SBASAD1A December 2023 – May 2024 ADC3910D025 , ADC3910D065 , ADC3910D125 , ADC3910S025 , ADC3910S065 , ADC3910S125
PRODUCTION DATA
The digital test pattern is enabled in SPI register DIG_PAT_EN (0x0A6) and configured in SPI registers DIG_PATTERN_MODE_CHx (0x0A1) and DIG_PATTERN_CHx (0x0A2-0x0A5). The test pattern is 16 bits wide. In 10 bit mode the MSB 10 bits are send out.
RAMP Pattern: The step size can be configured as 1 (at 16 bit level) or the value assigned written in DIG_PAT_CHx. To generate a ramp with step size of 1 in 10 bit mode the step size must be programmed to 64 in DIG_PAT_CHx.
Custom Pattern: Configured in the DIG_PAT_CHx register
Toggle Pattern: Either toggle between DIG_PAT_CHx and bitwise inversion of DIG_PAT_CHx or toggle between DIG_PAT_CHx and 0.