TPS7H3302-SP and TPS7H3302-SEP 3-A DDR Radiation Hardened Termination Regulator

1 Features

QMLP TPS7H3302-SP standard microcircuit drawing (SMD) available, 5962R14228
Space Ehanced Plastic Vendor item drawing available, VID V62/22615
Total ionizing dose (TID) charactericized
- Radiation hardness assured (RHA) qualified up to total ionizing dose (TID) 100 krad(Si) or 50 krad(Si)
Single-Event Effects (SEE) Charactericized
- Single event latch-up (SEL), single event gate rupture (SEGR), single event burnout (SEB) immune up to LET = 70 MeV-cm² /mg
- Single event transient (SET), single event functional interrupt (SEFI), and single event upset (SEU) characterized up to 70 MeVcm² /mg
Supports DDR, DDR2, DDR3, DDR3L, and DDR4 termination applications
Input voltage: supports a 2.5-V and 3.3-V rail
Separate low-voltage input (VLDOIN) down to
0.9 V for improved power efficiency
3-A sink and source termination regulator
Enable input and power-good output for power supply sequencing
VTT termination regulator
- Output voltage range: 0.5 to 1.75 V
- 3-A sink and source current
Integrated precision voltage divider network with sense input
Remote sensing (VTTSNS)
VTTREF buffered reference
- 49% to 51% accuracy with respect to VDDQSNS (±3 mA)
- ±10 mA sink and source current
Undervoltage lockout (UVLO) and overcurrent limit (OCL) functionality integrated
Plastic package