(1)Component qualification in accordance with JEDEC and industry standards to ensure reliable operation over an extended temperature range. This includes, but is not limited to, Highly Accelerated Stress Test (HAST) or biased 85/85, temperature cycle, autoclave or unbiased HAST, electromigration, bond intermetallic life, and mold compound life. Such qualification testing should not be viewed as justifying use of this component beyond specified
performance and environmental limits.
The TL1451A-EP incorporates on a single monolithic chip all the functions required in the construction of two pulse-width modulation (PWM) control circuits. Designed primarily for power-supply control, the TL1451A-EP contains an on-chip 2.5-V regulator, two error amplifiers, an adjustable oscillator, two dead-time comparators, undervoltage lockout circuitry, and dual common-emitter output transistor circuits.
The uncommitted output transistors provide common-emitter output capability for each controller. The internal amplifiers exhibit a common-mode voltage range from 1.04 V to 1.45 V. The dead-time control (DTC) comparator has no offset unless externally altered and can provide 0% to 100% dead time. The on-chip oscillator can be operated by terminating RT and CT. During low VCC conditions, the undervoltage lockout control circuit feature locks the outputs off until the internal circuitry is operational.
The TL1451A-EP is characterized for operation from -55°C to 125°C.
| 類型 | 標題 | 日期 | ||
|---|---|---|---|---|
| * | Data sheet | TL1451A-EP datasheet | 2005年 10月 14日 | |
| * | VID | TL1451A-EP VID V6206611 | 2016年 6月 21日 |
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This tool helps a power supply engineer to select the right isolated DC-DC topology based on the specifications. Depending on the topology chosen, the calculator also recommends the right IC for the design.
| 封裝 | 針腳 | CAD 符號、佔位空間與 3D 模型 |
|---|---|---|
| SOIC (D) | 16 | Ultra Librarian |