TLV1H103-SEP
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VID V62/22606-01XE
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Radiation - Total Ionizing Dose (TID)
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TID Characterized to 30krad (Si)
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ELDRS-Free to 30krad (Si)
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RHA/RLAT to 30krad (Si)
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Radiation - Single-Event Effects (SEE)
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SEL Immune to LET = 43MeV·cm2/mg
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SET Characterized to LET = 43MeV·cm2/mg
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Space Enhanced Plastic
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Controlled Baseline
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One Assembly/Test Site
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One Fabrication Site
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Extended Product Life Cycle
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Product Traceability
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- Low propagation delay: 2.5ns
- Low overdrive dispersion: 700ps
- High toggle frequency: 325MHz
- Narrow pulse width detection capability: 1.5ns
- Input common-mode range extends 200mV beyond both rails
- Supply range: 2.4V to 5.5V
- Adjustable hysteresis control
- Output latch capability
The TLV1H103-SEP is a 325MHz, high speed comparator with rail-to-rail inputs and a propagation delay of 2.5ns. The combination of fast response and wide operating voltage range make the comparator an excellent choice for narrow signal pulse detection and data and clock recovery applications in radar imaging and communications payload systems.
The push-pull (single-ended) outputs of the TLV1H103-SEP simplify and save cost on board-to-board wiring for I/O interfaces while reducing power consumption when compared to alternative high-speed differential output comparators. In addition, the TLV1H103-SEP offers the features such as adjustable hysteresis control and output latch capability. The comparator can directly interface most prevailing digital controllers and IO expanders in the downstream.
The TLV1H103-SEP uses a high-speed complementary BiCMOS process and is available in a 6-pin, SOT-23 package.
技術文件
類型 | 標題 | 日期 | ||
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* | Data sheet | TLV1H103-SEP Radiation Tolerant High-Speed Comparator with 2.5ns Propagation Delay datasheet | PDF | HTML | 2024年 8月 14日 |
* | Radiation & reliability report | TLV1H103-SEP Radiation Tolerant High-Speed Comparator TID Report (Rev. B) | 2024年 8月 14日 | |
* | Radiation & reliability report | TLV1H103-SEP Production Flow and Reliability Report | PDF | HTML | 2024年 8月 12日 |
* | Radiation & reliability report | TLV1H103-SEP Neutron Displacement Damage (NDD) Characterization Report | 2024年 4月 29日 | |
* | Radiation & reliability report | TLV1H103-SEP Single-Event Effects (SEE) Radiation Report | PDF | HTML | 2024年 4月 26日 |
Certificate | HS-COMPARATOR-EVM EU Declaration of Conformity (DoC) | 2024年 4月 8日 |
設計與開發
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PSPICE-FOR-TI — PSpice® for TI 設計與模擬工具
TINA-TI — 基於 SPICE 的類比模擬程式
封裝 | 針腳 | CAD 符號、佔位空間與 3D 模型 |
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SOT-23 (DBV) | 6 | Ultra Librarian |
訂購與品質
- RoHS
- REACH
- 產品標記
- 鉛塗層/球物料
- MSL 等級/回焊峰值
- MTBF/FIT 估算值
- 材料內容
- 認證摘要
- 進行中持續性的可靠性監測
- 晶圓廠位置
- 組裝地點
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