The 'BCT8374A scan test devices with octal edge-triggered D-type
flip-flops are members of the Texas Instruments SCOPETM
testability integrated-circuit family. This family of devices
supports IEEE Standard 1149.1-1990 boundary scan to facilitate
testing of complex circuit-board assemblies. Scan access to the test
circuitry is accomplished via the 4-wire test access port (TAP)
interface.
In the normal mode, these devices are functionally equivalent to
the 'F374 and 'BCT374 octal D-type flip-flops. The test circuitry can
be activated by the TAP to take snapshot samples of the data
appearing at the device terminals or to perform a self test on the
boundary-test cells. Activating the TAP in normal mode does not
affect the functional operation of the SCOPETM octal
flip-flops.
In the test mode, the normal operation of the SCOPETM
octal flip-flops is inhibited and the test circuitry is enabled to
observe and control the I/O boundary of the device. When enabled, the
test circuitry can perform boundary-scan test operations as described
in IEEE Standard 1149.1-1990.
Four dedicated test terminals control the operation of the test
circuitry: test data input (TDI), test data output (TDO), test mode
select (TMS), and test clock (TCK). Additionally, the test circuitry
performs other testing functions such as parallel-signature analysis
(PSA) on data inputs and pseudo-random pattern generation (PRPG) from
data outputs. All testing and scan operations are synchronized to the
TAP interface.
The SN54BCT8374A is characterized for operation over the full
military temperature range of -55°C to 125°C. The
SN74BCT8374A is characterized for operation from 0°C to
70°C.
The 'BCT8374A scan test devices with octal edge-triggered D-type
flip-flops are members of the Texas Instruments SCOPETM
testability integrated-circuit family. This family of devices
supports IEEE Standard 1149.1-1990 boundary scan to facilitate
testing of complex circuit-board assemblies. Scan access to the test
circuitry is accomplished via the 4-wire test access port (TAP)
interface.
In the normal mode, these devices are functionally equivalent to
the 'F374 and 'BCT374 octal D-type flip-flops. The test circuitry can
be activated by the TAP to take snapshot samples of the data
appearing at the device terminals or to perform a self test on the
boundary-test cells. Activating the TAP in normal mode does not
affect the functional operation of the SCOPETM octal
flip-flops.
In the test mode, the normal operation of the SCOPETM
octal flip-flops is inhibited and the test circuitry is enabled to
observe and control the I/O boundary of the device. When enabled, the
test circuitry can perform boundary-scan test operations as described
in IEEE Standard 1149.1-1990.
Four dedicated test terminals control the operation of the test
circuitry: test data input (TDI), test data output (TDO), test mode
select (TMS), and test clock (TCK). Additionally, the test circuitry
performs other testing functions such as parallel-signature analysis
(PSA) on data inputs and pseudo-random pattern generation (PRPG) from
data outputs. All testing and scan operations are synchronized to the
TAP interface.
The SN54BCT8374A is characterized for operation over the full
military temperature range of -55°C to 125°C. The
SN74BCT8374A is characterized for operation from 0°C to
70°C.