Component qualification in accordance with JEDEC and industry standards to ensure reliable operation over an extended temperature range. This includes, but is not limited to, Highly Accelerated Stress Test (HAST) or biased 85/85, temperature cycle, autoclave or unbiased HAST, electromigration, bond intermetallic life, and mold compound life. Such qualification testing should not be viewed as justifying use of this component beyond specified performance and environmental limits.
The SN74ACT08 is a quadruple 2-input positive-AND gate. This device performs the Boolean functions Y = A • B or Y = A\ + B\ in positive logic.
| Type | Title | Date | ||
|---|---|---|---|---|
| * | Data sheet | SN74ACT08-EP datasheet | 28 Sep 2004 | |
| * | VID | SN74ACT08-EP VID V6204759 | 21 Jun 2016 | |
| Application note | Implications of Slow or Floating CMOS Inputs (Rev. E) | 26 Jul 2021 | ||
| Selection guide | Logic Guide (Rev. AB) | 12 Jun 2017 | ||
| Application note | Understanding and Interpreting Standard-Logic Data Sheets (Rev. C) | 02 Dec 2015 | ||
| User guide | LOGIC Pocket Data Book (Rev. B) | 16 Jan 2007 | ||
| Application note | Semiconductor Packing Material Electrostatic Discharge (ESD) Protection | 08 Jul 2004 | ||
| Application note | Selecting the Right Level Translation Solution (Rev. A) | 22 Jun 2004 | ||
| Application note | TI IBIS File Creation, Validation, and Distribution Processes | 29 Aug 2002 | ||
| Application note | CMOS Power Consumption and CPD Calculation (Rev. B) | 01 Jun 1997 | ||
| Application note | Designing With Logic (Rev. C) | 01 Jun 1997 | ||
| Application note | Using High Speed CMOS and Advanced CMOS in Systems With Multiple Vcc | 01 Apr 1996 |
For additional terms or required resources, click any title below to view the detail page where available.
| Package | Pins | CAD symbols, footprints & 3D models |
|---|---|---|
| SOIC (D) | 14 | Ultra Librarian |
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