SLVSH16A February   2024  – March 2024 ESD2CAN36-Q1 , ESD2CANFD36-Q1

PRODUCTION DATA  

  1.   1
  2. 1Features
  3. 2Applications
  4. 3Description
  5. 4Pin Configuration and Functions
  6. 5Specifications
    1. 5.1 Absolute Maximum Ratings
    2. 5.2 ESD Ratings—AEC Specification
    3. 5.3 ESD Ratings—IEC Specification
    4. 5.4 ESD Ratings - ISO Specification
    5. 5.5 Recommended Operating Conditions
    6. 5.6 Thermal Information
    7. 5.7 Electrical Characteristics
    8. 5.8 Typical Characteristics – ESD2CAN36-Q1
    9. 5.9 Typical Characteristics- ESD2CANFD36-Q1
  7. 6Application and Implementation
    1. 6.1 Application Information
  8. 7Device and Documentation Support
    1. 7.1 Documentation Support
      1. 7.1.1 Related Documentation
    2. 7.2 Receiving Notification of Documentation Updates
    3. 7.3 Support Resources
    4. 7.4 Trademarks
    5. 7.5 Electrostatic Discharge Caution
    6. 7.6 Glossary
  9. 8Revision History
  10. 9Mechanical, Packaging, and Orderable Information

Package Options

Refer to the PDF data sheet for device specific package drawings

Mechanical Data (Package|Pins)
  • DBZ|3
Thermal pad, mechanical data (Package|Pins)
Orderable Information

5.1 Absolute Maximum Ratings

over operating free-air temperature range (unless otherwise noted)(1)
PARAMETER DEVICE MIN MAX UNIT
PPP IEC 61000-4-5 Power (tp – 8/20 µs) at 25°C ESD2CAN36-Q1 233 W
ESD2CANFD36-Q1 175
IPP IEC 61000-4-5 current (tp – 8/20 µs) at 25°C ESD2CAN36-Q1 4.3 A
ESD2CANFD36-Q1 3.1
TA  Operating free-air temperature -55 150 °C
TJ Junction temperature -55 150
Tstg Storage temperature -65 155
(1) Operation outside the Absolute Maximum Rating may cause permanent device damage. Absolute Maximum Rating do not imply functional operation of the device at these or any other conditions beyond those listed under Recommended Operating Condition. If used outside the Recommended Operating Condition but within the Absolute Maximum Rating, the device may not be fully functional, and this may affect device reliability, functionality, performance, and shorten the device lifetime.