Product details

Technology family CD4000 Supply voltage (min) (V) 3 Supply voltage (max) (V) 18 Number of channels 2 Inputs per channel 4 IOL (max) (mA) 1.5 IOH (max) (mA) -1.5 Input type Standard CMOS Output type Push-Pull Features Standard speed (tpd > 50ns) Data rate (max) (Mbps) 8 Rating Military Operating temperature range (°C) -55 to 125
Technology family CD4000 Supply voltage (min) (V) 3 Supply voltage (max) (V) 18 Number of channels 2 Inputs per channel 4 IOL (max) (mA) 1.5 IOH (max) (mA) -1.5 Input type Standard CMOS Output type Push-Pull Features Standard speed (tpd > 50ns) Data rate (max) (Mbps) 8 Rating Military Operating temperature range (°C) -55 to 125
CDIP (J) 14 130.4652 mm² 19.56 x 6.67
  • Propagation delay time = 60 ns (typ.) at CL = 50 pF, VDD = 10 V
  • Buffered inputs and outputs
  • Standardized symmetrical output characteristics
  • Maximum input current of 1 µA at 18 V over-full package temperature range; 100 nA at 18 V and 25°C
  • 100% tested for quiescent current at 20 V
  • 5-V, 10-V, and 15-V parametric ratings
  • Noise margin (over full package temperature range:
        1 V at VDD = 5 V
        2 V at VDD = 10 V
        2.5 at VDD = 15 V
  • Meets all requirements of JEDEC Tentative Standard No. 13B, "Standard Specifications for Description of "B" Series CMOS Devices"

Quad 2 Input—CD4011B
Dual 4 Input—CD4012B
Triple 3 Input—CD4023B
Data sheet acquired from Harris Semiconductor.

  • Propagation delay time = 60 ns (typ.) at CL = 50 pF, VDD = 10 V
  • Buffered inputs and outputs
  • Standardized symmetrical output characteristics
  • Maximum input current of 1 µA at 18 V over-full package temperature range; 100 nA at 18 V and 25°C
  • 100% tested for quiescent current at 20 V
  • 5-V, 10-V, and 15-V parametric ratings
  • Noise margin (over full package temperature range:
        1 V at VDD = 5 V
        2 V at VDD = 10 V
        2.5 at VDD = 15 V
  • Meets all requirements of JEDEC Tentative Standard No. 13B, "Standard Specifications for Description of "B" Series CMOS Devices"

Quad 2 Input—CD4011B
Dual 4 Input—CD4012B
Triple 3 Input—CD4023B
Data sheet acquired from Harris Semiconductor.

CD4011B, CD4012B, and CD4023B NAND gates provide the system designer with direct implementation of the NAND function and supplement the existing family of CMOS gates. All inputs and outputs are buffered.

The CD4011B, CD4012B, and CD4023B types are supplied in 14-lead hermetic dual-in-line ceramic packages (F3A suffix), 14-lead dual-in-line plastic packages (E suffix), 14-lead small-outline packages (M, MT, M96, and NSR suffixes), and 14-lead thin shrink small-outline packages (PWR suffix). The CD4011B and CD4023B types also are supplied in 14-lead thin shrink small-outline packages (PW suffix).

CD4011B, CD4012B, and CD4023B NAND gates provide the system designer with direct implementation of the NAND function and supplement the existing family of CMOS gates. All inputs and outputs are buffered.

The CD4011B, CD4012B, and CD4023B types are supplied in 14-lead hermetic dual-in-line ceramic packages (F3A suffix), 14-lead dual-in-line plastic packages (E suffix), 14-lead small-outline packages (M, MT, M96, and NSR suffixes), and 14-lead thin shrink small-outline packages (PWR suffix). The CD4011B and CD4023B types also are supplied in 14-lead thin shrink small-outline packages (PW suffix).

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Technical documentation

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Type Title Date
* Data sheet CD4011B, CD4012B, CD4023B TYPES datasheet (Rev. D) 21 Aug 2003
Selection guide Logic Guide (Rev. AB) 12 Jun 2017
Application note Understanding and Interpreting Standard-Logic Data Sheets (Rev. C) 02 Dec 2015
User guide LOGIC Pocket Data Book (Rev. B) 16 Jan 2007
Application note Semiconductor Packing Material Electrostatic Discharge (ESD) Protection 08 Jul 2004
User guide Signal Switch Data Book (Rev. A) 14 Nov 2003
Application note Understanding Buffered and Unbuffered CD4xxxB Series Device Characteristics 03 Dec 2001

Design & development

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CDIP (J) 14 Ultra Librarian

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