SN74F373
- Eight Latches in a Single Package
- 3-State Bus-Driving True Outputs
- Full Parallel Access for Loading
- Buffered Control Inputs
- Package Options Include Plastic Small-Outline (SOIC) and Shrink Small-Outline (SSOP) Packages, Ceramic Chip Carriers, and Plastic and Ceramic DIPs
These 8-bit latches feature 3-state outputs designed specifically for driving highly capacitive or relatively low-impedance loads. They are particularly suitable for implementing buffer registers, I/O ports, bidirectional bus drivers, and working registers.
The eight latches of the ´F373 are transparent D-type latches. While the latch-enable (LE) input is high, the Q outputs will follow the data (D) inputs. When the latch enable is taken low, the Q outputs are latched at the logic levels set up at the D inputs.
A buffered output-enable () input can be used to place the eight outputs in either
a normal
logic state (high or low logic levels) or a high-impedance state. In
the high-impedance state, the outputs neither load nor drive the bus
lines significantly. The high-impedance state and increased drive
provide the capability to drive bus lines without need for interface
or pullup components.
The output-enable () input does not affect the internal operations of the latches. Old data can be retained or new data can be entered while the outputs are in the high-impedance state.
The SN74F373 is available in TI's shrink small-outline package (DB), which provides the same I/O pin count and functionality of standard small-outline packages in less than half the printed-circuit-board area.
The SN54F373 is characterized for operation over the full military temperature range of -55°C to 125°C. The SN74F373 is characterized for operation from 0°C to 70°C.
技術資料
種類 | タイトル | 最新の英語版をダウンロード | 日付 | |||
---|---|---|---|---|---|---|
* | データシート | Octal Transparent D-Type Latches With 3-State Outputs データシート (Rev. A) | 1993年 10月 1日 |
購入と品質
- RoHS
- REACH
- デバイスのマーキング
- リード端子の仕上げ / ボールの原材料
- MSL 定格 / ピーク リフロー
- MTBF/FIT 推定値
- 使用原材料
- 認定試験結果
- 継続的な信頼性モニタ試験結果
- ファブの拠点
- 組み立てを実施した拠点