Our integrated circuits and reference designs help create high-precision automotive interface communications hardware in loop (HIL) tester for accurate testing of all automotive subsystems during manufacturing and service of the vehicle.
New generation automotive interface and communications HIL tester designs require:
Find products and reference designs for your system.
| Type | Title | Date | ||
|---|---|---|---|---|
| Application note | Signal Chain Noise Figure Analysis | 29 Oct 2014 | ||
| Application note | Principles of Data Acquisition and Conversion (Rev. A) | PDF | HTML | 28 Jun 2018 | |
| Analog Design Journal | Impact of sampling-clock spurs on ADC performance | 23 Jul 2009 | ||
| Application note | 66AK2L06 JESD Attach to ADC12J4000/DAC38J84 Getting Started Guide (Rev. B) | 20 Jun 2016 | ||
| White paper | Voltage-reference impact on total harmonic distortion | 19 Sep 2016 | ||
| Analog Design Journal | Power-supply design for high-speed ADCs (Rev. A) | 18 May 2015 | ||
| White paper | Minimum Power Specifications for High-Performance ADC Power-Supply Designs | 15 Apr 2016 | ||
| Analog Design Journal | JESD204B multi-device synchronization: Breaking down the requirements | 12 May 2015 | ||
| Application note | Clocking Optimization for RF Sampling Analog-to-Digital Converters (Rev. A) | PDF | HTML | 10 May 2022 | |
| White paper | Direct RF conversion: From vision to reality | 05 May 2015 |
Content is provided "as is" by TI and community contributors and does not constitute TI specifications. See terms of use.
If you have questions about quality, packaging or ordering TI products, see TI support.