SBAS971C December   2019  – June 2020 AFE7920 , AFE7921 , AFE7988 , AFE7989

PRODUCTION DATA.  

  1. 1Features
  2. 2Applications
  3. 3Description
  4. 4Functional Block Diagram
    1. 4.1 AFE7920/AFE7921 Functional Block Diagram
    2. 4.2 AFE7988/89 Functional Block Diagram
  5. 5Revision History
  6. 6Device and Documentation Support
    1. 6.1 Device Support
      1. 6.1.1 Third-Party Products Disclaimer
    2. 6.2 Related Links
    3. 6.3 Receiving Notification of Documentation Updates
    4. 6.4 Support Resources
    5. 6.5 Trademarks
    6. 6.6 Electrostatic Discharge Caution
    7. 6.7 Glossary
  7. 7Mechanical, Packaging, and Orderable Information

Package Options

Mechanical Data (Package|Pins)
Thermal pad, mechanical data (Package|Pins)
Orderable Information

6.6 Electrostatic Discharge Caution

esds-image

This integrated circuit can be damaged by ESD. Texas Instruments recommends that all integrated circuits be handled with appropriate precautions. Failure to observe proper handling and installation procedures can cause damage.

ESD damage can range from subtle performance degradation to complete device failure. Precision integrated circuits may be more susceptible to damage because very small parametric changes could cause the device not to meet its published specifications.