SBASAF6A October   2021  – October 2024 ADC09DJ1300 , ADC09QJ1300 , ADC09SJ1300

PRODUCTION DATA  

  1.   1
  2. 1 Features
  3. 2 Applications
  4. 3 Description
  5. 4 Pin Configuration and Functions
  6. 5 Specifications
    1. 5.1  Absolute Maximum Ratings
    2. 5.2  ESD Ratings
    3. 5.3  Recommended Operating Conditions
    4. 5.4  Thermal Information
    5. 5.5  Electrical Characteristics: DC Specifications
    6. 5.6  Electrical Characteristics: Power Consumption
    7. 5.7  Electrical Characteristics: AC Specifications
    8. 5.8  Timing Requirements
    9. 5.9  Switching Characteristics
    10. 5.10 Typical Characteristics
  7. 6 Detailed Description
    1. 6.1 Overview
    2. 6.2 Functional Block Diagram
    3. 6.3 Feature Description
      1. 6.3.1 Device Comparison
      2. 6.3.2 Analog Input
        1. 6.3.2.1 Analog Input Protection
        2. 6.3.2.2 Full-Scale Voltage (VFS) Adjustment
        3. 6.3.2.3 Analog Input Offset Adjust
      3. 6.3.3 ADC Core
        1. 6.3.3.1 ADC Core Calibration
        2. 6.3.3.2 ADC Theory of Operation
        3. 6.3.3.3 Analog Reference Voltage
        4. 6.3.3.4 ADC Over-range Detection
        5. 6.3.3.5 Code Error Rate (CER)
        6. 6.3.3.6 Temperature Monitoring Diode
        7. 6.3.3.7 Timestamp
      4. 6.3.4 Clocking
        1. 6.3.4.1 Converter PLL (C-PLL) for Sampling Clock Generation
        2. 6.3.4.2 LVDS Clock Outputs (PLLREFO±, TRIGOUT±)
        3. 6.3.4.3 Optional CMOS Clock Outputs (ORC, ORD)
        4. 6.3.4.4 SYSREF for JESD204C Subclass-1 Deterministic Latency
          1. 6.3.4.4.1 SYSREF Capture for Multi-Device Synchronization and Deterministic Latency
          2. 6.3.4.4.2 SYSREF Position Detector and Sampling Position Selection (SYSREF Windowing)
        5. 6.3.4.5 JESD204C Interface
          1. 6.3.4.5.1  Transport Layer
          2. 6.3.4.5.2  Scrambler
          3. 6.3.4.5.3  Link Layer
          4. 6.3.4.5.4  8B/10B Link Layer
            1. 6.3.4.5.4.1 Data Encoding (8B/10B)
            2. 6.3.4.5.4.2 Multiframes and the Local Multiframe Clock (LMFC)
            3. 6.3.4.5.4.3 Code Group Synchronization (CGS)
            4. 6.3.4.5.4.4 Initial Lane Alignment Sequence (ILAS)
            5. 6.3.4.5.4.5 Frame and Multiframe Monitoring
          5. 6.3.4.5.5  64B/66B Link Layer
            1. 6.3.4.5.5.1 64B/66B Encoding
            2. 6.3.4.5.5.2 Multiblocks, Extended Multiblocks and the Local Extended Multiblock Clock (LEMC)
              1. 6.3.4.5.5.2.1 Block, Multiblock and Extended Multiblock Alignment using Sync Header
                1. 6.3.4.5.5.2.1.1 Cyclic Redundancy Check (CRC) Mode
                2. 6.3.4.5.5.2.1.2 Forward Error Correction (FEC) Mode
            3. 6.3.4.5.5.3 Initial Lane Alignment
            4. 6.3.4.5.5.4 Block, Multiblock and Extended Multiblock Alignment Monitoring
          6. 6.3.4.5.6  Physical Layer
            1. 6.3.4.5.6.1 SerDes Pre-Emphasis
          7. 6.3.4.5.7  JESD204C Enable
          8. 6.3.4.5.8  Multi-Device Synchronization and Deterministic Latency
          9. 6.3.4.5.9  Operation in Subclass 0 Systems
          10. 6.3.4.5.10 Alarm Monitoring
            1. 6.3.4.5.10.1 Clock Upset Detection
            2. 6.3.4.5.10.2 FIFO Upset Detection
    4. 6.4 Device Functional Modes
      1. 6.4.1 Low Power Mode and High Performance Mode
      2. 6.4.2 JESD204C Modes
        1. 6.4.2.1 JESD204C Transport Layer Data Formats
        2. 6.4.2.2 64B/66B Sync Header Stream Configuration
        3. 6.4.2.3 Redundant Data Mode (Alternate Lanes)
      3. 6.4.3 Power-Down Modes
      4. 6.4.4 Test Modes
        1. 6.4.4.1  Serializer Test-Mode Details
        2. 6.4.4.2  PRBS Test Modes
        3. 6.4.4.3  Clock Pattern Mode
        4. 6.4.4.4  Ramp Test Mode
        5. 6.4.4.5  Short and Long Transport Test Mode
          1. 6.4.4.5.1 Short Transport Test Pattern
        6. 6.4.4.6  D21.5 Test Mode
        7. 6.4.4.7  K28.5 Test Mode
        8. 6.4.4.8  Repeated ILA Test Mode
        9. 6.4.4.9  Modified RPAT Test Mode
        10. 6.4.4.10 Calibration Modes and Trimming
          1. 6.4.4.10.1 Foreground Calibration Mode
          2. 6.4.4.10.2 Background Calibration Mode
          3. 6.4.4.10.3 Low-Power Background Calibration (LPBG) Mode
        11. 6.4.4.11 Offset Calibration
        12. 6.4.4.12 Trimming
    5. 6.5 Programming
      1. 6.5.1 Using the Serial Interface
      2. 6.5.2 SCS
      3. 6.5.3 SCLK
      4. 6.5.4 SDI
      5. 6.5.5 SDO
      6. 6.5.6 Streaming Mode
    6. 6.6 SPI_Register_Map Registers
  8. 7 Application and Implementation
    1. 7.1 Application Information
    2. 7.2 Typical Applications
      1. 7.2.1 Light Detection and Ranging (LiDAR) Digitizer
        1. 7.2.1.1 Design Requirements
        2. 7.2.1.2 Detailed Design Procedure
          1. 7.2.1.2.1 Analog Front-End Requirements
          2. 7.2.1.2.2 Calculating Clock and SerDes Frequencies
        3. 7.2.1.3 Application Curves
      2. 7.2.2 Initialization Set Up
    3. 7.3 Power Supply Recommendations
      1. 7.3.1 Power Sequencing
    4. 7.4 Layout
      1. 7.4.1 Layout Guidelines
      2. 7.4.2 Layout Example
  9. 8 Device and Documentation Support
    1. 8.1 Device Support
    2. 8.2 Documentation Support
    3. 8.3 Receiving Notification of Documentation Updates
    4. 8.4 Support Resources
    5. 8.5 Trademarks
    6. 8.6 Electrostatic Discharge Caution
    7. 8.7 Glossary
  10. 9 Revision History
  11. 10Mechanical, Packaging, and Orderable Information

Package Options

Mechanical Data (Package|Pins)
Thermal pad, mechanical data (Package|Pins)
Orderable Information

6.3.2.3 Analog Input Offset Adjust

The input offset voltage for each analog input of the quad channel device can be adjusted through the OFSxy registers, where x represents the ADC core (0, 1, 2, 3, 4 or 5) and y represents the analog input for ADC core 2 (A or B) and core 3 (C or D). The y parameter is omitted for ADC core 0, 1, 4 and 5 since these cores always sample the same analog input. For the dual channel device, x represents the ADC core (0, 1, or 2) and y represents the analog input for ADC core 2 (A or B). The y parameter is omitted for ADC core 0 and 1 since these cores always sample the same analog input. For the single channel device, x represents the ADC core (0 or 2) and the y parameter is omitted for ADC core 0 since this core always samples the same analog input. The adjustment range is approximately 33 mV to –33 mV differential. See the Calibration Modes and Trimming section for more information.