The LMG2656EVM-102 is designed to provide a quick and easy platform to evaluate TI integrated GaN devices in any half-bridge topology. The board is designed to be interfaced with a larger system using the 6 power pins and 12 digital pins on the bottom edge of the board in a socket style external connection. Power pins form the main switching loop consisting of a high voltage DC bus, switch node, and power ground. The digital pins control the LMG2656 device with PWM gate inputs, provide auxiliary power with low voltage supplies, and report faults as a digital output. Essential power stage and gate-driving, highfrequency current loops are fully enclosed on the board to minimize power loop parasitic inductance for reducing voltage overshoots and improving performance. Evaluating the LMG2656EVM-102 performance is most easily demonstrated using a synchronous buck/boost motherboard from TI (LMG342X-BB-EVM). The daughtercard easily plugs into the motherboard and interfaces all power and digital control in an open-loop configuration for full system control. Additionally, a recommended footprint is provided to interface the daughtercard with a custom system for further testing. Refer to the LMG2656 data sheet before using this EVM.
Features
- High-side gate-drive level shifter
- Smart-switched bootstrap diode function: 0 QRR
- Integrated lossless current sensing output measurement
- Low-side and high-side cycle-by-cycle overcurrent protection and overtemperature protection connected to output FAULT signal
- Absolute maximum voltage rating of 650V