SN54SC8T157-SEP
- Vendor item drawing available, VID V62/25624-01XE
- Radiation - Total Ionizing Dose (TID):
- TID characterized up to 50krad(Si)
- TID performance assurance up to 30krad(Si)
- Radiation Lot Acceptance Testing (RLAT) for every wafer lot up to 30krad(Si)
- Radiation - Single-Event Effects (SEE):
- Single Event Latch-Up (SEL) immune up to 50MeV-cm2/mg at 125°C
- Single Event Transient (SET) characterized up to LET = 50MeV-cm2/mg
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Wide operating range of 1.2V to 5.5V
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Single-supply voltage translator:
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Up translation:
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1.2V to 1.8V
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1.5V to 2.5V
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1.8V to 3.3V
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3.3V to 5.0V
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Down translation:
- 5.0V, 3.3V, 2.5V to 1.8V
- 5.0V, 3.3V to 2.5V
- 5.0V to 3.3V
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- 5.5V tolerant input pins
- Supports standard pinouts
- Up to 150Mbps with 5V or 3.3V VCC
- Latch-up performance exceeds 250mA per JESD 17
- Space enhanced plastic:
- Supports defense and aerospace applications
- Controlled baseline
- Au bondwire and NiPdAu lead finish
- Meets NASA ASTM E595 outgassing specification
- One fabrication, assembly, and test site
- Extended product life cycle
- Product traceability
The SN54SC8T157-SEP contains four data selectors/multiplexers to select one of two data sources. All channels are controlled by the same address select (A/B) input, and strobe (G) input. A high level at the strobe terminal forces all outputs low.
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開發板
14-24-NL-LOGIC-EVM — 適用於 14 針腳至 24 針腳無引線封裝的邏輯產品通用評估模組
14-24-NL-LOGIC-EVM 是一款靈活的評估模組 (EVM)，設計用於支援任何具有 14 針腳至 24 針腳 BQA、BQB、RGY、RSV、RJW 或 RHL 封裝的邏輯或轉換裝置。
| 封裝 | 針腳 | CAD 符號、佔位空間與 3D 模型 |
|---|---|---|
| TSSOP (PW) | 16 | Ultra Librarian |
訂購與品質
內含資訊：
- RoHS
- REACH
- 產品標記
- 鉛塗層/球物料
- MSL 等級/回焊峰值
- MTBF/FIT 估算值
- 材料內容
- 認證摘要
- 進行中持續性的可靠性監測
內含資訊：
- 晶圓廠位置
- 組裝地點
