INA116 不建議用於新設計
此產品將繼續向現有客戶提供。新設計應考量替代產品。
open-in-new 比較替代產品
功能與所比較的裝置相似
INA121 現行 FET 輸入低功耗儀器放大器 INA121 has lower offset and higher CMRR, with half the power consumption
INA819 現行 具有 ±60V 過電壓保護 (增益針腳 2、3) 的低功耗 (350µA),精密儀器放大器 INA121 has lower offset and higher CMRR, with half the power consumption

產品詳細資料

Number of channels 1 Vs (max) (V) 36 Vs (min) (V) 9 Input offset (±) (max) (µV) 2000 Voltage gain (min) (V/V) 1 Voltage gain (max) (V/V) 1000 Noise at 1 kHz (typ) (nV√Hz) 28 CMRR (min) (dB) 86 Input offset drift (±) (max) (µV/°C) 5 Input bias current (±) (max) (nA) 0.000025 Iq (typ) (mA) 1 Bandwidth at min gain (typ) (MHz) 0.8 Gain error (±) (max) (%) 0.7 Operating temperature range (°C) -40 to 85 Rating Catalog Type Resistor Gain nonlinearity (±) (max) (%) 0.005 Output swing headroom (to negative supply) (typ) (V) 0.2 Output swing headroom (to positive supply) (typ) (V) -0.7 Input common mode headroom (to negative supply) (typ) (V) 2.4 Input common mode headroom (to positive supply) (typ) (V) -2 Noise at 0.1 Hz to 10 Hz (typ) (µVPP) 2
Number of channels 1 Vs (max) (V) 36 Vs (min) (V) 9 Input offset (±) (max) (µV) 2000 Voltage gain (min) (V/V) 1 Voltage gain (max) (V/V) 1000 Noise at 1 kHz (typ) (nV√Hz) 28 CMRR (min) (dB) 86 Input offset drift (±) (max) (µV/°C) 5 Input bias current (±) (max) (nA) 0.000025 Iq (typ) (mA) 1 Bandwidth at min gain (typ) (MHz) 0.8 Gain error (±) (max) (%) 0.7 Operating temperature range (°C) -40 to 85 Rating Catalog Type Resistor Gain nonlinearity (±) (max) (%) 0.005 Output swing headroom (to negative supply) (typ) (V) 0.2 Output swing headroom (to positive supply) (typ) (V) -0.7 Input common mode headroom (to negative supply) (typ) (V) 2.4 Input common mode headroom (to positive supply) (typ) (V) -2 Noise at 0.1 Hz to 10 Hz (typ) (µVPP) 2
PDIP (N) 16 181.42 mm² 19.3 x 9.4 SOIC (DW) 16 106.09 mm² 10.3 x 10.3
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類型 標題 日期
* Data sheet Ultra Low Input Bias Current Instrumentation Amplifier datasheet 2000年 9月 27日

訂購與品質

內含資訊:
  • RoHS
  • REACH
  • 產品標記
  • 鉛塗層/球物料
  • MSL 等級/回焊峰值
  • MTBF/FIT 估算值
  • 材料內容
  • 認證摘要
  • 進行中持續性的可靠性監測
內含資訊:
  • 晶圓廠位置
  • 組裝地點