SBASAD1A December 2023 – May 2024 ADC3910D025 , ADC3910D065 , ADC3910D125 , ADC3910S025 , ADC3910S065 , ADC3910S125
PRODUCTION DATA
To enable in-circuit testing of the digital interface, the following test patterns are supported and enabled via SPI register writes. There are 2 test pattern generators available in the device. One located in the digital block when using the DDC, statistics engine or comparator functions and a second available in low latency (digital bypassed) mode.