Lead finish/ball material & tin plating

 

This page provides details on TI's lead finish and solder ball composition options, as well as our tin plating process.

To find device-specific composition, use our Material content search tool.

Material options

Material
Standard
Pb-free
Lead finish 85% Sn, 15% Pb
63% Sn, 37% Pb (some metal can packages)
Matte Sn
NiPdAu
NiPdAuAg
SnCu
SnAgCu
Au over Ni
Solder ball SnPb SnAgCu
SnAg

Tin plating process

TI’s Tin plate process meets and/or exceeds qualification and monitoring standards set in JESD201, with Class 1 and Class 2 levels inspection per JESD 22A121. In addition, TI has taken the following actions for Tin plating products to meet JESD201 Class 2 requirement:

  • Leadframe base material (alloy) control
  • Tin plating control (chemistry, process and thickness)
  • Post-plate annealing (150C minimum within 24 hours of plating)

TI uses leadframe materials such as Cu194, Cu7025, EFTEC-64T, TAMAC2, and TAMAC4.
 

Tin whiskers

Tin whiskers occur due to stresses in the plating process and are known to occur on tin-plated or tin-alloy plated parts. Tin whisker growth creates a reliability concern because they may bridge the gap between leads, causing electrical shorting. As a whisker mitigation measure, TI:

  • Anneals matte tin post-plated leadframe-based packages with formed leads for 1 hour at 150°C within 24 hours of plating. This is the industry-accepted method for controlling whisker growth.
  • Maintains minimum "as-plated" thickness of 7 μm, with 15% thinning allowed after lead trim and form for electroplated devices. This thickness conforms to the recognized tin whisker mitigation practices published in JEDEC/IPC JP002.
  • Applies SnAgCu alloy to minimum 5 μm thickness after lead trim and form for hot solder dipped devices. This process is considered "whisker-free" per JEDEC/IPC JP002.
     

Tin whisker test results (per JESD201)

Test summary

All leadframe materials tested show consistent whisker mitigation performance across different stress test conditions.
 

Materials tested

  • C19400 (Cu194) - Copper alloy
  • C07025 (Cu7025) - Copper alloy
  • C18045 (EFTEC-64T) - Copper alloy
  • TAMAC 2 - Leadframe material
  • TAMAC 4 - Leadframe material
     

Test results

Stress Test Condition
Duration
Result (All materials listed above
Temperature Cycling (-55°C/+85°C or -40°C/+85°C) 1500 cycles <45 μm whiskers
High Temperature Humidity Storage (55°C/85%RH) 4000 hours <40 μm whiskers
Temperature Humidity Storage (30°C/60%RH) 4000 hours <40 μm whiskers (some tested with no precondition)*
*For Temperature Humidity Storage testing, materials C19400, C07025, C18045, TAMAC 2, and TAMAC 4 were tested without Precondition A.