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CD4019B-MIL

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CMOS Quad AND/OR Select Gate

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Data sheet

CD4019B-MIL

ACTIVE
Data sheet Order now

Product details

Technology family CD4000 Supply voltage (min) (V) 3 Supply voltage (max) (V) 18 Number of channels 4 Inputs per channel 4 IOL (max) (mA) 1.5 IOH (max) (mA) -1.5 Input type Standard CMOS Output type Push-Pull Features Standard speed (tpd > 50ns) Data rate (max) (Mbps) 8 Rating Military Operating temperature range (°C) -55 to 125
Technology family CD4000 Supply voltage (min) (V) 3 Supply voltage (max) (V) 18 Number of channels 4 Inputs per channel 4 IOL (max) (mA) 1.5 IOH (max) (mA) -1.5 Input type Standard CMOS Output type Push-Pull Features Standard speed (tpd > 50ns) Data rate (max) (Mbps) 8 Rating Military Operating temperature range (°C) -55 to 125
CDIP (J) 16 135.3552 mm² 19.56 x 6.92
  • Medium speed operation……tPHL = tPLH = 60 ns (typ.) at CL = 50 pF, VDD = 10 V
  • Standardized, symmetrical output characteristics
  • 100% tested for quiescent current at 20 V
  • 5-V, 10-V, and 15-V parametric ratings
  • Meets all requirements of JEDEC Tentative Standard No. 13B, "Standard Specifications for Description of ’B’ Series CMOS Devices"
  • Maximum input current of 1 µA at 18 V over full package-temperature range; 100 nA at 18 V and 25°C
  • Noise margin (full package-temperature range) =
            1 V at VDD = 5 V
            2 V at VDD = 10 V
         2.5 V at VDD = 15 V
  • Applications:
    • AND-OR select gating
    • Shift-right/shift-left registers
    • True/complement selection
    • AND/OR/Exclusive-OR selection
  • Medium speed operation……tPHL = tPLH = 60 ns (typ.) at CL = 50 pF, VDD = 10 V
  • Standardized, symmetrical output characteristics
  • 100% tested for quiescent current at 20 V
  • 5-V, 10-V, and 15-V parametric ratings
  • Meets all requirements of JEDEC Tentative Standard No. 13B, "Standard Specifications for Description of ’B’ Series CMOS Devices"
  • Maximum input current of 1 µA at 18 V over full package-temperature range; 100 nA at 18 V and 25°C
  • Noise margin (full package-temperature range) =
            1 V at VDD = 5 V
            2 V at VDD = 10 V
         2.5 V at VDD = 15 V
  • Applications:
    • AND-OR select gating
    • Shift-right/shift-left registers
    • True/complement selection
    • AND/OR/Exclusive-OR selection

CD4019B types consist of four AND/OR select gate configurations, each consisting of two 2-input AND gates driving a single-input OR gate. Selection is accomplished by control bits Ka and Kb. In addition to selection of either channel A or channel B information, the control bits can be applied simultaneously to accomplish the logical A + B function.

The CD4019B types are supplied in 16-lead hermetic dual-in-line ceramic packages (F3A suffix), 16-lead dual-in-line plastic packages (E suffix), 16-lead small-outline packages (M, M96, MT, and NSR suffixes), and 16-lead thin shrink small-outline packages (PW and PWR suffixes).

CD4019B types consist of four AND/OR select gate configurations, each consisting of two 2-input AND gates driving a single-input OR gate. Selection is accomplished by control bits Ka and Kb. In addition to selection of either channel A or channel B information, the control bits can be applied simultaneously to accomplish the logical A + B function.

The CD4019B types are supplied in 16-lead hermetic dual-in-line ceramic packages (F3A suffix), 16-lead dual-in-line plastic packages (E suffix), 16-lead small-outline packages (M, M96, MT, and NSR suffixes), and 16-lead thin shrink small-outline packages (PW and PWR suffixes).
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Technical documentation

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Type Title Date
* Data sheet CD4019B TYPES datasheet (Rev. C) 15 Oct 2003
Selection guide Logic Guide (Rev. AB) 12 Jun 2017
Application note Understanding and Interpreting Standard-Logic Data Sheets (Rev. C) 02 Dec 2015
User guide LOGIC Pocket Data Book (Rev. B) 16 Jan 2007
Application note Semiconductor Packing Material Electrostatic Discharge (ESD) Protection 08 Jul 2004
User guide Signal Switch Data Book (Rev. A) 14 Nov 2003
Application note Understanding Buffered and Unbuffered CD4xxxB Series Device Characteristics 03 Dec 2001

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