- Controlled Baseline
- One Assembly/Test Site, One Fabrication Site
- Extended Temperature Performance of –40°C to 125°C
- Enhanced Diminishing Manufacturing Sources (DMS) Support
- Enhanced Product-Change Notification
- Qualification Pedigree
- Low Supply Current . . . 560 nA
- Input Common-Mode Range Exceeds the Rails . . . –0.1 V to VCC + 5 V
- Supply Voltage Range . . . 2.7 V to 16 V
- Reverse Battery Protection Up to 18 V
- Push-Pull CMOS Output Stage
- Ultrasmall Packaging
- Universal Op-Amp EVM (Reference SLOU060 for more information)
- APPLICATIONS
- Portable Battery Monitoring
- Security Detection Systems
Component qualification in accordance with JEDEC and industry standards to ensure reliable operation over an extended temperature range. This includes, but is not limited to, Highly Accelerated Stress Test (HAST) or biased 85/85, temperature cycle, autoclave or unbiased HAST, electromigration, bond intermetallic life, and mold compound life. Such qualification testing should not be viewed as justifying use of this component beyond specified performance and environmental limits.