SN74AUP1G97
- Available in the Texas Instruments NanoStar™ Package
- Low Static-Power Consumption (ICC = 0.9 µA Max)
- Low Dynamic-Power Consumption (Cpd = 4.8 pF Typ at 3.3 V)
- Low Input Capacitance (CI = 1.5 pF Typ)
- Low Noise – Overshoot and Undershoot
<10% of VCC - Ioff Supports Partial-Power-Down Mode Operation
- Includes Schmitt-Trigger Inputs
- Wide Operating VCC Range of 0.8 V to 3.6 V
- Optimized for 3.3-V Operation
- 3.6-V I/O Tolerant to Support Mixed-Mode Signal Operation
- tpd = 5.6 ns Max at 3.3 V
- Suitable for Point-to-Point Applications
- Latch-Up Performance Exceeds 100 mA Per JESD 78, Class II
- ESD Performance Tested Per JESD 22
- 2000-V Human-Body Model
(A114-B, Class II) - 1000-V Charged-Device Model (C101)
- 2000-V Human-Body Model
NanoStar is a trademark of Texas Instruments
The AUP family is TIs premier solution to the industrys low-power needs in battery-powered portable applications. This family ensures a very low static- and dynamic-power consumption across the entire VCC range of 0.8 V to 3.6 V, resulting in increased battery life (see Figure 1). This product also maintains excellent signal integrity (see the very low undershoot and overshoot characteristics shown in Figure 2).
The SN74AUP1G97 features configurable multiple functions. The output state is determined by eight patterns of 3-bit input. The user can choose the logic functions MUX, AND, OR, NAND, NOR, inverter, and noninverter. All inputs can be connected to VCC or GND.
The device functions as an independent gate with Schmitt-trigger inputs, which allows for slow input transition and better switching-noise immunity at the input.
NanoStar™ package technology is a major breakthrough in IC packaging concepts, using the die as the package.
This device is fully specified for partial-power-down applications using Ioff. The Ioff circuitry disables the outputs, preventing damaging current backflow through the device when it is powered down.
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技術文件
類型 | 標題 | 日期 | ||
---|---|---|---|---|
* | Data sheet | SN74AUP1G97 Low-Power Configurable Multiple-Function Gate datasheet (Rev. J) | 2010年 5月 18日 | |
Application brief | Utilizing Configurable Logic in System Design | PDF | HTML | 2024年 10月 30日 | |
Application brief | Understanding Schmitt Triggers (Rev. A) | PDF | HTML | 2019年 5月 22日 | |
Selection guide | Little Logic Guide 2018 (Rev. G) | 2018年 7月 6日 | ||
Selection guide | Logic Guide (Rev. AB) | 2017年 6月 12日 | ||
Application note | How to Select Little Logic (Rev. A) | 2016年 7月 26日 | ||
More literature | SN74LVC1G97 and SN74LVC1G98 Product Clip (Rev. A) | 2004年 7月 13日 | ||
Application note | Semiconductor Packing Material Electrostatic Discharge (ESD) Protection | 2004年 7月 8日 |
設計與開發
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5-8-LOGIC-EVM — 適用於 5 針腳至 8 針腳 DCK、DCT、DCU、DRL 和 DBV 封裝的通用邏輯評估模組
封裝 | 針腳 | CAD 符號、佔位空間與 3D 模型 |
---|---|---|
DSBGA (YFP) | 6 | Ultra Librarian |
DSBGA (YZP) | 6 | Ultra Librarian |
SOT-23 (DBV) | 6 | Ultra Librarian |
SOT-5X3 (DRL) | 6 | Ultra Librarian |
SOT-SC70 (DCK) | 6 | Ultra Librarian |
USON (DRY) | 6 | Ultra Librarian |
X2SON (DSF) | 6 | Ultra Librarian |
訂購與品質
- RoHS
- REACH
- 產品標記
- 鉛塗層/球物料
- MSL 等級/回焊峰值
- MTBF/FIT 估算值
- 材料內容
- 認證摘要
- 進行中持續性的可靠性監測
- 晶圓廠位置
- 組裝地點