SLASF63 june   2023 DAC539E4W

PRODUCTION DATA  

  1.   1
  2. 1 Features
  3. 2 Applications
  4. 3 Description
  5. 4 Revision History
  6. 5 Pin Configuration and Functions
  7. 6 Specifications
    1. 6.1  Absolute Maximum Ratings
    2. 6.2  ESD Ratings
    3. 6.3  Recommended Operating Conditions
    4. 6.4  Thermal Information
    5. 6.5  Electrical Characteristics: Threshold DAC
    6. 6.6  Electrical Characteristics: Comparator
    7. 6.7  Electrical Characteristics: General
    8. 6.8  Timing Requirements: I2C Standard Mode
    9. 6.9  Timing Requirements: I2C Fast Mode
    10. 6.10 Timing Requirements: I2C Fast Mode Plus
    11. 6.11 Timing Requirements: SPI Write Operation
    12. 6.12 Timing Requirements: SPI Read and Daisy Chain Operation (FSDO = 0)
    13. 6.13 Timing Requirements: SPI Read and Daisy Chain Operation (FSDO = 1)
    14. 6.14 Timing Diagrams
    15. 6.15 Typical Characteristics
  8. 7 Detailed Description
    1. 7.1 Overview
    2. 7.2 Functional Block Diagram
    3. 7.3 Feature Description
      1. 7.3.1 Smart Digital-to-Analog Converter (DAC) Architecture
      2. 7.3.2 Threshold DAC
        1. 7.3.2.1 Voltage Reference and DAC Transfer Function
          1. 7.3.2.1.1 Power-Supply as Reference
          2. 7.3.2.1.2 Internal Reference
          3. 7.3.2.1.3 External Reference
      3. 7.3.3 Look-Up Table (LUT)
      4. 7.3.4 Programming Interface
      5. 7.3.5 Nonvolatile Memory (NVM)
        1. 7.3.5.1 NVM Cyclic Redundancy Check (CRC)
          1. 7.3.5.1.1 NVM-CRC-FAIL-USER Bit
          2. 7.3.5.1.2 NVM-CRC-FAIL-INT Bit
      6. 7.3.6 Power-On Reset (POR)
      7. 7.3.7 External Reset
      8. 7.3.8 Register-Map Lock
    4. 7.4 Device Functional Modes
      1. 7.4.1 Comparator Mode
        1. 7.4.1.1 Programmable Hysteresis Comparator
      2. 7.4.2 Power-Down Mode
    5. 7.5 Programming
      1. 7.5.1 SPI Programming Mode
      2. 7.5.2 I2C Programming Mode
        1. 7.5.2.1 F/S Mode Protocol
        2. 7.5.2.2 I2C Update Sequence
          1. 7.5.2.2.1 Address Byte
          2. 7.5.2.2.2 Command Byte
        3. 7.5.2.3 I2C Read Sequence
    6. 7.6 Register Maps
      1. 7.6.1  NOP Register (address = 00h) [reset = 0000h]
      2. 7.6.2  DAC-x-MARGIN-HIGH Register (address = 01h, 07h, 0Dh, 13h) [reset = 0000h]
      3. 7.6.3  DAC-x-MARGIN-LOW Register (address = 02h, 08h, 0Eh, 14h) [reset = 0000h]
      4. 7.6.4  DAC-x-VOUT-CMP-CONFIG Register (address = 03h, 09h, 0Fh, 15h) [reset = 0401h]
      5. 7.6.5  DAC-x-CMP-MODE-CONFIG Register (address = 05h, 0Bh, 11h, 17h) [reset = 0000h]
      6. 7.6.6  COMMON-CONFIG Register (address = 1Fh) [reset = 1249h]
      7. 7.6.7  COMMON-TRIGGER Register (address = 20h) [reset = 0000h]
      8. 7.6.8  COMMON-DAC-TRIG Register (address = 21h) [reset = 0000h]
      9. 7.6.9  GENERAL-STATUS Register (address = 22h) [reset = 00h, DEVICE-ID, VERSION-ID]
      10. 7.6.10 CMP-STATUS Register (address = 23h) [reset = 0000h]
      11. 7.6.11 DEVICE-MODE-CONFIG Register (address = 25h) [reset = 8040h]
      12. 7.6.12 INTERFACE-CONFIG Register (address = 26h) [reset = 0000h]
      13. 7.6.13 STATE-MACHINE-CONFIG0 Register (address = 27h) [reset = 0003h]
      14. 7.6.14 SRAM-CONFIG Register (address = 2Bh) [reset = 0000h]
      15. 7.6.15 SRAM-DATA Register (address = 2Ch) [reset = 0000h]
      16. 7.6.16 DAC-x-DATA Register (SRAM address = 21h, 22h, 23h, 24h) [reset = 8000h]
      17. 7.6.17 LUT-x-DATA Register (SRAM address = 25h through 34h) [reset = (see register description)]
      18. 7.6.18 LOOP-WAIT Register (SRAM address = 35h) [reset = 0000h]
  9. 8 Application and Implementation
    1. 8.1 Application Information
    2. 8.2 Typical Application
      1. 8.2.1 Design Requirements
      2. 8.2.2 Detailed Design Procedure
      3. 8.2.3 Application Curve
    3. 8.3 Power Supply Recommendations
    4. 8.4 Layout
      1. 8.4.1 Layout Guidelines
      2. 8.4.2 Layout Example
  10. 9 Device and Documentation Support
    1. 9.1 Receiving Notification of Documentation Updates
    2. 9.2 Support Resources
    3. 9.3 Trademarks
    4. 9.4 Electrostatic Discharge Caution
    5. 9.5 Glossary
  11. 10Mechanical, Packaging, and Orderable Information

Package Options

Refer to the PDF data sheet for device specific package drawings

Mechanical Data (Package|Pins)
  • YBH|16
Thermal pad, mechanical data (Package|Pins)
Orderable Information

7.3.6 Power-On Reset (POR)

The DAC539E4W includes a power-on reset (POR) function that controls the output voltage at power up. After the VDD supply has been established, a POR event is issued. The POR causes all registers to initialize to default values, and communication with the device is valid only after a POR (boot-up) delay. The default value for all the registers in the DAC539E4W is loaded from NVM as soon as the POR event is issued.

When the device powers up, a POR circuit sets the device to the default mode. The POR circuit requires specific VDD levels, as indicated in Figure 7-3, to make sure that the internal capacitors discharge and reset the device at power up. To make sure that a POR occurs, VDD must be less than 0.7 V for at least 1 ms. When VDD drops to less than 1.65 V, but remains greater than 0.7 V (shown as the undefined region), the device reset is not deterministic under all specified temperature and power-supply conditions. In this case, initiate a POR. When VDD remains greater than 1.65 V, a POR does not occur.

GUID-E66C039C-52AD-4384-AB17-F22D4CA367DB-low.gif Figure 7-3 Threshold Levels for VDD POR Circuit