.
PARAMETER | VALUE |
---|---|
VDDQ | 1.5 V |
Input to AVIN and PVIN, VDD | 2.5 V |
VREF | 0.75 V |
VTT | 0.75 V |
Input bypass capacitor, CIN | 47 µF |
Output bypass capacitor, COUT | 220 µF |
The LP2996 requires voltage be applied to three pins for proper operation: VDDQ, AVIN, and PVIN. VDDQ sets the internal reference voltage and is divided across two 50-kΩ resistors. Therefore, VDDQ must be set at exactly twice the appropriate DDR termination. AVIN powers the internal control circuitry and must be from 2.2 V to
5.5 V. PVIN is the supply for the power output stage and must be larger than or equal to VDDQ while smaller than or equal to AVIN. When picking PVIN, note that smaller values reduce internal power dissipation but reduce the maximum continuous current as well. It is acceptable to tie PVIN to either VDDQ or AVIN to minimize the number of supplies and bypass capacitors required.
To prevent voltage dips on the output, a bypass capacitor must be placed on the VTT line. The size of this capacitor does not affect stability, but larger values improve the transient response and must be sized according to the design requirements. When using ceramic capacitors on the output, large load steps can cause ringing on VTT. Table 2 shows the range of acceptable equivalent series resistance (ESR) that can be added to dampen and improve the response.
VTT CAPACITANCE (µF) | RECOMMENDED ESR (mΩ) |
---|---|
100 | 50 |
150 | 42 |
220 | 36 |
330 | 30 |
Another bypass capacitor on PVIN is recommended to keep current spikes from pulling down the input voltage. This is especially important if PVIN and VDDQ are on the same supply. A small 0.01-µF capacitor can be placed on VREF to reduce noise. VSENSE provides a feedback path necessary for regulating the output voltage; Therefore, it must be connected to VTT. If a long VSENSE trace is necessary, a small ceramic capacitor may be required to filter out any high frequency noise picked up from switching I/O signals.
The LP2996-N and LP2996A do not require a capacitor for input stability, but it is recommended for improved performance during large load transients to prevent the input rail from dropping. The input capacitor must be placed as close as possible to the PVIN pin. Several recommendations exist dependent on the application required. A typical value recommended for aluminum electrolytic capacitors is 50 µF. Ceramic capacitors can also be used, a value approximately 10 µF with X5R or better would be an ideal choice. The input capacitance can be reduced if the LP2996-N or LP2996A is placed close to the bulk capacitance from the output of the 2.5-V DC-DC converter. If the two supply rails (AVIN and PVIN) are separated then the 47-µF capacitor must be placed as close to possible to the PVIN rail. An additional 0.1-µF ceramic capacitor can be placed on the AVIN rail to prevent excessive noise from coupling into the device.
The LP2996-N and LP2996A have been designed to be insensitive of output capacitor size or ESR. This allows the flexibility to use any capacitor desired. The choice for output capacitor is determined solely on the application and the requirements for load transient response of VTT. TI recommends the output capacitor be sized above
100 µF with a low ESR for SSTL applications with DDR-SDRAM. The value of ESR is determined by the maximum current spikes expected and the extent at which the output voltage is allowed to droop. Several capacitor options are available on the market and a few of these are discussed: Aluminum Electrolytics, Ceramic Capacitors, and Hybrid Capacitors.
Aluminum electrolytics often only specify impedance at a frequency of 120 Hz, indicating poor high frequency performance. Only aluminum electrolytics that specified an impedance at higher frequencies, from 20 kHz to
100 kHz, must be used for the LP2996-N and LP2996A. To improve the ESR, many aluminum electrolytics may be combined in parallel for an overall reduction. Be aware of the extent at which the ESR changes over temperature. Aluminum electrolytic capacitors' ESR may rapidly increase at cold temperatures.
Ceramic capacitors typically have a low capacitance, from 10 µF to 100 µF, but they have excellent AC performance for bypassing noise due to very low ESR (typically less than 10 mΩ). However, some dielectric types do not have good capacitance characteristics as a function of voltage and temperature. Because of the typically low value of capacitance, TI recommends using ceramic capacitors in parallel with another capacitor such as an aluminum electrolytic. TI recommends dielectric of X5R or better for all ceramic capacitors.
Hybrid capacitors offer a large capacitance while maintaining a low ESR. These are the best solution when size and performance are critical, although their cost is typically higher than any other capacitor.
With motherboards and other applications where VTT is distributed across a long plane, it is advisable to use multiple bulk capacitors and addition to high frequency decoupling. Figure 19 shows an example circuit where two bulk output capacitors could be situated at both ends of the VTT plane for optimal placement. Large aluminum electrolytic capacitors are used for their low ESR and low cost.
In most PC applications an extensive amount of decoupling is required because of the long interconnects encountered with the DDR-SDRAM DIMMs mounted on modules. As a result bulk aluminum electrolytic capacitors approximately 1000 µF are typically used.
Several different application circuits are shown to illustrate some of the options that are possible in configuring the LP2996-N or LP2996A.
For the majority of applications that implement the SSTL-2 termination scheme, TI recommends connecting all the input rails to the 2.5-V rail. This provides an optimal trade-off between power dissipation and component count and selection. An example of this circuit can be seen in Figure 22.
If power dissipation or efficiency is a major concern, then the LP2996-N or LP2996A has the ability to operate on split power rails. The output stage (PVIN) can be operated on a lower rail such as 1.8 V and the analog circuitry (AVIN) can be connected to a higher rail such as 2.5 V, 3.3 V, or 5 V. This allows the internal power dissipation to be lowered when sourcing current from VTT. The disadvantage of this circuit is that the maximum continuous current is reduced because of the lower rail voltage, although it is adequate for all motherboard SSTL-2 applications. Increasing the output capacitance can also help if periods of large load transients are encountered.
The third option for SSTL-2 applications in the situation that a 1.8-V rail is not available and it is not desirable to use 2.5 V, is to connect the LP2996-N or LP2996A power rail to 3.3 V. In this situation AVIN is limited to operation on the 3.3-V or 5-V rail as PVIN can never exceed AVIN. This configuration has the ability to provide the maximum continuous output current at the downside of higher thermal dissipation. Prevent the device from experiencing large current levels which cause the junction temperature to exceed the maximum. Because of this risk, TI recommends not supplying the output stage with a voltage higher than a nominal 3.3-V rail.
With the separate VDDQ pin and an internal resistor divider it is possible to use the LP2996-N and LP2996A in applications utilizing DDR-II memory. Figure 25 and Figure 26 show implementations of recommended circuit configurations for DDR-II applications. The output stage is connected to the 1.8-V rail and the AVIN pin can be connected to either a 3.3-V or 5-V rail. TI recommends the LP2996A, LP2998, or LP2998-Q1 for DDR-III and DDR-III low power designs.
If it is not desirable to use the 1.8-V rail it is possible to connect the output stage to a 3.3-V rail. Take care not to exceed the maximum junction temperature as the thermal dissipation increases with lower VTT output voltages. For this reason, TI does not recommend powering PVIN from a rail higher than the nominal 3.3 V. The advantage of this configuration is that it has the ability to source and sink a higher maximum continuous current.
With the separate VDDQ pin and an internal resistor divider it is possible to use the LP2996A in applications utilizing DDR-III memory. The output stage is connected to the 1.5-V rail and the AVIN pin can be connected to a 2.2-V to 5.5-V rail.
If it is not desirable to use the 1.5-V to 2.5-V rail it is possible to connect the output stage to a 3.3-V rail. Do not exceed the maximum junction temperature as the thermal dissipation increases with lower VTT output voltages. For this reason, TI recommends not to power PVIN off a rail higher than the nominal 3.3-V. The advantage of this configuration is that it has the ability to source and sink a higher maximum continuous current.
If standards other than SSTL-2 are required, such as SSTL-3, it may be necessary to use a different scaling factor than VDDQ / 2 for regulating the output voltage. Several options are available to scale the output to any voltage required. One method is to level shift the output by using feedback resistors from VTT to the VSENSE pin. This is shown in Figure 28 and Figure 29. Figure 28 shows how to use two resistors to level shift VTT above the internal reference voltage of VDDQ / 2. Calculate the exact voltage at VTT with Equation 1.
Conversely, the R2 resistor can be placed between VSENSE and VDDQ to shift the VTT output lower than the internal reference voltage of VDDQ / 2. Equation 2 shows the relation of VTT to the resistors.
The LP2996-N and LP2996A can be easily adapted for HSTL applications by connecting VDDQ to the 1.5-V rail. This produces a VTT and VREF voltage of approximately 0.75 V for the termination resistors. AVIN and PVIN must be connected to a 2.5-V rail for optimal performance.
Quad data rate (QDR) applications use multiple channels for improved memory performance. However, this increase in bus lines increases the current levels required for termination. TI recommends using a dedicated LP2996-N or LP2996A for each channel to terminate multiple channels. This simplifies layout and reduces the internal power dissipation for each regulator. Separate VREF signals can be used for each DIMM bank from the corresponding regulator with the chipset reference provided by a local resistor divider or one of the LP2996-N or LP2996A signals. Because VREF and VTT are expected to track and the part to part variations are minor, there must be little difference between the reference signals of each device.