SN54SC3T97-SEP
- Vendor item drawing available, VID V62/23633-01XE
- Total ionizing dose characterized at 30 krad (Si)
- Total ionizing dose radiation lot acceptance testing (TID RLAT) for every wafer lot to 30 krad (Si)
- Single-event effects (SEE) characterized:
- Single event latch-up (SEL) immune to linear energy transfer (LET) = 43 MeV-cm2 /mg
- Single event transient (SET) characterized to 43 MeV-cm2 /mg
- Wide operating range of 1.2 V to 5.5 V
- Single-supply translating gates at 5/3.3/2.5/1.8/1.2 V V CC
- TTL compatible inputs:
- Up translation:
- 1.8-V – Inputs from 1.2 V
- 2.5-V – Inputs from 1.8 V
- 3.3-V – Inputs from 1.8 V, 2.5 V
- 5.0-V – Inputs from 2.5 V, 3.3 V
- Down translation:
-
1.2-V – Inputs from 1.8 V, 2.5 V, 3.3 V, 5.0 V
- 1.8-V – Inputs from 2.5 V, 3.3 V, 5.0 V
- 2.5-V – Inputs from 3.3 V, 5.0 V
- 3.3-V – Inputs from 5.0 V
-
- Up translation:
- TTL compatible inputs:
- 5.5 V tolerant input pins
- Output drive up to 25 mA AT 5-V
- Latch-up performance exceeds 250 mA per JESD 17
- Space enhanced plastic (SEP)
- Controlled baseline
- Gold bondwire
- NiPdAu lead finish
- One assembly and test site
- One fabrication site
- Military (–55°C to 125°C) temperature range
- Extended product life cycle
- Product traceability
- Meets NASAs ASTM E595 outgassing specification
The SN54SC3T97-SEP device features configurable multiple functions with extended voltage operation to allow for level translation.. The output state is determined by eight patterns of 3-bit input. The user can choose the logic functions MUX, AND, OR, NAND, NOR, inverter, and noninverter. The output level is referenced to the supply voltage (V CC) and supports 1.2-V, 1.8-V, 2.5-V, 3.3-V, and 5-V CMOS levels.
The input is designed with a lower threshold circuit to support up translation for lower voltage CMOS inputs (for example 1.2 V input to 1.8 V output or 1.8 V input to 3.3 V output). Additionally, the 5-V tolerant input pins enable down translation (for example 3.3 V to 2.5 V output).
技術文件
類型 | 標題 | 日期 | ||
---|---|---|---|---|
* | Data sheet | SN54SC3T97-SEPRadiation Tolerant, Configurable Multiple-Function Gate datasheet | PDF | HTML | 2023年 11月 15日 |
* | Radiation & reliability report | SN54SC3T97-SEP Total Ionizing Dose (TID) Report | PDF | HTML | 2023年 12月 12日 |
* | Radiation & reliability report | SN54SC4T125-SEP Single Event Effects Report | PDF | HTML | 2023年 12月 5日 |
* | Radiation & reliability report | SN54SC3T97-SEP Production Flow and Reliability Report | PDF | HTML | 2023年 11月 8日 |
Application brief | TI Space Enhanced Plastic Logic Overview and Applications in Low-Earth Orbit Satellite Platforms | PDF | HTML | 2024年 9月 10日 |
設計與開發
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封裝 | 針腳 | CAD 符號、佔位空間與 3D 模型 |
---|---|---|
TSSOP (PW) | 14 | Ultra Librarian |
訂購與品質
- RoHS
- REACH
- 產品標記
- 鉛塗層/球物料
- MSL 等級/回焊峰值
- MTBF/FIT 估算值
- 材料內容
- 認證摘要
- 進行中持續性的可靠性監測
- 晶圓廠位置
- 組裝地點