Product details

Function RS latch Number of channels 4 Technology family CD4000 Supply voltage (min) (V) 3 Supply voltage (max) (V) 18 Input type Standard CMOS Output type 3-State Data rate (max) (Mbps) 16 IOL (max) (mA) 2.4 IOH (max) (mA) -2.4 Features High speed (tpd 10-50ns), Partial power down (Ioff), Standard speed (tpd > 50ns) Operating temperature range (°C) -55 to 125 Rating Catalog
Function RS latch Number of channels 4 Technology family CD4000 Supply voltage (min) (V) 3 Supply voltage (max) (V) 18 Input type Standard CMOS Output type 3-State Data rate (max) (Mbps) 16 IOL (max) (mA) 2.4 IOH (max) (mA) -2.4 Features High speed (tpd 10-50ns), Partial power down (Ioff), Standard speed (tpd > 50ns) Operating temperature range (°C) -55 to 125 Rating Catalog
PDIP (N) 16 181.42 mm² 19.3 x 9.4 SOIC (D) 16 59.4 mm² 9.9 x 6 SOIC (DW) 16 106.09 mm² 10.3 x 10.3 SOP (NS) 16 79.56 mm² 10.2 x 7.8 TSSOP (PW) 16 32 mm² 5 x 6.4
  • 3-state outputs with common output ENABLE
  • Separate SET and RESET inputs for each latch
  • NOR and NAND configurations
  • 5-V, 10-V, and 15-V parametric ratings
  • Standardized symmetrical output characteristics
  • 100% tested for quiescent current at 20 V
  • Maximum input current of 1 µA at 18 V over full package temperature range; 100 nA at 18 V and 25°C
  • Noise margin (over full package temperature range):
    • 1 V at VDD = 5 V
    • 2 V at VDD = 10 V
    • 2.5 V at VDD = 15 V
  • Meets all requirements of JEDEC Tentative Standard No. 13B, "Standard Specifications for Description of 'B' Series CMOS Devices"
  • Applications
    • Holding register in multi-register system
    • Four bits of independent storage with output ENABLE
    • Strobed register
    • General digital logic
    • CD4043B for positive logic systems
    • CD4044B for negative logic systems

Data sheet acquired from Harris Semiconductor

  • 3-state outputs with common output ENABLE
  • Separate SET and RESET inputs for each latch
  • NOR and NAND configurations
  • 5-V, 10-V, and 15-V parametric ratings
  • Standardized symmetrical output characteristics
  • 100% tested for quiescent current at 20 V
  • Maximum input current of 1 µA at 18 V over full package temperature range; 100 nA at 18 V and 25°C
  • Noise margin (over full package temperature range):
    • 1 V at VDD = 5 V
    • 2 V at VDD = 10 V
    • 2.5 V at VDD = 15 V
  • Meets all requirements of JEDEC Tentative Standard No. 13B, "Standard Specifications for Description of 'B' Series CMOS Devices"
  • Applications
    • Holding register in multi-register system
    • Four bits of independent storage with output ENABLE
    • Strobed register
    • General digital logic
    • CD4043B for positive logic systems
    • CD4044B for negative logic systems

Data sheet acquired from Harris Semiconductor

CD4043B types are quad cross-coupled 3-state CMOS NOR latches and the CD4044B types are quad cross-coupled 3-state CMOS NAND latches. Each latch has a separate Q output and individual SET and RESET inputs. The Q outputs are controlled by a common ENABLE input. A logic "1" or high on the ENABLE input connects the latch states to the Q outputs. A logic "0" or low on the ENABLE input disconnects the latch states from the Q outputs, resulting in an open circuit condition on the Q outputs. The open circuit feature allows common busing of the outputs.

The CD4043B and CD4044B types are supplied in 16-lead hermetic dual-in-line ceramic packages (F3A suffix), 16-lead dual-in-line plastic packages (E suffix), 16-lead small-outline package (D, DR, DT, DWR, and NSR suffixes), and 16-lead thin shrink small-outline packages (PW and PWR suffixes).

CD4043B types are quad cross-coupled 3-state CMOS NOR latches and the CD4044B types are quad cross-coupled 3-state CMOS NAND latches. Each latch has a separate Q output and individual SET and RESET inputs. The Q outputs are controlled by a common ENABLE input. A logic "1" or high on the ENABLE input connects the latch states to the Q outputs. A logic "0" or low on the ENABLE input disconnects the latch states from the Q outputs, resulting in an open circuit condition on the Q outputs. The open circuit feature allows common busing of the outputs.

The CD4043B and CD4044B types are supplied in 16-lead hermetic dual-in-line ceramic packages (F3A suffix), 16-lead dual-in-line plastic packages (E suffix), 16-lead small-outline package (D, DR, DT, DWR, and NSR suffixes), and 16-lead thin shrink small-outline packages (PW and PWR suffixes).

Download View video with transcript Video

Technical documentation

star =Top documentation for this product selected by TI
No results found. Please clear your search and try again.
View all 8
Type Title Date
* Data sheet CD4043B, CD4044B Types datasheet (Rev. D) 13 Oct 2003
Application note Power-Up Behavior of Clocked Devices (Rev. B) PDF | HTML 15 Dec 2022
Selection guide Logic Guide (Rev. AB) 12 Jun 2017
Application note Understanding and Interpreting Standard-Logic Data Sheets (Rev. C) 02 Dec 2015
User guide LOGIC Pocket Data Book (Rev. B) 16 Jan 2007
Application note Semiconductor Packing Material Electrostatic Discharge (ESD) Protection 08 Jul 2004
User guide Signal Switch Data Book (Rev. A) 14 Nov 2003
Application note Understanding Buffered and Unbuffered CD4xxxB Series Device Characteristics 03 Dec 2001

Design & development

For additional terms or required resources, click any title below to view the detail page where available.

Evaluation board

14-24-LOGIC-EVM — Logic product generic evaluation module for 14-pin to 24-pin D, DB, DGV, DW, DYY, NS and PW packages

The 14-24-LOGIC-EVM evaluation module (EVM) is designed to support any logic device that is in a 14-pin to 24-pin D, DW, DB, NS, PW, DYY or DGV package,

User guide: PDF | HTML
Not available on TI.com
Package Pins CAD symbols, footprints & 3D models
PDIP (N) 16 Ultra Librarian
SOIC (D) 16 Ultra Librarian
SOIC (DW) 16 Ultra Librarian
SOP (NS) 16 Ultra Librarian
TSSOP (PW) 16 Ultra Librarian

Ordering & quality

Information included:
  • RoHS
  • REACH
  • Device marking
  • Lead finish/Ball material
  • MSL rating/Peak reflow
  • MTBF/FIT estimates
  • Material content
  • Qualification summary
  • Ongoing reliability monitoring
Information included:
  • Fab location
  • Assembly location

Support & training

TI E2E™ forums with technical support from TI engineers

Content is provided "as is" by TI and community contributors and does not constitute TI specifications. See terms of use.

If you have questions about quality, packaging or ordering TI products, see TI support. ​​​​​​​​​​​​​​

Videos