SLUSD72B November   2017  – April 2020 BQ25970 , BQ25971

PRODUCTION DATA.  

  1. 1Features
  2. 2Applications
  3. 3Description
    1.     Device Images
      1.      Simplified Application
  4. 4Revision History
  5. 5Description (continued)
  6. 6Device and Documentation Support
    1. 6.1 Device Support
      1. 6.1.1 Third-Party Products Disclaimer
      2. 6.1.2 Device Nomenclature
    2. 6.2 Documentation Support
      1. 6.2.1 Related Documentation
    3. 6.3 Related Links
    4. 6.4 Receiving Notification of Documentation Updates
    5. 6.5 Community Resources
    6. 6.6 Trademarks
    7. 6.7 Electrostatic Discharge Caution
    8. 6.8 Glossary
  7. 7Mechanical, Packaging, and Orderable Information

Package Options

Mechanical Data (Package|Pins)
Thermal pad, mechanical data (Package|Pins)
Orderable Information

6.7 Electrostatic Discharge Caution

esds-image

This integrated circuit can be damaged by ESD. Texas Instruments recommends that all integrated circuits be handled with appropriate precautions. Failure to observe proper handling and installation procedures can cause damage.

ESD damage can range from subtle performance degradation to complete device failure. Precision integrated circuits may be more susceptible to damage because very small parametric changes could cause the device not to meet its published specifications.