1 Features

AEC-Q100 Qualified with the Following Results:
- Device Temperature Grade 1: –40°C to +125°C Ambient Operating Temperature
- Device HBM ESD Classification Level 2
- Device CDM ESD Classification Level C4B
Functional Safety-Compliant
- Developed for Functional Safety Applications
- Documentation Available to Aid ISO 26262 System Design up to ASIL D
- Systematic Capability and Hardware Integrity up to ASIL D
Input Voltage Range
- 7 to 36-V for Initial Battery Power Up
- 4 to 36-V Full Functionality After Initial Battery Power Up
- Minimum 2.3 V During Operation After Wake-up
Supply Rails (With Internal FETs)
- 6-V Synchronous Buck-Boost Preregulator
- 5-V, 285-mA LDO (CAN, Peripherals or ADC REF 1% Accuracy with 20 to 120 mA Load)
- 3.3-V or 5-V, 350-mA LDO (MCU) TPS653853A-Q1. 3.3-V 350-mA or 5-V 500 mA LDO (MCU) TPS653854A-Q1
- 2 LDOs Protected for Sensor Supply or Peripherals
  - 120 mA for Sensor Supply 1 (VSOUT1), 20 mA for Sensor Supply 2 (VSOUT2)
  - Configurable Tracking Mode (Tracking Input Pin), or 3.3-V or 5-V Fixed Output Voltage
  - Short-to-Ground and Battery Protection
- Charge Pump: 6-V Minimum, 11-V Maximum Above Battery Voltage
Monitoring and Protection
- Independent Undervoltage and Overvoltage Monitoring on All Regulator Outputs, Battery Voltage, and Internal Supplies
- Voltage Monitoring Circuitry, Including Independent Bandgap Reference, Supplied from Separate Battery Voltage Input Pin
- Self-Check on All Voltage Monitoring (During Power-Up and After Power-Up Initiated by External MCU)
- All Supplies Protected with Current Limit and Overtemperature Prewarning and Shutdown
Steering-Angle Monitoring (SAM)
- 2 Signal Comparators for Position Sensor Signals
- Rotation Counter
- Low-Power Mode With Periodically Sampling of Position Sensor Signals
- Switches for Passing-Through Sensor Signals to MCU
Microcontroller Interface
- Open and Close Window or Question-Answer Watchdog Function
- Monitor for Functional Safety MCU Fault output (PWM or level), MCU Error-Signal Monitor
- DIAGNOSTIC state for Performing Device Self-Tests and System Diagnostics
- SAFE State for Device and System Protection upon Detected System Failure
- Clock Monitor for Internal Oscillator
- Analog and Logic Built-In Self-Test
- CRC on Non-Volatile Memory as well as Device and System Configuration Registers and SPI Communications
- Reset Circuit for MCU
- Diagnostic Output Pin
SPI With CRC on Command Plus Data
Error Reporting Through SPI Registers for Errors on System Level and Device Level
Enable-Drive Output for Disabling External Power-Stages on Any Detected System Failure
Wake-up through IGN Pin (Ignition) or CAN_WU Pin (Transceiver or Other Function)
48-Pin HTSSOP PowerPAD™ IC Package