6.1 Absolute Maximum Ratings
over operating free-air temperature (unless otherwise noted) (1)(2)(3)
|
MIN |
MAX |
UNIT |
Power supply voltage (VM) |
–0.3 |
42 |
V |
Charge pump and high-side gate drivers (VCP, UHSG, VHSG, WHSG) |
–0.3 |
50 |
V |
Output terminal, low side gate drivers, charge pump flying cap and switched VM power supply voltage (U, V, W, ULSG, VLSG, WLSG, CP1, CP2 VSW) |
–0.6 |
40 |
V |
Internal core voltage regulator (VINT) |
–0.3 |
2.0 |
V |
Linear voltage regulator output (VREG) |
–0.3 |
5.5 |
V |
Sense current terminal (ISEN) |
–0.3 |
2.0 |
V |
Digital terminal voltage (FAULTn, LOCKn, PWM, BRAKE, DIR, ENABLEn, HALLOUT) |
–0.5 |
5.75 |
V |
Hall sensor input terminal voltage (HU+, HU–, HV+, HV–, HW+, HW–) |
0 |
VREG |
V |
Continuous total power dissipation |
See Thermal Information |
|
Operating junction temperature range, TJ |
–40 |
150 |
°C |
Storage temperature range, Tstg |
–60 |
150 |
°C |
(1) Stresses beyond those listed under “absolute maximum ratings” may cause permanent damage to the device. These are stress ratings only, and functional operation of the device at these or any other conditions beyond those indicated under “recommended operating conditions” is not implied. Exposure to absolute–maximum–rated conditions for extended periods may affect device reliability.
(2) All voltage values are with respect to network ground terminal.
(3) Power dissipation and thermal limits must be observed
6.2 ESD Ratings
|
VALUE |
UNIT |
V(ESD) |
Electrostatic discharge |
Human-body model (HBM), per ANSI/ESDA/JEDEC JS-001(1) |
±4000 |
V |
Charged-device model (CDM), per JEDEC specification JESD22-C101(2) |
±1500 |
(1) JEDEC document JEP155 states that 500-V HBM allows safe manufacturing with a standard ESD control process.
(2) JEDEC document JEP157 states that 250-V CDM allows safe manufacturing with a standard ESD control process.
6.3 Recommended Operating Conditions
over operating free-air temperature range (unless otherwise noted)
|
MIN |
NOM |
MAX |
UNIT |
VM |
Motor power supply voltage range, ENABLEn = 0, motor operating (3) |
8.5 |
|
32 |
V |
VMDIS |
Motor power supply voltage range, ENABLEn = 1, motor not operating |
4.5 |
|
35 |
IVREG |
VREG output current(1) |
0 |
|
30 |
mA |
IVSW |
VSW output current(1) |
0 |
|
30 |
fHALL |
Hall sensor input frequency(4) |
0 |
|
30 |
kHz |
fPWM |
Frequency on PWM |
16 |
|
50 (2) |
kHz |
(1) Power dissipation and thermal limits must be observed
(2) Operational with frequencies above 50 kHz, but resolution is degraded
(3) Note that at VM < 12 V, gate drive output voltage tracks VM voltage
(4) fHALL of 50 Hz to 6.7 kHz is best
6.4 Thermal Information
THERMAL METRIC(1) |
DRV8307 |
UNIT |
RHA (40 PINS) |
RθJA |
Junction-to-ambient thermal resistance(2) |
33.2 |
°C/W |
RθJC(top) |
Junction-to-case (top) thermal resistance(3) |
23.0 |
°C/W |
RθJB |
Junction-to-board thermal resistance(4) |
8.8 |
°C/W |
ψJT |
Junction-to-top characterization parameter(5) |
0.3 |
°C/W |
ψJB |
Junction-to-board characterization parameter(6) |
8.8 |
°C/W |
RθJC(bot) |
Junction-to-case (bottom) thermal resistance(7) |
2.3 |
°C/W |
(1) For more information about traditional and new thermal metrics, see the IC Package Thermal Metrics application report,
SPRA953.
(2) The junction-to-ambient thermal resistance under natural convection is obtained in a simulation on a JEDEC-standard, high-K board, as specified in JESD51-7, in an environment described in JESD51-2a.
(3) The junction-to-case (top) thermal resistance is obtained by simulating a cold plate test on the package top. No specific JEDEC standard test exists, but a close description can be found in the ANSI SEMI standard G30-88.
(4) The junction-to-board thermal resistance is obtained by simulating in an environment with a ring cold plate fixture to control the PCB temperature, as described in JESD51-8.
(5) The junction-to-top characterization parameter, ψJT, estimates the junction temperature of a device in a real system and is extracted from the simulation data for obtaining θJA, using a procedure described in JESD51-2a (sections 6 and 7).
(6) The junction-to-board characterization parameter, ψJB, estimates the junction temperature of a device in a real system and is extracted from the simulation data for obtaining θJA , using a procedure described in JESD51-2a (sections 6 and 7).
(7) The junction-to-case (bottom) thermal resistance is obtained by simulating a cold plate test on the exposed (power) pad. No specific JEDEC standard test exists, but a close description can be found in the ANSI SEMI standard G30-88.