TMS570LC4357-SEP

활성

Arm® Cortex® -R 코어 기반의 우주 항공 강화 제품 Hercules™ 마이크로컨트롤러

TMS570LC4357-SEP

활성

제품 상세 정보

Operating temperature range (°C) to Rating Space
Operating temperature range (°C) to Rating Space
  • VID - V62/18621
  • Radiation Hardened
    • Single Event Latch-up (SEL) Immune to 43MeV-cm2/mg at 125°C
    • Total Ionizing Dose (TID) RLAT for Every Wafer Lot up to 30krad (Si)
  • Space Enhanced Plastic
    • Controlled Baseline
    • Gold Au wire
    • One Assembly/Test Site
    • One Fabrication Site
    • Available in Extended (–55°C to 125°C) Temperature Range
    • Extended Product Life Cycle
    • Extended Product-Change Notification
    • Product Traceability
    • Enhanced Mold Compound for Low Outgassing
  • High-Performance Automotive-Grade Microcontroller for Safety-Critical Applications
    • Dual-Core Lockstep CPUs With ECC-Protected Caches
    • ECC on Flash and RAM Interfaces
    • Built-In Self-Test (BIST) for CPU, High-End Timers, and On-Chip RAMs
    • Error Signaling Module (ESM) With Error Pin
    • Voltage and Clock Monitoring
  • Arm Cortex-R5F 32-Bit RISC CPU
    • 1.66 DMIPS/MHz With 8-Stage Pipeline
    • FPU With Single- and Double-Precision
    • 16-Region Memory Protection Unit (MPU)
    • 32KB of Instruction and 32KB of Data Caches With ECC
    • Open Architecture With Third-Party Support
  • Operating Conditions
    • Up to 300-MHz CPU Clock
    • Core Supply Voltage (VCC): 1.14 to 1.32V
    • I/O Supply Voltage (VCCIO): 3.0 to 3.6V
  • Integrated Memory
    • 4MB of Program Flash With ECC
    • 512KB of RAM With ECC
    • 128KB of Data Flash for Emulated EEPROM With ECC
  • 16-Bit External Memory Interface (EMIF)
  • Hercules™ Common Platform Architecture
    • Consistent Memory Map Across Family
    • Real-Time Interrupt (RTI) Timer (OS Timer)
    • Two 128-Channel Vectored Interrupt Modules (VIMs) With ECC Protection on Vector Table
      • VIM1 and VIM2 in Safety Lockstep Mode
    • Two 2-Channel Cyclic Redundancy Checker (CRC) Modules
  • Direct Memory Access (DMA) Controller
    • 32 Channels and 48 Peripheral Requests
    • ECC Protection for Control Packet RAM
    • DMA Accesses Protected by Dedicated MPU
  • Frequency-Modulated Phase-Locked Loop (FMPLL) With Built-In Slip Detector
  • Separate Nonmodulating PLL
  • IEEE 1149.1 JTAG, Boundary Scan, and Arm CoreSight™ Components
  • Advanced JTAG Security Module (AJSM) 
  • Trace and Calibration Capabilities
    • ETM™, RTP, DMM, POM
  • Multiple Communication Interfaces
    • 10/100Mbps Ethernet MAC (EMAC)
      • IEEE 802.3 Compliant (3.3V I/O Only)
      • Supports MII, RMII, and MDIO
    • FlexRay Controller With 2 Channels
      • 8KB of Message RAM With ECC Protection
      • Dedicated FlexRay Transfer Unit (FTU)
    • Four CAN Controller (DCAN) Modules
      • 64 Mailboxes, Each With ECC Protection
      • Compliant to CAN Protocol Version 2.0B
    • Two Inter-Integrated Circuit (I2C) Modules
    • Five Multibuffered Serial Peripheral Interface (MibSPI) Modules
      • MibSPI1: 256 Words With ECC Protection
      • Other MibSPIs: 128 Words With ECC Protection
    • Four UART (SCI) Interfaces, Two With Local Interconnect Network (LIN 2.1) Interface Support
  • Two Next Generation High-End Timer (N2HET) Modules
    • 32 Programmable Channels Each
    • 256-Word Instruction RAM With Parity
    • Hardware Angle Generator for Each N2HET
    • Dedicated High-End Timer Transfer Unit (HTU) for Each N2HET
  • Two 12-Bit Multibuffered Analog-to-Digital Converter (MibADC) Modules
    • MibADC1: 32 Channels Plus Control for up to 1024 Off-Chip Channels
    • MibADC2: 25 Channels
    • 16 Shared Channels
    • 64 Result Buffers Each With Parity Protection
  • Enhanced Timing Peripherals
    • 7 Enhanced Pulse Width Modulator (ePWM) Modules
    • 6 Enhanced Capture (eCAP) Modules
    • 2 Enhanced Quadrature Encoder Pulse (eQEP) Modules
  • Three On-Die Temperature Sensors
  • Up to 145 Pins Available for General-Purpose I/O (GPIO)
  • 16 Dedicated GPIO Pins With External Interrupt Capability
  • Packages
    • 337-Ball Grid Array (GWT) [Green]
  • VID - V62/18621
  • Radiation Hardened
    • Single Event Latch-up (SEL) Immune to 43MeV-cm2/mg at 125°C
    • Total Ionizing Dose (TID) RLAT for Every Wafer Lot up to 30krad (Si)
  • Space Enhanced Plastic
    • Controlled Baseline
    • Gold Au wire
    • One Assembly/Test Site
    • One Fabrication Site
    • Available in Extended (–55°C to 125°C) Temperature Range
    • Extended Product Life Cycle
    • Extended Product-Change Notification
    • Product Traceability
    • Enhanced Mold Compound for Low Outgassing
  • High-Performance Automotive-Grade Microcontroller for Safety-Critical Applications
    • Dual-Core Lockstep CPUs With ECC-Protected Caches
    • ECC on Flash and RAM Interfaces
    • Built-In Self-Test (BIST) for CPU, High-End Timers, and On-Chip RAMs
    • Error Signaling Module (ESM) With Error Pin
    • Voltage and Clock Monitoring
  • Arm Cortex-R5F 32-Bit RISC CPU
    • 1.66 DMIPS/MHz With 8-Stage Pipeline
    • FPU With Single- and Double-Precision
    • 16-Region Memory Protection Unit (MPU)
    • 32KB of Instruction and 32KB of Data Caches With ECC
    • Open Architecture With Third-Party Support
  • Operating Conditions
    • Up to 300-MHz CPU Clock
    • Core Supply Voltage (VCC): 1.14 to 1.32V
    • I/O Supply Voltage (VCCIO): 3.0 to 3.6V
  • Integrated Memory
    • 4MB of Program Flash With ECC
    • 512KB of RAM With ECC
    • 128KB of Data Flash for Emulated EEPROM With ECC
  • 16-Bit External Memory Interface (EMIF)
  • Hercules™ Common Platform Architecture
    • Consistent Memory Map Across Family
    • Real-Time Interrupt (RTI) Timer (OS Timer)
    • Two 128-Channel Vectored Interrupt Modules (VIMs) With ECC Protection on Vector Table
      • VIM1 and VIM2 in Safety Lockstep Mode
    • Two 2-Channel Cyclic Redundancy Checker (CRC) Modules
  • Direct Memory Access (DMA) Controller
    • 32 Channels and 48 Peripheral Requests
    • ECC Protection for Control Packet RAM
    • DMA Accesses Protected by Dedicated MPU
  • Frequency-Modulated Phase-Locked Loop (FMPLL) With Built-In Slip Detector
  • Separate Nonmodulating PLL
  • IEEE 1149.1 JTAG, Boundary Scan, and Arm CoreSight™ Components
  • Advanced JTAG Security Module (AJSM) 
  • Trace and Calibration Capabilities
    • ETM™, RTP, DMM, POM
  • Multiple Communication Interfaces
    • 10/100Mbps Ethernet MAC (EMAC)
      • IEEE 802.3 Compliant (3.3V I/O Only)
      • Supports MII, RMII, and MDIO
    • FlexRay Controller With 2 Channels
      • 8KB of Message RAM With ECC Protection
      • Dedicated FlexRay Transfer Unit (FTU)
    • Four CAN Controller (DCAN) Modules
      • 64 Mailboxes, Each With ECC Protection
      • Compliant to CAN Protocol Version 2.0B
    • Two Inter-Integrated Circuit (I2C) Modules
    • Five Multibuffered Serial Peripheral Interface (MibSPI) Modules
      • MibSPI1: 256 Words With ECC Protection
      • Other MibSPIs: 128 Words With ECC Protection
    • Four UART (SCI) Interfaces, Two With Local Interconnect Network (LIN 2.1) Interface Support
  • Two Next Generation High-End Timer (N2HET) Modules
    • 32 Programmable Channels Each
    • 256-Word Instruction RAM With Parity
    • Hardware Angle Generator for Each N2HET
    • Dedicated High-End Timer Transfer Unit (HTU) for Each N2HET
  • Two 12-Bit Multibuffered Analog-to-Digital Converter (MibADC) Modules
    • MibADC1: 32 Channels Plus Control for up to 1024 Off-Chip Channels
    • MibADC2: 25 Channels
    • 16 Shared Channels
    • 64 Result Buffers Each With Parity Protection
  • Enhanced Timing Peripherals
    • 7 Enhanced Pulse Width Modulator (ePWM) Modules
    • 6 Enhanced Capture (eCAP) Modules
    • 2 Enhanced Quadrature Encoder Pulse (eQEP) Modules
  • Three On-Die Temperature Sensors
  • Up to 145 Pins Available for General-Purpose I/O (GPIO)
  • 16 Dedicated GPIO Pins With External Interrupt Capability
  • Packages
    • 337-Ball Grid Array (GWT) [Green]

The TMS570LC4357-SEP device is part of the Hercules TMS570 series of high-performance automotive-grade Arm® Cortex®-R-based MCUs. Comprehensive documentation, tools, and software are available to assist in the development of ISO 26262 and IEC 61508 functional safety applications. Start evaluating today with the Hercules TMS570LC43x LaunchPad Development Kit. The TMS570LC4357-SEP device has on-chip diagnostic features including: dual CPUs in lockstep, Built-In Self-Test (BIST) logic for CPU, the N2HET coprocessors, and for on-chip SRAMs; ECC protection on the L1 caches, L2 flash, and SRAM memories. The device also supports ECC or parity protection on peripheral memories and loopback capability on peripheral I/Os.

The TMS570LC4357-SEP device integrates two ARM Cortex-R5F floating-point CPUs, operating in lockstep, which offer an efficient 1.66DMIPS/MHz, and can run up to 300MHz providing up to 498DMIPS. The device supports the big-endian [BE32] format.

The TMS570LC4357-SEP device has 4MB of integrated flash and 512KB of data RAM with single-bit error correction and double-bit error detection. The flash memory on this device is a nonvolatile, electrically erasable and programmable memory, implemented with a 64-bit-wide data bus interface. The flash operates on a 3.3V supply input (the same level as the I/O supply) for all read, program, and erase operations. The SRAM supports read and write accesses in byte, halfword, and word modes.

The TMS570LC4357-SEP device features peripherals for real-time control-based applications, including two Next Generation High-End Timer (N2HET) timing coprocessors with up to 64 total I/O terminals.

The N2HET is an advanced intelligent timer that provides sophisticated timing functions for real-time applications. The timer is software-controlled, with a specialized timer micromachine and an attached I/O port. The N2HET can be used for pulse-width-modulated outputs, capture or compare inputs, or GPIO. The N2HET is designed for applications requiring multiple sensor information or drive actuators with complex and accurate time pulses. The High-End Timer Transfer Unit (HTU) can perform DMA-type transactions to transfer N2HET data to or from main memory. A Memory Protection Unit (MPU) is built into the HTU.

The Enhanced Pulse Width Modulator (ePWM) module can generate complex pulse width waveforms with minimal CPU overhead or intervention. The ePWM is easy to use and supports both high-side and low-side PWM and deadband generation. With integrated trip zone protection and synchronization with the on-chip MibADC, the ePWM is an excellent choice for digital motor control applications.

The Enhanced Capture (eCAP) module is essential in systems where the accurately timed capture of external events is important. The eCAP can also be used to monitor the ePWM outputs or for simple PWM generation when not needed for capture applications.

The Enhanced Quadrature Encoder Pulse (eQEP) module directly interfaces with a linear or rotary incremental encoder to get position, direction, and speed information from a rotating machine as used in high-performance motion and position-control systems.

The device has two 12-bit-resolution MibADCs with 41 total channels and 64 words of parity-protected buffer RAM. The MibADC channels can be converted individually or by group for special conversion sequences. Sixteen channels are shared between the two MibADCs. Each MibADC supports three separate groupings. Each sequence can be converted once when triggered or configured for continuous conversion mode. The MibADC has a 10-bit mode for use when compatibility with older devices or faster conversion time is desired. One of the channels in MibADC1 and two of the channels in MibADC2 can be used to convert temperature measurements from the three on-chip temperature sensors.

The device has multiple communication interfaces: Five MibSPIs; four UART (SCI) interfaces, two with LIN support; four CANs; two I2C modules; one Ethernet Controller; and one FlexRay controller. The SPI provides a convenient method of serial interaction for high-speed communications between similar shift-register type devices. The LIN supports the Local Interconnect standard (LIN 2.1) and can be used as a UART in full-duplex mode using the standard Non-Return-to-Zero (NRZ) format. The DCAN supports the CAN 2.0B protocol standard and uses a serial, multimaster communication protocol that efficiently supports distributed real-time control with robust communication rates of up to 1 Mbps. The DCAN is ideal for applications operating in noisy and harsh environments (for example, automotive and industrial fields) that require reliable serial communication or multiplexed wiring. The FlexRay controller uses a dual-channel serial, fixed time base multimaster communication protocol with communication rates of 10 Mbps per channel. A FlexRay Transfer Unit (FTU) enables autonomous transfers of FlexRay data to and from main CPU memory. HTU transfers are protected by a dedicated, built-in MPU. The Ethernet module supports MII, RMII, and Management Data I/O (MDIO) interfaces. The I2C module is a multimaster communication module providing an interface between the microcontroller and an I2C-compatible device through the I2C serial bus. The I2C module supports speeds of 100 and 400 kbps.

The Frequency-Modulated Phase-Locked Loop (FMPLL) clock module multiplies the external frequency reference to a higher frequency for internal use. The Global Clock Module (GCM) manages the mapping between the available clock sources and the internal device clock domains.

The device also has two External Clock Prescaler (ECP) modules. When enabled, the ECPs output a continuous external clock on the ECLK1 and ECLK2 balls. The ECLK frequency is a user-programmable ratio of the peripheral interface clock (VCLK) frequency. This low-frequency output can be monitored externally as an indicator of the device operating frequency.

The Direct Memory Access (DMA) controller has 32 channels, 48 peripheral requests, and ECC protection on the controller’s memory. An MPU is built into the DMA to protect memory against erroneous transfers.

The Error Signaling Module (ESM) monitors on-chip device errors and determines whether an interrupt or external Error pin/ball (nERROR) is triggered when a fault is detected. The nERROR signal can be monitored externally as an indicator of a fault condition in the microcontroller.

The External Memory Interface (EMIF) provides a memory extension to asynchronous and synchronous memories or other slave devices.

A Parameter Overlay Module (POM) is included to enhance the debugging capabilities of application code. The POM can reroute flash accesses to internal RAM or to the EMIF, thus avoiding the reprogramming steps necessary for parameter updates in flash. This capability is particularly helpful during real-time system calibration cycles.

Several interfaces are implemented to enhance the debugging capabilities of application code. In addition to the built-in Arm® Cortex®-R5F CoreSight debug features, the Embedded Cross Trigger (ECT) supports the interaction and synchronization of multiple triggering events within the SoC. An External Trace Macrocell (ETM) provides instruction and data trace of program execution. For instrumentation purposes, a RAM Trace Port (RTP) module is implemented to support high-speed tracing of RAM and peripheral accesses by the CPU or any other master. A Data Modification Module (DMM) gives the ability to write external data into the device memory. Both the RTP and DMM have no or minimal impact on the program execution time of the application code.

With integrated safety features and a wide choice of communication and control peripherals, the TMS570LC4357-SEP device is designed for high-performance real-time control applications with safety-critical requirements.

The TMS570LC4357-SEP device is part of the Hercules TMS570 series of high-performance automotive-grade Arm® Cortex®-R-based MCUs. Comprehensive documentation, tools, and software are available to assist in the development of ISO 26262 and IEC 61508 functional safety applications. Start evaluating today with the Hercules TMS570LC43x LaunchPad Development Kit. The TMS570LC4357-SEP device has on-chip diagnostic features including: dual CPUs in lockstep, Built-In Self-Test (BIST) logic for CPU, the N2HET coprocessors, and for on-chip SRAMs; ECC protection on the L1 caches, L2 flash, and SRAM memories. The device also supports ECC or parity protection on peripheral memories and loopback capability on peripheral I/Os.

The TMS570LC4357-SEP device integrates two ARM Cortex-R5F floating-point CPUs, operating in lockstep, which offer an efficient 1.66DMIPS/MHz, and can run up to 300MHz providing up to 498DMIPS. The device supports the big-endian [BE32] format.

The TMS570LC4357-SEP device has 4MB of integrated flash and 512KB of data RAM with single-bit error correction and double-bit error detection. The flash memory on this device is a nonvolatile, electrically erasable and programmable memory, implemented with a 64-bit-wide data bus interface. The flash operates on a 3.3V supply input (the same level as the I/O supply) for all read, program, and erase operations. The SRAM supports read and write accesses in byte, halfword, and word modes.

The TMS570LC4357-SEP device features peripherals for real-time control-based applications, including two Next Generation High-End Timer (N2HET) timing coprocessors with up to 64 total I/O terminals.

The N2HET is an advanced intelligent timer that provides sophisticated timing functions for real-time applications. The timer is software-controlled, with a specialized timer micromachine and an attached I/O port. The N2HET can be used for pulse-width-modulated outputs, capture or compare inputs, or GPIO. The N2HET is designed for applications requiring multiple sensor information or drive actuators with complex and accurate time pulses. The High-End Timer Transfer Unit (HTU) can perform DMA-type transactions to transfer N2HET data to or from main memory. A Memory Protection Unit (MPU) is built into the HTU.

The Enhanced Pulse Width Modulator (ePWM) module can generate complex pulse width waveforms with minimal CPU overhead or intervention. The ePWM is easy to use and supports both high-side and low-side PWM and deadband generation. With integrated trip zone protection and synchronization with the on-chip MibADC, the ePWM is an excellent choice for digital motor control applications.

The Enhanced Capture (eCAP) module is essential in systems where the accurately timed capture of external events is important. The eCAP can also be used to monitor the ePWM outputs or for simple PWM generation when not needed for capture applications.

The Enhanced Quadrature Encoder Pulse (eQEP) module directly interfaces with a linear or rotary incremental encoder to get position, direction, and speed information from a rotating machine as used in high-performance motion and position-control systems.

The device has two 12-bit-resolution MibADCs with 41 total channels and 64 words of parity-protected buffer RAM. The MibADC channels can be converted individually or by group for special conversion sequences. Sixteen channels are shared between the two MibADCs. Each MibADC supports three separate groupings. Each sequence can be converted once when triggered or configured for continuous conversion mode. The MibADC has a 10-bit mode for use when compatibility with older devices or faster conversion time is desired. One of the channels in MibADC1 and two of the channels in MibADC2 can be used to convert temperature measurements from the three on-chip temperature sensors.

The device has multiple communication interfaces: Five MibSPIs; four UART (SCI) interfaces, two with LIN support; four CANs; two I2C modules; one Ethernet Controller; and one FlexRay controller. The SPI provides a convenient method of serial interaction for high-speed communications between similar shift-register type devices. The LIN supports the Local Interconnect standard (LIN 2.1) and can be used as a UART in full-duplex mode using the standard Non-Return-to-Zero (NRZ) format. The DCAN supports the CAN 2.0B protocol standard and uses a serial, multimaster communication protocol that efficiently supports distributed real-time control with robust communication rates of up to 1 Mbps. The DCAN is ideal for applications operating in noisy and harsh environments (for example, automotive and industrial fields) that require reliable serial communication or multiplexed wiring. The FlexRay controller uses a dual-channel serial, fixed time base multimaster communication protocol with communication rates of 10 Mbps per channel. A FlexRay Transfer Unit (FTU) enables autonomous transfers of FlexRay data to and from main CPU memory. HTU transfers are protected by a dedicated, built-in MPU. The Ethernet module supports MII, RMII, and Management Data I/O (MDIO) interfaces. The I2C module is a multimaster communication module providing an interface between the microcontroller and an I2C-compatible device through the I2C serial bus. The I2C module supports speeds of 100 and 400 kbps.

The Frequency-Modulated Phase-Locked Loop (FMPLL) clock module multiplies the external frequency reference to a higher frequency for internal use. The Global Clock Module (GCM) manages the mapping between the available clock sources and the internal device clock domains.

The device also has two External Clock Prescaler (ECP) modules. When enabled, the ECPs output a continuous external clock on the ECLK1 and ECLK2 balls. The ECLK frequency is a user-programmable ratio of the peripheral interface clock (VCLK) frequency. This low-frequency output can be monitored externally as an indicator of the device operating frequency.

The Direct Memory Access (DMA) controller has 32 channels, 48 peripheral requests, and ECC protection on the controller’s memory. An MPU is built into the DMA to protect memory against erroneous transfers.

The Error Signaling Module (ESM) monitors on-chip device errors and determines whether an interrupt or external Error pin/ball (nERROR) is triggered when a fault is detected. The nERROR signal can be monitored externally as an indicator of a fault condition in the microcontroller.

The External Memory Interface (EMIF) provides a memory extension to asynchronous and synchronous memories or other slave devices.

A Parameter Overlay Module (POM) is included to enhance the debugging capabilities of application code. The POM can reroute flash accesses to internal RAM or to the EMIF, thus avoiding the reprogramming steps necessary for parameter updates in flash. This capability is particularly helpful during real-time system calibration cycles.

Several interfaces are implemented to enhance the debugging capabilities of application code. In addition to the built-in Arm® Cortex®-R5F CoreSight debug features, the Embedded Cross Trigger (ECT) supports the interaction and synchronization of multiple triggering events within the SoC. An External Trace Macrocell (ETM) provides instruction and data trace of program execution. For instrumentation purposes, a RAM Trace Port (RTP) module is implemented to support high-speed tracing of RAM and peripheral accesses by the CPU or any other master. A Data Modification Module (DMM) gives the ability to write external data into the device memory. Both the RTP and DMM have no or minimal impact on the program execution time of the application code.

With integrated safety features and a wide choice of communication and control peripherals, the TMS570LC4357-SEP device is designed for high-performance real-time control applications with safety-critical requirements.

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* Data sheet TMS570LC4357-SEP Hercules™ Microcontroller Based on the Arm® Cortex®-R Core in Space Enhanced Plastics datasheet (Rev. A) PDF | HTML 2024/03/07
* Errata TMS570LC4357 Microcontroller Silicon Errata (Silicon Revision A) (Rev. D) 2016/05/31
* Radiation & reliability report TMS570LC4357-SEP TID Radiation Report PDF | HTML 2024/03/06
* Radiation & reliability report TMS5704357-SEP Production Flow and Reliability Report PDF | HTML 2024/01/25
* User guide TMS570LC43x 16/32 RISC Flash Microcontroller Technical Reference Manual (Rev. A) 2018/03/01
Certificate TUEV SUED Certification for TMS570LC43x (Rev. A) 2024/06/21
Application note TMS570LC-SEP Single Event Latch-Up (SEL) Radiation Report PDF | HTML 2023/06/07
Functional safety information Certification for Functional Safety Hardware Process (Rev. B) 2022/06/09
More literature Hercules™ Diagnostic Library Test Automation Unit User Guide (Rev. B) PDF | HTML 2020/01/09
More literature HALCoGen-CSP 04.07.01 (Rev. C) PDF | HTML 2020/01/08
Functional safety information HALCoGen-CSP Installation Guide (Rev. B) PDF | HTML 2020/01/08
Functional safety information HALCoGen-CSP User's Guide (Rev. C) PDF | HTML 2020/01/08
Functional safety information Hercules Diagnostic Library -TAU Installation Guide (Rev. B) PDF | HTML 2020/01/08
User guide Hercules Diagnostic Library CSP Without LDRA 2019/10/29
More literature Diagnostic Library CSP Release Notes 2019/10/17
Application note HALCoGen Ethernet Driver With lwIP Integration Demo and Active Webserver Demo PDF | HTML 2019/09/13
Application note Hercules PLL Advisory SSWF021#45 Workaround (Rev. B) PDF | HTML 2019/09/09
Application note CAN Bus Bootloader for Hercules Microcontrollers PDF | HTML 2019/08/21
Application note HALCoGen CSP Without LDRA Release_Notes 2019/08/19
User guide HALCoGen-CSP Without LDRA Installation Guide PDF | HTML 2019/08/19
User guide HALCoGen-CSP Without LDRA User's Guide PDF | HTML 2019/08/19
User guide Hercules Diagnostic Library - Without LDRA Installation Guide PDF | HTML 2019/08/19
User guide Hercules™ Diag Lib Test Automation Unit Without LDRA User's Guide PDF | HTML 2019/08/19
Functional safety information Certification for SafeTI Functional Safety Hardware Process (Rev. A) 2019/06/07
Application note Interfacing the Embedded 12-Bit ADC in a TMS570LS31x/21x and RM4x Series MCUs (Rev. A) 2018/04/20
Application note FreeRTOS on Hercules Devices_new 2018/04/19
Application note MPU and Cache Settings in TMS570LC43x/RM57x Devices 2018/04/19
Application note Sharing FEE Blocks Between the Bootloader and the Application 2017/11/07
Application note Sharing Exception Vectors on Hercules™ Based Microcontrollers 2017/03/27
Application note Hercules AJSM Unlock (Rev. A) PDF | HTML 2016/10/19
Functional safety information Safety Manual for TMS570LC4x Hercules ARM Safety Critical Microcontrollers (Rev. A) 2016/10/19
Application note How to Create a HALCoGen Based Project For CCS (Rev. B) 2016/08/09
Application note Using the CRC Module on Hercules™-Based Microcontrollers 2016/08/04
Application note Using the SPI as an Extra UART Transmitter 2016/07/26
White paper Hercules MCUs for Use in Electrical Vehicle Battery Management system 2016/05/12
Application note High Speed Serial Bus Using the MibSPIP Module on Hercules-Based MCUs 2016/04/22
Application note TMS570LC4357 and RM57L843 On-Chip Temperature Sensor Measurements 2016/01/18
Functional safety information Enabling Functional Safety Using SafeTI Diagnostic Library 2015/12/18
Application note Triggering ADC Using Internal Timer Events on Hercules MCUs 2015/10/19
White paper Extending TI’s Hercules MCUs with the integrated flexible HET 2015/09/29
Application note PWM Generation and Input Capture Using HALCoGen N2HET Module 2015/06/30
Functional safety information Foundational Software for Functional Safety 2015/05/12
Application note Sine Wave Generation Using PWM With Hercules N2HET and HTU 2015/05/12
Application note Triangle/Trapezoid Wave Generation Using PWM With Hercules N2HET 2015/05/01
Application note Nested Interrupts on Hercules ARM Cortex-R4/5-Based Microncontrollers 2015/04/23
White paper Latch-Up White Paper PDF | HTML 2015/04/22
Application note Interrupt and Exception Handling on Hercules ARM Cortex-R4/5-Based MCUs 2015/04/20
Application note Monitoring PWM Using N2HET 2015/04/02
Application note Hercules SCI With DMA 2015/03/22
Certificate TÜV NORD Certificate for Functional Safety Software Development Process 2015/02/03
Functional safety information Calculating Equivalent Power-on-Hours for Hercules Safety MCUs 2015/01/26
Functional safety information TUV SUD ISO-13849 Safety Architecture Concept Study 2014/07/02
More literature HaLCoGen Release Notes 2014/06/25
Functional safety information Hercules TMS570LC/RM57Lx Safety MCUs Development Insights Using Debug and Trace 2014/05/21
User guide Trace Analyzer User's Guide (Rev. B) 2013/11/18
Functional safety information IEC 60730 and UL 1998 Safety Standard Compliance Made Easier with TI Hercules 2013/10/03
White paper Model-Based Tool Qualification of the TI C/C++ ARM® Compiler 2013/06/06
Application note Hercules Family Frequency Slewing to Reduce Voltage and Current Transients 2012/07/05
Application note Basic PBIST Configuration and Influence on Current Consumption (Rev. C) 2012/04/12
Application note Verification of Data Integrity Using CRC 2012/02/17
Application note FlexRay Transfer Unit (FTU) Setup 2012/01/26
User guide HET Integrated Development Environment User's Guide (Rev. A) 2011/11/17
Functional safety information Important ARM Ltd Application Notes for TI Hercules ARM Safety MCUs 2011/11/17
Functional safety information Execution Time Measurement for Hercules ARM Safety MCUs (Rev. A) 2011/11/04
Application note Use of All 1'’s and All 0's Valid in Flash EEPROM Emulation 2011/09/27
Functional safety information ADC Source Impedance for Hercules ARM Safety MCUs (Rev. B) 2011/09/06
Functional safety information Configuring a CAN Node on Hercules ARM Safety MCUs 2011/09/06
Functional safety information Configuring the Hercules ARM Safety MCU SCI/LIN Module for UART Communication (Rev. A) 2011/09/06
Functional safety information Leveraging the High-End Timer Transfer Unit on Hercules ARM Safety MCUs (Rev. A) 2011/09/06
Functional safety information Hercules™ Microcontrollers: Real-time MCUs for safety-critical products 2011/09/02
Application note ECC Handling in TMSx70-Based Microcontrollers 2011/02/23
User guide TI ICEPick Module Type C Reference Guide Public Version 2011/02/17
Application note NHET Getting Started (Rev. B) 2010/08/30
Functional safety information Generating Operating System Tick Using RTI on a Hercules ARM Safety MCU 2010/07/13
Functional safety information Usage of MPU Subregions on TI Hercules ARM Safety MCUs 2010/03/10
User guide TI Assembly Language Tools Enhanced High-End Timer (NHET) Assembler User's Guide 2010/03/04
White paper Discriminating between Soft Errors and Hard Errors in RAM White Paper 2008/06/04

설계 및 개발

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디버그 프로브

TMDSEMU200-U — XDS200 USB 디버그 프로브

XDS200은 TI 임베디드 디바이스 디버깅에 사용되는 디버그 프로브(에뮬레이터)입니다. XDS200은 저렴한 XDS110 및 고성능 XDS560v2에 비해 저렴한 비용으로 우수한 성능을 균형 있게 제공합니다. 단일 포드에서 광범위한 표준(IEEE1149.1, IEEE1149.7, SWD)을 지원합니다. 모든 XDS 디버그 프로브는 ETB(Embedded Trace Buffer)를 특징으로 하는 모든 Arm® 및 DSP 프로세서에서 코어 및 시스템 추적을 지원합니다. 핀을 통한 코어 추적의 경우 XDS560v2 PRO TRACE가 (...)

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디버그 프로브

TMDSEMU560V2STM-U — XDS560v2 시스템 추적 USB 디버그 프로브

XDS560v2는 디버그 프로브의 XDS560™ 제품군 중 최고의 성능을 가진 제품으로, 기존의 JTAG 표준(IEEE1149.1)과 cJTAG(IEEE1149.7)를 모두 지원합니다. SWD(직렬 와이어 디버그)는 지원하지 않습니다.

모든 XDS 디버그 프로브는 ETB(Embedded Trace Buffer)를 특징으로 하는 모든 ARM 및 DSP 프로세서에서 코어 및 시스템 추적을 지원합니다. 핀을 통한 추적의 경우 XDS560v2 PRO TRACE가 필요합니다.

XDS560v2는 MIPI HSPT 60핀 커넥터(TI 14핀, (...)

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디버그 프로브

TMDSEMU560V2STM-UE — XDS560v2 시스템 추적 USB 및 이더넷 디버그 프로브

The XDS560v2 is the highest performance of the XDS family of debug probes and supports both the traditional JTAG standard (IEEE1149.1) and cJTAG (IEEE1149.7). Note that it does not support serial wire debug (SWD).

All XDS debug probes support Core and System Trace in all ARM and DSP processors that (...)

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개발 키트

LAUNCHXL2-570LC43 — Hercules TMS570LC43x 론치패드 개발 키트

Hercules™ TMS570LC43x LaunchPad™ 개발 키트는 ISO 26262IEC 61508 기능 안전 애플리케이션의 개발을 지원하도록 설계된 락스텝 캐시형 300MHz ARM® Cortex®-R5F 기반 TMS570 시리즈 오토모티브 등급 MCU인 최고 성능의 Hercules MCU TMS570LC4357을 기반으로 하는 저비용 평가 플랫폼입니다.

이 LaunchPad는 IEEE 1588 정밀 시간 이더넷 PHY DP83630과 같은 연결 옵션을 제공하며 표준 BoosterPack 헤더 외에도 MCU의 병렬 (...)

사용 설명서: PDF
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개발 키트

TMDX570LC43HDK — Hercules TMS570LC43x 개발 키트

The TMS570LC43x Hercules Development Kit is ideal for getting started on development with the Hercules TMS570LC4357 high-performance safety microcontrollers. The kit is comprised of a development board, a mini-B USB cable, and an Ethernet cable.

Hercules Safety MCU Demos, HALCoGen, the diagnostics (...)

사용 설명서: PDF
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IDE, 구성, 컴파일러 또는 디버거

CCSTUDIO Code Composer Studio integrated development environment (IDE)

Code Composer Studio is an integrated development environment (IDE) for TI's microcontrollers and processors. It comprises a suite of tools used to develop and debug embedded applications.  Code Composer Studio is available for download across Windows®, Linux® and macOS® desktops. It can also (...)

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