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SN65LVDS33-EP

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データシート

SN65LVDS33-EP

アクティブ
データシート ご注文はこちら

製品詳細

Function Receiver Protocols LVDS Number of transmitters 0 Number of receivers 4 Supply voltage (V) 3.3 Signaling rate (Mbps) 400 Input signal CMOS, ECL, LVCMOS, LVDS, LVECL, LVPECL, PECL Output signal LVTTL Rating HiRel Enhanced Product Operating temperature range (°C) -55 to 125
Function Receiver Protocols LVDS Number of transmitters 0 Number of receivers 4 Supply voltage (V) 3.3 Signaling rate (Mbps) 400 Input signal CMOS, ECL, LVCMOS, LVDS, LVECL, LVPECL, PECL Output signal LVTTL Rating HiRel Enhanced Product Operating temperature range (°C) -55 to 125
SOIC (D) 16 59.4 mm² 9.9 x 6
  • Controlled Baseline — One Assembly/Test Site, One Fabrication Site
  • Extended Temperature Performance of Up to -55°C to 125°C
  • Enhanced Diminishing Manufacturing Sources (DMS) Support
  • Enhanced Product-Change Notification
  • Qualification Pedigree(1)
  • 400-Mbps Signaling Rate(2) and 200-Mxfr/s Data Transfer Rate
  • Operates With a Single 3.3-V Supply
  • -4-V to 5-V Common-Mode Input Voltage Range
  • Differential Input Thresholds < ±50 mV With 50 mV of Hysteresis Over Entire Common-Mode Input Voltage Range
  • Integrated 110- Line Termination Resistors On LVDT Products
  • Complies With TIA/EIA-644 (LVDS)
  • Active Failsafe Assures a High-Level Output With No Input
  • Bus-Pin ESD Protection Exceeds 15-kV HBM
  • Input Remains High-Impedance On Power Down
  • TTL Inputs Are 5-V Tolerant
  • Pin-Compatible With the AM26LS32, SN65LVDS32B, µA9637, SN65LVDS9637B

(1) Component qualification in accordance with JEDEC and industry standards to ensure reliable operation over an extended temperature range. This includes, but is not limited to, Highly Accelerated Stress Test (HAST) or biased 85/85, temperature cycle, autoclave or unbiased HAST, electromigration, bond intermetallic life, and mold compound life. Such qualification testing should not be viewed as justifying use of this component beyond specified performance and environmental limits.
(2) The signaling rate of a line is the number of voltage transitions that are made per second expressed in the units bps (bits per second).
  • Controlled Baseline — One Assembly/Test Site, One Fabrication Site
  • Extended Temperature Performance of Up to -55°C to 125°C
  • Enhanced Diminishing Manufacturing Sources (DMS) Support
  • Enhanced Product-Change Notification
  • Qualification Pedigree(1)
  • 400-Mbps Signaling Rate(2) and 200-Mxfr/s Data Transfer Rate
  • Operates With a Single 3.3-V Supply
  • -4-V to 5-V Common-Mode Input Voltage Range
  • Differential Input Thresholds < ±50 mV With 50 mV of Hysteresis Over Entire Common-Mode Input Voltage Range
  • Integrated 110- Line Termination Resistors On LVDT Products
  • Complies With TIA/EIA-644 (LVDS)
  • Active Failsafe Assures a High-Level Output With No Input
  • Bus-Pin ESD Protection Exceeds 15-kV HBM
  • Input Remains High-Impedance On Power Down
  • TTL Inputs Are 5-V Tolerant
  • Pin-Compatible With the AM26LS32, SN65LVDS32B, µA9637, SN65LVDS9637B

(1) Component qualification in accordance with JEDEC and industry standards to ensure reliable operation over an extended temperature range. This includes, but is not limited to, Highly Accelerated Stress Test (HAST) or biased 85/85, temperature cycle, autoclave or unbiased HAST, electromigration, bond intermetallic life, and mold compound life. Such qualification testing should not be viewed as justifying use of this component beyond specified performance and environmental limits.
(2) The signaling rate of a line is the number of voltage transitions that are made per second expressed in the units bps (bits per second).

This family of four LVDS data line receivers offers the widest common-mode input voltage range in the industry. These receivers provide an input voltage range specification compatible with a 5-V PECL signal as well as an overall increased ground-noise tolerance. They are in industry standard footprints with integrated termination as an option.

Precise control of the differential input voltage thresholds allows for inclusion of 50 mV of input voltage hysteresis to improve noise rejection on slowly changing input signals. The input thresholds are still no more than +50 mV over the full input common-mode voltage range.

The high-speed switching of LVDS signals usually necessitates the use of a line impedance matching resistor at the receiving-end of the cable or transmission media. The SN65LVDT series of receivers eliminates this external resistor by integrating it with the receiver. The nonterminated SN65LVDS series is also available for multidrop or other termination circuits.

The receivers can withstand ±15-kV human-body model (HBM) and ±600-V machine model (MM) electrostatic discharges to the receiver input pins with respect to ground without damage. This provides reliability in cabled and other connections where potentially damaging noise is always a threat.

The receivers also include a (patent pending) failsafe circuit that provides a high-level output within 600 ns after loss of the input signal. The most common causes of signal loss are disconnected cables, shorted lines, or powered-down transmitters. The failsafe circuit prevents noise from being received as valid data under these fault conditions. This feature may also be used for Wired-Or bus signaling. See The Active Failsafe Feature of the SN65LVDS32B application note.

The intended application and signaling technique of these devices is point-to-point baseband data transmission over controlled impedance media of approximately 100 . The transmission media may be printed-circuit board traces, backplanes, or cables. The ultimate rate and distance of data transfer is dependent upon the attenuation characteristics of the media and the noise coupling to the environment.

The SN65LVDS33-EP is characterized for operation from -55°C to 125°C.

This family of four LVDS data line receivers offers the widest common-mode input voltage range in the industry. These receivers provide an input voltage range specification compatible with a 5-V PECL signal as well as an overall increased ground-noise tolerance. They are in industry standard footprints with integrated termination as an option.

Precise control of the differential input voltage thresholds allows for inclusion of 50 mV of input voltage hysteresis to improve noise rejection on slowly changing input signals. The input thresholds are still no more than +50 mV over the full input common-mode voltage range.

The high-speed switching of LVDS signals usually necessitates the use of a line impedance matching resistor at the receiving-end of the cable or transmission media. The SN65LVDT series of receivers eliminates this external resistor by integrating it with the receiver. The nonterminated SN65LVDS series is also available for multidrop or other termination circuits.

The receivers can withstand ±15-kV human-body model (HBM) and ±600-V machine model (MM) electrostatic discharges to the receiver input pins with respect to ground without damage. This provides reliability in cabled and other connections where potentially damaging noise is always a threat.

The receivers also include a (patent pending) failsafe circuit that provides a high-level output within 600 ns after loss of the input signal. The most common causes of signal loss are disconnected cables, shorted lines, or powered-down transmitters. The failsafe circuit prevents noise from being received as valid data under these fault conditions. This feature may also be used for Wired-Or bus signaling. See The Active Failsafe Feature of the SN65LVDS32B application note.

The intended application and signaling technique of these devices is point-to-point baseband data transmission over controlled impedance media of approximately 100 . The transmission media may be printed-circuit board traces, backplanes, or cables. The ultimate rate and distance of data transfer is dependent upon the attenuation characteristics of the media and the noise coupling to the environment.

The SN65LVDS33-EP is characterized for operation from -55°C to 125°C.
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技術資料

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種類 タイトル 最新の英語版をダウンロード 日付
* データシート SN65LVDS33-EP High-Speed Differential Receivers データシート (Rev. B) 2007年 4月 19日
* VID SN65LVDS33-EP VID V6205614 2016年 6月 21日
* 放射線と信頼性レポート SN65LVDS33MDREP Reliability Report 2013年 9月 6日
アプリケーション概要 LVDS to Improve EMC in Motor Drives 2018年 9月 27日
アプリケーション概要 How Far, How Fast Can You Operate LVDS Drivers and Receivers? 2018年 8月 3日
アプリケーション概要 How to Terminate LVDS Connections with DC and AC Coupling 2018年 5月 16日

設計および開発

その他のアイテムや必要なリソースを参照するには、以下のタイトルをクリックして詳細ページをご覧ください。

評価ボード

SN65LVDS31-33EVM — 評価モジュール、SN65LVDS31/SN65LVDS33 用

TI offers a series of low-voltage differential signaling (LVDS) evaluation modules (EVMs) designed for analysis of the electrical characteristics of LVDS drivers and receivers. Four unique EVMs are available to evaluate the different classes of LVDS devices offered by TI.

As seen in the Combination (...)

ユーザー ガイド: PDF
TI.com で取り扱いなし
シミュレーション・モデル

SN65LVDS33 IBIS Model (Rev. A)

SLLC069A.ZIP (6 KB) - IBIS Model
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シミュレーション・ツール

PSPICE-FOR-TI — TI Design / シミュレーション・ツール向け PSpice®

PSpice® for TI は、各種アナログ回路の機能評価に役立つ、設計とシミュレーション向けの環境です。設計とシミュレーションに適したこのフル機能スイートは、Cadence® のアナログ分析エンジンを使用しています。PSpice for TI は無償で使用でき、アナログや電源に関する TI の製品ラインアップを対象とする、業界でも有数の大規模なモデル・ライブラリが付属しているほか、選択された一部のアナログ動作モデルも利用できます。

設計とシミュレーション向けの環境である PSpice for TI (...)
リクエスト
シミュレーション・ツール

TINA-TI — SPICE ベースのアナログ・シミュレーション・プログラム

TINA-TI は、DC 解析、過渡解析、周波数ドメイン解析など、SPICE の標準的な機能すべてを搭載しています。TINA には多彩な後処理機能があり、結果を必要なフォーマットにすることができます。仮想計測機能を使用すると、入力波形を選択し、回路ノードの電圧や波形を仮想的に測定することができます。TINA の回路キャプチャ機能は非常に直観的であり、「クイックスタート」を実現できます。

TINA-TI をインストールするには、約 500MB が必要です。インストールは簡単です。必要に応じてアンインストールも可能です。(そのようなことはないと思いますが)

TINA は DesignSoft (...)

ユーザー ガイド: PDF
英語版 (Rev.A): PDF
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パッケージ ピン数 CAD シンボル、フットプリント、および 3D モデル
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購入と品質

記載されている情報：
  • RoHS
  • REACH
  • デバイスのマーキング
  • リード端子の仕上げ / ボールの原材料
  • MSL 定格 / ピーク リフロー
  • MTBF/FIT 推定値
  • 使用原材料
  • 認定試験結果
  • 継続的な信頼性モニタ試験結果
記載されている情報：
  • ファブの拠点
  • 組み立てを実施した拠点

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